Adaptive program verify scheme for performance improvement
A data storage device includes a controller coupled to one or more memory devices. The controller is configured to determine one or more first wordlines within the memory device that needs more than one pulse for programming and one or more second wordlines within the memory device that needs one pulse and no program verify. The locations of the one or more first wordlines and the one or more second wordlines are stored in a data structure of the memory device. During program operations, the controller utilizes the data structure to determine whether the one or more wordlines being programmed requires only one pulse and no program verify or a multi-loop program. The data structure is updated after an EPWR and/or XOR parity operation.
1. A data storage device, comprising:
a memory device; and
a controller coupled to the memory device, wherein the controller is configured to:
determine one or more first wordlines within the memory device that need more than one pulse for programming and one or more second wordlines within the memory device that need one pulse with zero verifications for programming;
generate a map of the one or more first wordlines;
store the map in a data structure of the memory device; and
program the memory device, wherein the programming comprises:
programming the one or more second wordlines with one pulse and zero verifications; and
programming the one or more first wordlines with more than one pulse.
2. The data storage device of claim 1 , wherein the generating occurs during memory testing.
3. The data storage device of claim 1 , wherein the controller is configured to place the map in a dedicated block of the memory device.
4. The data storage device of claim 1 , wherein the controller is configured to read the map during downloading and execution of firmware.
5. The data storage device of claim 1 , wherein the programming the one or more second wordlines with one pulse and zero verifications comprises programming a wordline with one voltage pulse and not verifying whether the pulse successfully programed the wordline.
6. The data storage device of claim 1 , wherein the programming the one or more first wordlines with more than one pulse programming comprises:
delivering a first voltage pulse to a wordline;
determining that the first voltage pulse did not program the wordline; and
delivering a second voltage pulse greater than the first voltage pulse to the wordline.
7. The data storage device of claim 1 , wherein the one or more first wordlines are in SLC memory.
8. The data storage device of claim 7 , wherein the one or more second wordlines are in SLC memory.
9. The data storage device of claim 1 , wherein the controller is further configured to determine read failures of the one or more second wordlines.
10. The data storage device of claim 9 , wherein the controller is further configured to append to the map an indication of any wordline of the one or more second wordlines that has read failures.
11. The data storage device of claim 10 , wherein the controller is further configured to program any wordline of the one or more second wordlines that has a read failure with more than one pulse after determining the read failure.
12. A data storage device, comprising:
a memory device; and
a controller coupled to the memory device, wherein the controller is configured to:
read a data structure within the memory device that indicates one or more first wordlines within the memory device needs more than one pulse for programming and one or more second wordlines within the memory device needs one pulse with zero verifications for programming;
determine a read failure on at least one wordline of the one or more second wordlines; and
append, to the data structure, a notation of the read failure of the at least one wordline of the one or more second wordlines.
13. The data storage device of claim 12 , wherein the data structure comprises a bit map.
14. The data storage device of claim 12 , wherein the read failure is determined by an XOR parity check.
15. The data storage device of claim 12 , wherein the appending occurs each time a read failure is determined.
16. The data storage device of claim 12 , wherein any wordlines with a read failure are notated as wordlines that need more than one pulse for programming.
17. The data storage device of claim 12 , wherein the data structure is generated during memory testing and wherein the determining and appending occurs during data storage device runtime operation.
18. A data storage device, comprising:
means for storing data; and
a controller coupled to the means for storing data, wherein the controller is configured to:
generate a data structure for one or more first wordlines within the means for storing data that need more than one pulse for programming and for one or more second wordlines within the means for storing data that need one pulse with zero verifications for programming; and
append to the data structure an indication of which wordlines have read failures.
19. The data storage device of claim 18 , wherein the controller is further configured to append to the data structure each time a read failure is identified.
20. The data storage device of claim 18 , wherein the controller is further configured to program to the means for storing data based upon the data structure and appendages to the data structure.