SEMICONDUCTOR DEVICE PACKAGES INCLUDING MULTIPLE LEAD FRAMES AND RELATED METHODS
Semiconductor device packages may include a semiconductor die including a first major surface affixed and electrically connected to a first lead frame. A second lead frame may be affixed and electrically connected to a second major surface located on a side of the semiconductor die opposite the first major surface. A molding material may encapsulate the semiconductor die and at least portions of the first lead frame and the second lead frame.
1 . A semiconductor device package, comprising:
a semiconductor die comprising a first major surface affixed and electrically connected to a first lead frame;
a second lead frame affixed and electrically connected to a second major surface of the semiconductor die, the second major surface located on a side of the semiconductor die opposite the first major surface; and
a molding material encapsulating the semiconductor die and at least portions of the first lead frame and the second lead frame.
2 . The semiconductor device package of claim 1 , wherein the first lead frame is electrically connected to the second lead frame.
3 . The semiconductor device package of claim 2 , further comprising a solder material extending between the first lead frame and the second lead frame thereby electrically connecting the first lead frame to the second lead frame.
4 . The semiconductor device package of claim 2 , further comprising at least one discrete mass of electrically conductive material or at least one passive electronic device forming at least a portion of an electrical connection between the first lead frame and the second lead frame thereby electrically connecting the first lead frame to the second lead frame.
5 . The semiconductor device package of claim 1 , wherein the first major surface is electrically connected to the first lead frame by a flip-chip connection.
6 . The semiconductor device package of claim 1 , wherein the second major surface is electrically connected to the second lead frame by a back-side metallization process or a surface mount.
7 . The semiconductor device package of claim 1 , wherein each of the first lead frame and the second lead frame is at least substantially planar.
8 . The semiconductor device package of claim 1 , wherein each of the first lead frame and the second lead frame is configured as a frame for a quad-flat no-leads package.
9 . The semiconductor device package of claim 1 , wherein portions of the first lead frame are exposed through the molding material for electrically connecting to higher level packaging.
10 . The semiconductor device package of claim 1 , wherein portions of the second lead frame are exposed through the molding material for electrically connecting to higher level packaging or to a heat management structure.
11 . The semiconductor device package of claim 1 , wherein the second lead frame is encapsulated within the molding material.
12 . A semiconductor device package, comprising:
a first semiconductor die comprising a first major surface affixed and electrically connected to a first lead frame;
a second semiconductor die comprising a second major surface affixed and electrically connected to a second lead frame, the second semiconductor die comprising a third major surface affixed to a fourth major surface of the first semiconductor die, such that the first lead frame is located on a side of the first semiconductor die distal the second semiconductor die and the second lead frame is located on a side of the second semiconductor die distal the first semiconductor die; and
a molding material encapsulating the first semiconductor die, the second semiconductor die, and at least portions of the first lead frame and the second lead frame.
13 . The semiconductor device package of claim 12 , wherein each of the first lead frame and the second lead frame is configured as a frame for a quad-flat no-leads package.
14 . The semiconductor device package of claim 12 , further comprising at least one bridging element electrically connecting the first lead frame to the second lead frame.
15 . A method of concurrently making semiconductor device packages, comprising:
affixing a first major surface of each of a plurality of semiconductor dice, and electrically connecting each semiconductor die, to respective first die-attach locations of a first lead frame;
affixing a second major surface of each semiconductor die, and electrically connecting each semiconductor die, to respective second die-attach locations of a second lead frame, the second lead frame located on a side of each semiconductor die opposite the first lead frame; and
encapsulating the semiconductor dice and at least portions of the first lead frame and the second lead frame in a molding material.
16 . The method of claim 15 , further comprising singulating individual semiconductor device packages from one another.
17 . The method of claim 15 , further comprising temporarily supporting the second lead frame or the first lead frame on a tape before encapsulating.
18 . The method of claim 15 , further comprising removing a portion of a material of the second lead frame to provide strain-relief features before encapsulating.
19 . A method of concurrently making semiconductor device packages, comprising:
affixing a first major surface of each of a plurality of first semiconductor dice, and electrically connecting each first semiconductor die, to respective first die-attach locations of a first lead frame;
affixing a second major surface of each of a plurality of second semiconductor dice, and electrically connecting each second semiconductor die, to respective second die-attach locations of a second lead frame;
securing each first semiconductor die to a corresponding second semiconductor die, the first lead frame located on a side of each first semiconductor die distal of the corresponding second semiconductor die, the second lead frame located on a side of each second semiconductor die distal of the first semiconductor die; and
encapsulating the first semiconductor dice, the second semiconductor dice, and at least portions of the first lead frame and the second lead frame in a molding material.
20 . The method of claim 19 , wherein securing each first semiconductor die to the corresponding second semiconductor die comprises securing each first semiconductor die to the corresponding second semiconductor die before affixing the first major surface of each of the plurality of first semiconductor dice to the respective first die-attach locations of the first lead frame and before affixing the second major surface of each of the plurality of second semiconductor dice to the respective second die-attach locations of the second lead frame.