Dynamic gate steps for last-level programming to improve write performance
Systems, apparatuses and methods may provide for technology that conducts a pulse-verify loop sequence from a first program level in targeted NAND memory cells to a next-to-last program level in the memory cells, wherein the pulse-verify loop sequence includes an issuance of a program pulse and one or more verify pulses to the memory cells on a per program level basis, and wherein successive program pulses differ from one another by a gate step voltage amount. The technology may also issue a last level program pulse to the memory cells at a last program level, issue a single verify pulse to the memory cells after the last level program pulse, and issue a gate step pulse to the memory cells at a variable program level, wherein the variable program level differs from the last program level by an amount that is greater than the gate step voltage amount.
1. A semiconductor apparatus comprising:
one or more substrates; and
logic coupled to the one or more substrates, wherein the logic is implemented at least partly in one or more of configurable or fixed-functionality hardware, the logic to:
conduct a pulse-verify loop sequence from a first program level in targeted NAND memory cells to a next-to-last program level in the targeted NAND memory cells, wherein the pulse-verify loop sequence includes an issuance of a program pulse and one or more verify pulses to the targeted NAND memory cells on a per program level basis, and wherein successive program pulses differ from one another by a gate step voltage amount;
issue a last level program pulse to the targeted NAND memory cells at a last program level;
issue a single verify pulse to the targeted NAND memory cells after the last level program pulse; and
issue a gate step pulse to the targeted NAND memory cells at a variable program level, wherein the variable program level differs from the last program level by an amount that is greater than the gate step voltage amount.
2. The semiconductor apparatus of claim 1 , wherein the logic is to inhibit additional verification pulses after the single verify pulse.
3. The semiconductor apparatus of claim 2 , wherein the additional verification pulses are inhibited based on one or more of a count fail byte value that is dedicated to the last program level or a count fail bit value that is dedicated to the last program level.
4. The semiconductor apparatus of claim 1 , wherein the logic is to bypass an additional program pulse at the last program level.
5. The semiconductor apparatus of claim 1 , wherein the logic is to set the variable program level based on a wordline group associated with the targeted NAND memory cells.
6. The semiconductor apparatus of claim 1 , wherein a selective slow program convergence bitline voltage of the targeted NAND memory cells is dedicated to the last program level.
7. The semiconductor apparatus of claim 1 , wherein the targeted NAND memory cells are tri-level cells.
8. A computing system comprising:
non-volatile memory (NVM) including targeted NAND memory cells; and
a controller coupled to the NVM, wherein the controller includes logic coupled to one or more substrates, the logic to:
conduct a pulse-verify loop sequence from a first program level in the targeted NAND memory cells to a next-to-last program level in the targeted NAND memory cells, wherein the pulse-verify loop sequence includes an issuance of a program pulse and one or more verify pulses to the targeted NAND memory cells on a per program level basis, and wherein successive program pulses differ from one another by a gate step voltage amount,
issue a last level program pulse to the targeted NAND memory cells at a last program level,
issue a single verify pulse to the targeted NAND memory cells after the last level program pulse, and
issue a gate step pulse to the targeted NAND memory cells at a variable program level, wherein the variable program level differs from the last program level by an amount that is greater than the gate step voltage amount.
9. The computing system of claim 8 , wherein the logic is to inhibit additional verification pulses after the single verify pulse.
10. The computing system of claim 9 , wherein the additional verification pulses are inhibited based on one or more of a count fail byte value that is dedicated to the last program level or a count fail bit value that is dedicated to the last program level.
11. The computing system of claim 8 , wherein the logic is to bypass an additional program pulse at the last program level.
12. The computing system of claim 8 , wherein the logic is to set the variable program level based on a wordline group associated with the targeted NAND memory cells.
13. The computing system of claim 8 , wherein a selective slow program convergence bitline voltage of the targeted NAND memory cells is dedicated to the last program level.
14. The computing system of claim 8 , wherein the targeted NAND memory cells are tri-level cells.
15. A method comprising:
conducting a pulse-verify loop sequence from a first program level in targeted NAND memory cells to a next-to-last program level in the targeted NAND memory cells, wherein the pulse-verify loop sequence includes an issuance of a program pulse and one or more verify pulses to the targeted NAND memory cells on a per program level basis, and wherein successive program pulses differ from one another by a gate step voltage amount;
issuing a last level program pulse to the targeted NAND memory cells at a last program level;
issuing a single verify pulse to the targeted NAND memory cells after the last level program pulse; and
issuing a gate step pulse to the targeted NAND memory cells at a variable program level, wherein the variable program level differs from the last program level by an amount that is greater than the gate step voltage amount.
16. The method of claim 15 , further including inhibiting additional verification pulses after the single verify pulse.
17. The method of claim 16 , wherein the additional verification pulses are inhibited based on one or more of a count fail byte value that is dedicated to the last program level or a count fail bit value that is dedicated to the last program level.
18. The method of claim 15 , further including bypassing an additional program pulse at the last program level.
19. The method of claim 15 , further including setting the variable program level based on a wordline group associated with the targeted NAND memory cells.
20. The method of claim 15 , wherein a selective slow program convergence bitline voltage of the targeted NAND memory cells is dedicated to the last program level.