Shared bit lines for memory cells

1. A circuit comprising:

a plurality of memory cells;

a first bit line connected to a first column of memory cells of the plurality of memory cells, wherein the first bit line is shared with a second column of memory cells adjacent to the first column of memory cells;

a second bit line connected to the first column of memory cells, wherein the second bit line is shared with a third column of memory cells adjacent to the first column of memory cells opposite the second column of memory cells;

at least one power line, wherein the at least one power line passes through the first column of memory cells and is shared with memory cells in the second column of memory cells; and

wherein at least one of the first bit line, the second bit line, or the at least one power line is disposed on a backside of a substrate.

2. The circuit of claim 1 , further comprising two word lines passing through each row of cells.

3. The circuit of claim 2 , wherein each of the two word lines connects to alternating cells within each row in a staggered manner.

4. The circuit of claim 2 , wherein a width of the first bit line and the second bit line is greater than a width of one of the word lines.

5. The circuit of claim 4 , wherein the width of the first bit line and the second bit line is approximately 50% greater than the width of one of the word lines.

6. The circuit of claim 1 , wherein the first bit line and the second bit line are formed on a frontside of the substrate, the frontside opposite the backside.

7. The circuit of claim 6 , wherein the at least one power line is a first Vss line extending along the backside of the substrate from the first column to the second column of memory cells.

8. The circuit of claim 7 , further comprising a second Vss line passing through the first column of memory cells and is shared with memory cells in the third column of memory cells.

9. The circuit of claim 1 , wherein the at least one power line includes a Vss line and a Vdd line, and each is formed on the backside of the substrate.

10. The circuit of claim 1 , wherein the first bit line, the second bit line, and the at least one power line of a Vdd line are each formed on the backside of the substrate.

11. The circuit of claim 10 , further comprising Vss lines formed on a frontside of the substrate opposite the backside.

12. A memory cell comprising:

a first pass gate transistor connected to a first bit line, the first bit line being shared with a first adjacent memory cell in a same row as the memory cell;

a second pass gate transistor connected to a second bit line, the second bit line being shared with a second adjacent memory cell in the same row as the memory cell, and on an opposite side from the first adjacent memory cell;

a first word line extending through the memory cell and connecting to the first pass gate transistor and the second pass gate transistor; and

a second word line extending through the memory cell and connecting to the first adjacent memory cell and the second adjacent memory cell, and wherein the first bit line is wider than one of the first word line or the second word line.

13. The memory cell of claim 12 , wherein for each memory cell within a row of memory cells, only one of the first word line or the second word line is connected to that cell.

14. The memory cell of claim 12 , wherein the first bit line, the second bit line, and a Vdd line are formed on a backside of a substrate and a Vss line is formed on a frontside of the substrate.

15. The memory cell of claim 12 , wherein the first bit line and the second bit line are formed on a frontside of a substrate and a Vss line and a Vdd line are formed on a backside of the substrate.

16. The memory cell of claim 12 , wherein the first bit line is wider than each of the first word line and the second word line.

17. The memory cell of claim 16 , wherein the second bit line is at least 50% wider than the first word line.

18. A method comprising:

applying a first signal to a first bit line associated with a first column of memory cells in an array of memory cells, wherein the first bit line is shared by a second column of memory cells in the array of memory cells, the second column being adjacent to the first column;

applying a second signal to a second bit line associated with the first column of memory cells, wherein the second bit line is shared with a third column of memory cells within the array of memory cells, the third column being adjacent to the first column opposite the second column; and

applying a third signal to one of two word lines passing through a row of memory cells within the array of memory cells, thereby selecting a first memory cell at an intersection of the row of memory cells and the first column of memory cells, and wherein the first bit line and the second bit line are on an opposite side of a wafer from a power line connected to the first column of memory cells.

19. The method of claim 18 , further comprising, selecting a second memory cell in the row of memory cells by applying a fourth signal to the other of the two word lines, the second memory cell being adjacent the first memory cell.

20. The method of claim 18 , wherein the power line connected to the first column of memory cells is also connected to the second column of memory cells, the power line extending along the opposite side of the wafer from a connection with the first column to a connection with the second column.