Solid-state imaging device, method of manufacturing the same, and electronic apparatus
A solid state imaging device that includes a substrate having oppositely facing first and second surfaces and a photoelectric conversion unit layer having a light incident side facing away from the substrate. The substrate includes a first photoelectric conversion unit and a second photoelectric conversion and the photoelectric conversion layer includes a third photoelectric conversion unit.
1. A solid-state imaging device comprising:
a substrate having oppositely facing first and second surfaces;
a photoelectric conversion unit formed within the substrate; and
an organic photoelectric conversion unit having a light incident side facing away from the substrate,
wherein the organic photoelectric conversion unit includes: an upper electrode, a photoelectric conversion material layer, and a first lower electrode stacked in this order from the light incident side, and
wherein the first lower electrode is connected to a first conductive plug formed through the substrate.
2. The solid-state imaging device according to claim 1 , wherein a signal charge in the organic photoelectric conversion unit is transferred via the first lower electrode.
3. The solid-state imaging device according to claim 1 , wherein the first lower electrode is insulated from a second lower electrode of an adjacent pixel, and wherein the upper electrode extends to the second lower electrode of the adjacent pixel.
4. The solid-state imaging device according to claim 3 , wherein the upper electrode and the second lower electrode are connected to a second conductive plug formed through the substrate.
5. The solid-state imaging device according to claim 4 , wherein the first and second conductive plugs are formed of SiO2.
6. The solid-state imaging device according to claim 1 , wherein the photoelectric conversion unit formed within the substrate comprises an inorganic photoelectric conversion unit having a PN junction.
7. The solid-state imaging device according to claim 1 , further comprising:
an insulating layer between the first and second lower electrodes and the first surface of the substrate.
8. The solid-state imaging device according to claim 7 , wherein the insulating layer is made of HfO2.
9. The solid-state imaging device according to claim 1 , further comprising:
a first transfer transistor corresponding to the organic photoelectric conversion unit, wherein the first transfer transistor is formed above the first surface of the substrate.
10. The solid-state imaging device according to claim 1 , further comprising:
a circuit formed on the second surface of the substrate opposite to a light-sensing portion.
11. An electronic apparatus comprising:
an optical system;
a solid-state imaging device; and
a signal processing circuit processing an output signal of the solid-state imaging device, wherein the solid-state imaging device comprises:
a substrate having oppositely facing first and second surfaces;
a photoelectric conversion unit formed within the substrate; and
an organic photoelectric conversion unit having a light incident side facing away from the substrate,
wherein the organic photoelectric conversion unit includes: an upper electrode, a photoelectric conversion material layer, and a first lower electrode stacked in this order from the light incident side, and
wherein the first lower electrode is connected to a first conductive plug formed through the substrate.
12. The electronic apparatus according to claim 11 , wherein a signal charge in the organic photoelectric conversion unit is transferred via the first lower electrode.
13. The electronic apparatus according to claim 11 , wherein the first lower electrode is insulated from a second lower electrode of an adjacent pixel, and wherein the upper electrode extends to the second lower electrode of the adjacent pixel.
14. The electronic apparatus according to claim 13 , wherein the upper electrode and the second lower electrode are connected to a second conductive plug formed through the substrate.
15. The electronic apparatus according to claim 14 , wherein the first and second conductive plugs are formed of SiO2.
16. The electronic apparatus according to claim 11 , wherein the photoelectric conversion unit formed within the substrate comprises an inorganic photoelectric conversion unit having a PN junction.
17. The electronic apparatus according to claim 13 , further comprising:
an insulating layer between the first and second lower electrodes and the first surface of the substrate.
18. The electronic apparatus according to claim 17 , wherein the insulating layer is made of HfO2.
19. The electronic apparatus according to claim 11 , further comprising:
a first transfer transistor corresponding to the organic photoelectric conversion unit, wherein the first transfer transistor is formed above the first surface of the substrate.
20. The electronic apparatus according to claim 11 , further comprising:
a circuit formed on the second surface of the substrate opposite to a light-sensing portion.