QLC data programming
A data storage device includes one or more memory devices that each includes one or more superblocks and a controller coupled to the one or more memory devices. Each superblock includes a plurality of wordlines. The controller is configured to write data to a first wordline of the plurality of wordlines, write data to a second wordline of the plurality of wordlines, perform a read verify operation on the first wordline, and perform a read verify operation on the second wordline. At least one of the first wordline and the second wordline does not include an XOR parity element and one or more wordlines of the plurality of wordlines includes the XOR parity element.
1. A data storage device, comprising:
one or more memory devices comprising one or more superblocks, wherein each superblock of the one or more superblocks comprises a plurality of wordlines; and
a controller coupled to the one or more memory devices, wherein the controller is configured to:
write data to a first wordline of the plurality of wordlines;
write data to a second wordline of the plurality of wordlines;
perform a read verify operation on the first wordline; and
perform a read verify operation on the second wordline, wherein at least one of the first wordline and the second wordline does not include an XOR parity element, and wherein one or more wordlines of the plurality of wordlines includes the XOR parity element.
2. The data storage device of claim 1 , wherein each wordline of the plurality of wordlines comprises a plurality of strings.
3. The data storage device of claim 2 , wherein at least one string of the plurality of strings of the one or more wordlines of the plurality of wordlines that includes the XOR parity element does not include exclusive or (XOR) data.
4. A data storage device, comprising:
one or more memory devices comprising one or more superblocks, wherein each superblock of the one or more superblocks comprises a plurality of wordlines of claim 1 , and wherein at least one of the one or more memory devices is a multi-level cell (MLC) memory and another one of the one or more memory devices is a single-level cell (SLC) memory, and wherein the data is first written to the SLC memory and the data is second written to the MLC memory; and
a controller coupled to the one or more memory devices, wherein the controller is configured to:
write data to a first wordline of the plurality of wordlines;
write data to a second wordline of the plurality of wordlines;
perform a read verify operation on the first wordline; and
perform a read verify operation on the second wordline, wherein at least one of the first wordline and the second wordline does not include an XOR parity element.
5. The data storage device of claim 4 , wherein the one or more memory devices comprises a plurality of dies, and wherein each of the plurality of dies comprises a first plane and a second plane.
6. The data storage device of claim 5 , wherein at least one plane of the first plane and the second plane includes exclusive or (XOR) data.
7. The data storage device of claim 4 , wherein up to about two wordlines of the SLC memory comprises data written to the MLC memory.
8. A data storage device, comprising:
one or more memory devices comprising one or more superblocks, wherein each superblock of the one or more superblocks comprises a plurality of wordlines; and
a controller coupled to the one or more memory devices, wherein the controller is configured to:
write data to a first wordline of the plurality of wordlines;
write data to a second wordline of the plurality of wordlines;
perform a read verify operation on the first wordline; and
perform a read verify operation on the second wordline, wherein at least one of the first wordline and the second wordline does not include an XOR parity element, and wherein the read verify operation is enhanced post write read (EPWR).
9. A data storage device, comprising:
one or more memory devices comprising one or more superblocks, wherein each superblock of the one or more superblocks comprises a plurality of erase blocks, and wherein each erase block of the plurality of erase blocks comprises a plurality of wordlines; and
a controller coupled to the one or more memory devices, wherein the controller is configured to:
write data to the plurality of wordlines of a first erase block of the plurality of erase blocks of at least one memory device of the one or more memory devices, wherein less than all of the plurality of wordlines includes an XOR element; and
perform a read verify operation to less than all of the plurality of wordlines of the first erase block after the first entire erase block has been programmed.
10. The data storage device of claim 9 , wherein at least one of the one or more memory devices is a multi-level cell (MLC) memory and another one of the one or more memory devices is a single-level cell (SLC) memory, and wherein the data written to the SLC memory is released after a successful read verify operation is performed to the entire erase block of the MLC memory.
11. The data storage device of claim 10 , wherein the data written to the SLC memory is re-written to a second erase block of the MLC memory when the read verify operation is unsuccessful.
12. The data storage device of claim 10 , wherein the one or more memory devices comprises one or more dies, each comprising a first plane and a second plane, wherein each plane comprises one or more erase blocks.
13. The data storage device of claim 12 , wherein the controller is further configured to:
perform a read verify operation to at least one of all of the plurality of wordlines and all of the plurality of erase blocks, wherein the read verify operation is enhanced post write read, and wherein performing a read verify operation comprises:
checking at least one of each wordline of the plurality of wordlines and each erase block of the plurality of erase blocks for program failures.
14. The data storage device of claim 9 , wherein the XOR element is at least one of a full die redundancy, a full plane redundancy, and an erase block redundancy.
15. A data storage device, comprising:
a first memory device having a first XOR storage capacity for a first XOR element, wherein the first XOR storage capacity relative to data stored in the first memory device is a first ratio;
a second memory device having a second XOR storage capacity for a second XOR element, wherein the second XOR storage capacity relative to data stored in the second memory device is a second ratio, and wherein the second ratio is different from the first ratio;
a volatile memory; and
a controller means coupled to the first memory device and the second memory device.
16. The data storage device of claim 15 , wherein the volatile memory is random access memory (RAM), wherein the first memory device is a single-level cell (SLC) memory and the second memory device is a multi-level cell (MLC) memory, and wherein the first memory device and the second memory device each comprises:
a plurality of dies comprising a first plane and a second plane, wherein the first plane and the second plane each comprises a plurality of erase blocks; and
a plurality of superblocks comprising a plurality of wordlines, wherein each wordline of the plurality of wordlines comprises a plurality of strings.
17. The data storage device of claim 16 , wherein the controller means comprises:
means to perform a read verify operation to detect program failures, wherein the read verify operation is an enhanced post write read;
means to hold a data source in at least one of the first memory device and the volatile memory; and
means to generate a first XOR element and a second XOR element, wherein the second XOR element is different from the first XOR element.
18. The data storage device of claim 17 , wherein the means to perform a read verify operation comprises either checking each wordline of the plurality of wordlines for program failures, each erase block of the plurality of erase blocks for program failures, or both each wordline of the plurality of wordlines and each erase block of the plurality of erase blocks for program failures.
19. The data storage device of claim 18 , wherein the data source comprises:
up to two wordlines, when checking each wordline of the plurality of wordlines for program failures, of data written to the second memory device; and
an erase block, when checking either each erase block of the plurality of erase blocks for program failures or both each wordline of the plurality of wordlines and each erase block of the plurality of erase blocks for program failures, of data written to the second memory device.
20. The data storage device of claim 15 , wherein the second ratio is substantially smaller than the first ratio.
21. The data storage device of claim 15 , wherein the controller means is configured to perform an enhanced post write read (EPWR) for each wordline of the first memory device and the second memory device.
22. The data storage device of claim 15 , wherein the controller means is configured to perform an enhanced post write read (EPWR) for less than all wordlines of the first memory device.
23. The data storage device of claim 15 , wherein at least one of the first memory device and the second memory device comprises a first wordline and a second wordline adjacent the first wordline, wherein the controller means is configured to perform an enhanced post write read (EPWR) for the second wordline and not perform an EPWR to the first wordline.
24. The data storage device of claim 15 , wherein the first memory device has a different XOR scheme as compared to the second memory device.