Etch profile control of interconnect structures

1. A method, comprising:

patterning a first opening in a photoresist layer;

etching, via the first opening, a first silicon-based layer and a first organic layer below the photoresist layer to form a second opening in the first organic layer while removing the photoresist layer and the first silicon-based layer; and

etching, via the second opening, a capping layer, a second silicon-based layer, and a low temperature oxide (LTO) layer below the first organic layer to form a third opening in the second silicon-based layer and the LTO layer while removing the first organic layer and the capping layer, wherein the third opening exposes a portion of a second organic layer.

2. The method of claim 1 , wherein the first silicon-based layer is formed by spin-coating siloxane on the first organic layer at a temperature between about 50° C. and about 200° C., and wherein etching the first silicon-based layer comprises etching the first silicon-based layer by a dry etch process using a gas mixture comprising fluorocarbon, nitrogen, and argon.

3. The method of claim 1 , wherein the first organic layer is formed by spin-coating a polymer material on the capping layer at a temperature between about 100° C. and about 300° C., and wherein etching the first organic layer comprises etching the first organic layer by a dry etch process using a gas mixture comprising hydrogen, nitrogen, and argon.

4. The method of claim 1 , wherein the capping layer is formed on the second silicon-based layer by a chemical vapor deposition (CVD) process using a gas mixture comprising silane and oxygen at a temperature between about 200° C. and about 500° C., and wherein etching the capping layer comprises etching the capping layer by a dry etch process using fluorocarbon gas having a flow rate between about 100 sccm and about 400 sccm.

5. The method of claim 1 , wherein the second silicon-based layer is formed on the LTO layer by one of a chemical vapor deposition (CVD) process and a physical vapor deposition (PVD) process using a gas mixture having elements of silicon, oxygen, and carbon, and wherein etching the second silicon-based layer comprises etching the second silicon-based layer by a dry etch process using a gas mixture comprising hydrofluorocarbon, oxygen, nitrogen, and argon.

6. The method of claim 1 , wherein the LTO layer is formed on the second organic layer by a chemical vapor deposition (CVD) process using a gas mixture comprising silane and oxygen at a temperature between about 50° C. and about 200° C., and wherein etching the LTO layer comprises etching the LTO layer by a dry etch process using a gas mixture comprising between about 1% and about 20% fluorocarbon.

7. The method of claim 1 , further comprising spin-coating a polymer material on a substrate at a temperature between about 100° C. and about 300° C. to form the second organic layer.

8. A method, comprising:

forming a first opening in a silicon-based layer and a low temperature oxide (LTO) layer;

etching, via the first opening, an organic layer below the LTO layer to form a second opening in the organic layer while removing the silicon-based layer and the LTO layer; and

etching, via the second opening, a nitrogen free anti-reflective layer (NFARL) and an interlayer dielectric (ILD) layer below the organic layer to form a third opening in the NFARL and the ILD layer while removing the organic layer.

9. The method of claim 8 , wherein etching the organic layer comprises etching the organic layer by a dry etch process using a gas mixture comprising between about 5% and about 20% hydrogen, and wherein a flow rate of hydrogen is between about 20 sccm and about 100 sccm.

10. The method of claim 8 , wherein the NFARL is formed on the LTO layer by a chemical vapor deposition (CVD) process using a gas mixture comprising silane and carbon dioxide, and wherein etching the NFARL comprises etching the NFARL by a dry etch process using a gas mixture comprising fluorocarbon, oxygen, nitrogen, and argon.

11. The method of claim 8 , wherein the ILD layer is a low-k dielectric material formed on a substrate by one of a chemical vapor deposition (CVD) process and an atomic layer deposition (ALD) process, and wherein etching the ILD layer comprises etching the ILD layer by a dry etch process using a gas mixture comprising between about 5% and about 10% fluorocarbon.

12. A method, comprising:

forming, between adjacent hard mask stacks, a first opening in a nitrogen free anti-reflective layer (NFARL) and an interlayer dielectric (ILD) layer, wherein each of the hard mask stacks comprises a first hard mask layer and a second hard mask layer;

etching, via the first opening, the NFARL and the ILD layer exposed outside the hard mask stacks to form a second opening in the ILD layer while removing the second hard mask layer;

etching, via the second opening, a metal oxide layer below the ILD layer to form a third opening in the ILD layer and the metal oxide layer while removing the first hard mask layer; and

etching, via the third opening, a liner and an etch stop layer (ESL) below the metal oxide layer to form a fourth opening in the ILD layer, the metal oxide layer, the liner, and the ESL while removing the NFARL, wherein the fourth opening exposes a portion of a conductive structure.

13. The method of claim 12 , wherein the first hard mask layer comprises silicon nitride, titanium nitride, and combinations thereof, and wherein the second hard mask layer comprises tetraethoxysilane and is formed by a chemical vapor deposition (CVD) process.

14. The method of claim 12 , wherein the hard mask stacks are formed by a photolithography patterning process and a chlorine based dry etch process.

15. The method of claim 12 , wherein etching the NFARL and the ILD layer comprises etching the NFARL and the ILD layer by a dry etch process at a temperature between about 10° C. and about 90° C. and at a pressure between about 15 mTorr and about 100 mTorr.

16. The method of claim 12 , wherein the metal oxide layer is formed on the liner by a chemical vapor deposition (CVD) process, and wherein etching the metal oxide layer comprises etching the metal oxide layer by a wet etch process using hydrogen peroxide at a temperature between about 30° C. and about 100° C.

17. The method of claim 12 , wherein the liner comprises an oxygen doped carbide material and is formed on the ESL by one of a low pressure chemical vapor deposition (LPCVD) process, a plasma enhanced chemical vapor deposition (PECVD) process, and a chemical vapor deposition (CVD) process, and wherein etching the liner comprises etching the liner by a dry etch process using a gas mixture comprising fluorocarbon, oxygen, carbon dioxide, nitrogen, and argon.

18. The method of claim 12 , wherein the ESL comprises silicon nitride, silicon oxide, and combinations thereof and is formed on the conductive structure by one of a low pressure chemical vapor deposition (LPCVD) process, a plasma enhanced chemical vapor deposition process, a chemical vapor deposition (CVD) process, an atomic layer deposition (ALD) process, and a high-aspect-ratio process (HARP), and wherein etching the ESL comprises etching the ESL by a dry etch process using a gas mixture comprising between about 1% and about 5% carbon dioxide.

19. The method of claim 12 , further comprising forming the conductive structure on a substrate, wherein the conductive structure comprises a contact structure, a metal line, and combinations thereof.

20. The method of claim 12 , further comprising forming an other conductive structure in the fourth opening, wherein the other conductive structure has a substantially vertical sidewall and is electrically coupled to the conductive structure.