Phased metalens for adjusting a focus of an image

1. A system, comprising:

a phased metalens configured to adjust a focus of an image detected by an imaging substrate of an image sensor,

the phased metalens configured to adjust the focus of the image by adapting a focus characteristic of the image sensor to compensate for warpage of the imaging substrate.

2. The system of claim 1 , wherein the warpage comprises a stress-induced warpage of the imaging substrate due to cooling of the image sensor from an initial curing process.

3. The system of claim 1 , wherein the warpage comprises a stress-induced warpage of the imaging substrate that changes based on an operating temperature of the system.

4. The system of claim 1 , wherein the warpage comprises a stress-induced warpage of the imaging substrate that increases as an operating temperature of the system decreases.

5. The system of claim 1 , wherein the warpage comprises a stress-induced warpage of the imaging substrate that decreases as an operating temperature of the system increases.

6. The system of claim 1 , wherein the phased metalens is configured to compensate for the warpage of the imaging substrate over a flatness range of 0 μm to about 7 μm.

7. The system of claim 1 , wherein the phased metalens is configured to be located proximate the image sensor and between the image sensor and a lens.

8. The system of claim 1 , wherein the phased metalens is configured to adjust a property of light that reaches the imaging substrate based on a change in a flatness of the imaging substrate caused by the warpage.

9. The system of claim 8 , wherein the property of the light that reaches the imaging substrate comprises a phase of all the light that reaches the imaging substrate at a same time.

10. The system of claim 8 , wherein the phased metalens is configured to adjust the property of the light based on an operating temperature of the image sensor.

11. The system of claim 8 , wherein the phased metalens is configured to adjust the property of the light based on a color of the light.

12. The system of claim 8 , wherein the property of the light that reaches the imaging substrate comprises a phase of all the light that reaches a same reference point on the imaging substrate at a same time.

13. The system of claim 12 , wherein the reference point comprises a point having a greatest distance from the phased metalens along a line normal to a plane defining an image focus field of the phased metalens.

14. A camera, comprising:

an objective lens;

an image sensor comprising an imaging substrate configured to detect an image; and

a phased metalens positioned between the objective lens and the image sensor, and configured to adjust a focus of the image detected by the imaging substrate by adapting a focus characteristic of the image sensor to compensate for warpage of the imaging substrate.

15. The camera of claim 14 , wherein the warpage comprises a stress-induced warpage of the imaging substrate due to cooling of the image sensor from an initial curing process.

16. The camera of claim 14 , wherein the warpage comprises a stress-induced warpage of the imaging substrate that changes based on an operating temperature of the camera.

17. The camera of claim 14 , wherein the warpage comprises a stress-induced warpage of the imaging substrate that increases as an operating temperature of the camera decreases.

18. The camera of claim 14 , wherein the warpage comprises a stress-induced warpage of the imaging substrate that decreases as an operating temperature of the camera increases.

19. The camera of claim 14 , wherein the phased metalens is configured to compensate for the warpage of the imaging substrate over a flatness range of 0 μm to about 7 μm.

20. The camera of claim 14 , wherein the camera is configured for use in a vehicle.