IP Library Granted Patent US 12,461,152
Granted Patent B2
US 12,461,152 · App. 17/426,533 · Granted Nov 4, 2025

Arc fault circuit interrupt tester and method

Inventors: Bruce R. Kuhn (Naperville, IL); Christian A. Castro (Deerfield, IL)
Assignee: Klein Tools, Inc.
G01R31/3274
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Quick Facts
Patent No.
US 12,461,152
App. No.
17/426,533
Granted
Nov 4, 2025
Kind
B2
Abstract

An arc fault circuit interrupt (AFCI) tester device includes a housing and a circuit assembly disposed within the housing. The circuit assembly includes a first load switching circuit for creating a pulse pattern having a plurality of pulses. The circuit assembly includes a second load switching circuit for creating an overlay signal superimposed upon at least one pulse of the plurality of pulses. The AFCI tester device includes an interface receiving the plurality of pulses and the overlay signal. The interface extends outside of the housing and is adapted for electrically coupling the circuit assembly to the AFCI device under test (DUT). The interface is adapted to transmit the pulse pattern and the overlay signal to the AFCI DUT.

Claims (29)

1 . An arc fault circuit interrupt (AFCI) tester device, comprising:

a housing;

a circuit assembly disposed within the housing and including:

a first load switching circuit for creating a pulse pattern having a plurality of pulses;

a second load switching circuit for creating an overlay signal superimposed upon at least one pulse of the plurality of pulses; and

an interface receiving the plurality of pulses and the overlay signal, the interface extending outside of the housing and adapted for electrically coupling the circuit assembly to an AFCI device under test (DUT), the interface adapted to transmit the pulse pattern and the overlay signal to the AFCI DUT;

wherein at least one pulse of the plurality of pulses has:

a pulse width that is less than a pulse width of at least one other pulse of the plurality of pulses; and

a pulse amplitude that is less than a pulse amplitude of the at least one other pulse.

2 . The AFCI tester device of claim 1 , further comprising logic circuitry coupled to the first and second load switching circuits of the circuit assembly, the logic circuitry being configured to:

transmit a first control signal to the first load switching circuit to facilitate creating the pulse pattern; and

transmit a second control signal to the second load switching circuit to facilitate creating the overlay signal.

3 . The AFCI tester device of claim 2 , wherein the logic circuitry is further configured to:

(a) transmit the first control signal to the first load switching circuit to facilitate at least one of:

creating the pulse pattern at one or more predetermined pulse frequencies;

creating the plurality of pulses at one or more predetermined pulse widths; and

creating the plurality of pulses at one or more predetermined pulse amplitudes; and

(b) transmit the second control signal to the second load switching circuit to facilitate at least one of:

creating the overlay signal at one or more predetermined signal frequencies; and

creating the overlay signal at one or more predetermined signal amplitudes.

4 . The AFCI tester device of claim 1 , wherein at least two pulses of the plurality of pulses have at least one of:

substantially equal pulse widths; and

substantially equal pulse amplitudes.

5 . The AFCI tester device of claim 1 , wherein the pulse pattern has a pulse frequency, and wherein the overlay signal has a signal frequency that is greater than the pulse frequency.

6 . The AFCI tester device of claim 1 , wherein the overlay signal is superimposed upon a first two or more pulses of the plurality of pulses, and the overlay signal is not superimposed upon a second two or more pulses of the plurality of pulses.

7 . The AFCI tester device of claim 1 , wherein the overlay signal induced by the second load switching circuit includes a first overlay signal and a second overlay signal, wherein the pulse pattern has a pulse frequency, and wherein at least one of:

a signal frequency of the first overlay signal, which is superimposed on one pulse of the plurality of pulses is less than a signal frequency of a second overlay signal, which is superimposed on another pulse of the plurality of pulses; and

a signal amplitude of the first overlay signal is less than a signal amplitude of the second overlay signal.

8 . The AFCI tester device of claim 1 , wherein the overlay signal is superimposed upon all pulses of the plurality of pulses.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2021
From: KUHN, BRUCE R.; CASTRO, CHRISTIAN A.
To: KLEIN TOOLS, INC.
Reel/Frame 057008/0692 →
Continuity (1)
Related Publication 20220091187A1 · Mar 24, 2022
References Cited (15)
US 6128169A · Neiger · 2000 [cited by examiner]
US 9671466B2 · Murahari et al. · 2017 [cited by applicant]
US 20020039026A1 · Stroth et al. · 2002 [cited by applicant]
US 20040100274A1 · Gloster · 2004 [cited by examiner]
US 20070008103A1 · Nicolls · 2007 [cited by examiner]
US 20080284450A1 · Lee · 2008 [cited by examiner]
US 20090189615A1 · Kinsel · 2009 [cited by applicant]
US 20090219038A1 · Stockinger · 2009 [cited by examiner]
US 20100103568A1 · Lee · 2010 [cited by applicant]
US 20120292991A1 · Dodal · 2012 [cited by examiner]
US 20120319709A1 · Brazis, Jr. · 2012 [cited by examiner]
US 20140168843A1 · Privitera · 2014 [cited by examiner]
EP 1731915A1 · 2006 [cited by applicant]
European Patent Office, International Search Report in International Patent Application No. PCT/US2019/015590, 5 pp. (Nov. 11, 2019). [cited by applicant]
European Patent Office, Written Opinion in International Patent Application No. PCT/US2019/015590, 6 pp. (Nov. 11, 2019). [cited by applicant]