Granted Patent B2

US 11,283,394 · App. 17/179,105 · Granted Mar 22, 2022

Inventors: Richard Perkins (San Jose, CA); Alex Sharenko (Berkeley, CA); Thierry Nguyen (San Francisco, CA); Gabriela Bunea (San Jose, CA); Anna Wojtowicz (San Francisco, CA)

Assignee: GAF ENERGY LLC

H02S20/25B32B3/266B32B7/12B32B17/10E04D1/28E04D1/30H01L31/048B32B2419/06B32B2457/12E04D2001/308

Abstract

Claims (41)

1. A system, comprising:

at least one solar module installed on a roof deck, wherein each of the at least one solar module includes:

a superstrate layer having an upper surface and a lower surface opposite the upper surface,

wherein the superstrate layer comprises a polymeric material,

wherein the polymeric material comprises ethylene tetrafluoroethylene (“ETFE”), polyethylene terephthalate (“PET”), or combinations thereof;

an encapsulant having an upper layer and a lower layer opposite the upper layer, wherein the upper layer is juxtaposed with the lower surface of the superstrate layer, wherein the upper layer includes a lower surface; and

a photovoltaic layer intermediate the upper layer and the lower layer of the encapsulant, wherein the photovoltaic layer includes an upper surface,

wherein the upper surface of the superstrate layer of a first one of the at least one solar module includes a first indentation pattern

wherein the polymeric material of the superstrate layer includes the first indentation pattern,

wherein the first indentation pattern includes a non-uniform mesh of indentations indented into the upper surface of the superstrate layer and a plurality of openings defined by the mesh of indentations,

wherein a majority of the plurality of openings have a circle shape,

wherein a majority of the plurality of openings have a surface area of 1 square millimeter to 20 square millimeters,

wherein a depth of a measured one of the indentations of the first indentation pattern is measured from (a) the upper surface of the superstrate layer to (b) a point in the measured one of the indentations of the first indentation pattern that is closest to the lower surface of the superstrate layer, and is measured in a direction perpendicular to the upper surface of the superstrate layer,

wherein a majority of the indentations of the first indentation pattern have a depth of 0.12 millimeter to 1.2 millimeter,

wherein a thickness of the upper layer of the encapsulant at the measured one of the indentations of the first indentation pattern is measured from (a) the upper surface of the photovoltaic layer to (b) a point in the lower surface of the upper layer of the encapsulant at the measured one of the indentations of the first indentation pattern that is closest to the upper surface of the photovoltaic layer, and is measured in a direction perpendicular to the upper surface of the photovoltaic layer,

wherein the thickness of the upper layer of the encapsulant is at least 100 microns, and

wherein a transmission loss of power of light transmitted through the superstrate layer having the first indentation pattern is less than 2 percent as a compared to light transmitted through a comparison superstrate that is identical to the superstrate layer but lacks the first indentation pattern.

2. The system of claim 1 , further comprising a substrate layer juxtaposed with the lower layer of the encapsulant.

3. The system of claim 1 , wherein the system comprises at least the first one of the at least one solar module and a second one of the at least one solar module,

wherein the second one of the at least one solar module is disposed adjacent tothe first one of the at least one solar module,

wherein the upper surface of the superstrate layer of the second one of the at leastone solar module includes a second indentation pattern, and

wherein the second indentation pattern is different from the first indentation pattern.

4. The system of claim 1 , wherein a majority of the indentationsof the first indentation pattern have the depth of 0.5 millimeter to 0.75 millimeter.

5. The system of claim 1 , wherein a minimum thickness of the upper encapsulant layer is 100 microns to 450 microns.

6. The system of claim 1 , wherein the photovoltaic layer includes a plurality of photovoltaic elements and an encapsulant region located between a first one of the plurality of photovoltaic elements and a second one of the plurality of photovoltaic elements that is adjacent to the first one of the plurality of photovoltaic elements, and wherein the encapsulant region is filled with an encapsulant material of the encapsulant.

7. A system, comprising:

at least one solar module installed on a roof deck, wherein each of the at least one solar module includes:

a superstrate layer having an upper surface and a lower surface opposite the upper surface,

wherein the superstrate layer comprises a polymeric material,

wherein the polymeric material comprises ethylene tetrafluoroethylene (“ETFE”), polyethylene terephthalate (“PET”), or combinations thereof;

an encapsulant having an upper layer and a lower layer opposite the upper layer, wherein the upper layer is juxtaposed with the lower surface of the superstrate layer, wherein the upper layer includes a lower surface; and

a photovoltaic layer intermediate the upper layer and the lower layer of the encapsulant, wherein the photovoltaic layer includes an upper surface,

wherein the upper surface of the superstrate layer of a first one of the at least one solar module includes a first indentation pattern,

wherein the polymeric material of the superstrate layer includes the first indentation pattern,

wherein the first indentation pattern includes a mesh of indentations indented into the upper surface of the superstrate layer and a plurality of openings defined by the mesh of indentations,

wherein a majority of the plurality of openings have a surface area of 1 square millimeter to 20 square millimeters,

wherein a depth of a measured one of the indentations of the first indentation pattern is measured from (a) the upper surface of the superstrate layer to (b) a point in the measured one of the indentations of the first indentation pattern that is closest to the lower surface of the superstrate layer, and is measured in a direction perpendicular to the upper surface of the superstrate layer,

wherein a majority of the indentations of the first indentation pattern have a depth of 0.12 millimeter to 1.2 millimeter,

wherein a thickness of the upper layer of the encapsulant at the measured one of the indentations of the first indentation pattern is measured from (a) the upper surface of the photovoltaic layer to (b) a point in the lower surface of the upper layer of the encapsulant at the measured one of the indentations of the first indentation pattern that is closest to the upper surface of the photovoltaic layer, and is measured in a direction perpendicular to the upper surface of the photovoltaic layer,

wherein the thickness of the upper layer of the encapsulant is at least 100 microns, and

wherein a transmission loss of power of light transmitted through the superstrate layer having the first indentation pattern is less than 2 percent as a compared to light transmitted through a comparison superstrate that is identical to the superstrate layer but lacks the first indentation pattern.

Assignments (2)

Continuity (2)

Cited By (37)

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