3D memory devices and structures with thinned single crystal substrates
A semiconductor device, the device including: a first level overlaid by a first memory control level; a first memory level disposed on top of said first control level, where said first memory level includes a first thinned single crystal substrate; a second memory level, said second memory level disposed on top of said first memory level, where said second memory level includes a second thinned single crystal substrate, where said memory control level is bonded to said first memory level, and where said bonded includes oxide to oxide and conductor to conductor bonding.
1. A semiconductor device, the device comprising:
a first level overlaid by a first memory control level;
a first memory level disposed on top of said first memory control level,
wherein said first memory level comprises a first thinned single crystal substrate;
a second memory level, said second memory level disposed on top of said first memory level,
wherein said second memory level comprises a second thinned single crystal substrate,
wherein said memory control level is bonded to said first memory level, and
wherein said bonded comprises oxide to oxide and conductor to conductor bonding.
2. The device according to claim 1 ,
wherein said first thinned single crystal substrate thickness is less than 25 microns and greater than 0.1 microns.
3. The device according to claim 1 , further comprising:
a logic level disposed either above or below said first memory level; and
a thermal isolation layer disposed between said logic level and said first memory level,
wherein said thermal isolation layer is designed so during said device operation a first temperature of memory cells of said first memory level is at least 20° C. lower than a second temperature of said logic level.
4. The device according to claim 1 ,
wherein said first memory control level comprises a third thinned single crystal substrate.
5. The device according to claim 1 ,
wherein said second memory level is bonded to said first memory level, and
wherein said bonded comprises oxide to oxide bonding.
6. The device according to claim 1 ,
wherein a portion of said first memory level is used as an alternative for a portion of said second memory level, or a portion of said second memory level is used as an alternative for a portion of said first memory level.
7. The device according to claim 1 ,
wherein said device is diced from a wafer structure resulting in a die with a planar size greater than 40 mm×40 mm.
8. A semiconductor device, the device comprising:
a memory control level;
a first memory level disposed on top of said memory control level,
wherein said first memory level comprises a first thinned single crystal substrate; and
a second memory level disposed on top of said first memory level,
wherein said second memory level comprises a second thinned single crystal substrate,
wherein said first memory level is bonded to said memory control level, and
wherein said bonded comprises oxide to oxide and conductor to conductor bonding.
9. The device according to claim 8 ,
wherein said first thinned single crystal substrate thickness is less than 25 microns and greater than 0.1 microns.
10. The device according to claim 8 , further comprising:
a logic level disposed either above or below said first memory level; and
a thermal isolation layer disposed between said logic level and said first memory level,
wherein said thermal isolation layer is designed so during said device operation a first temperature of memory cells of said first memory level is at least 20° C. lower than a second temperature of said logic level.
11. The device according to claim 8 ,
wherein said memory control level comprises a third thinned single crystal substrate.
12. The device according to claim 8 ,
wherein said second memory level is bonded to said first memory level, and
wherein said bonded comprises conductor to conductor bonding.
13. The device according to claim 8 ,
wherein a portion of said first memory level is used as an alternative for a portion of said second memory level, or a portion of said second memory level is used as an alternative for a portion of said first memory level.
14. The device according to claim 8 ,
wherein said device has been diced from a wafer structure resulting in a planar size greater than 40 mm×40 mm.
15. A semiconductor device, the device comprising:
a memory control level;
a first memory level disposed on top of said memory control level,
wherein said first memory level comprises a first thinned single crystal substrate; and
a second memory level disposed on top of said first memory level,
wherein said second memory level comprises a second thinned single crystal substrate,
wherein said first memory level is bonded to said memory control level,
wherein said bonded comprises oxide to oxide bonding, and
wherein said memory control level comprises a third thinned single crystal substrate and a plurality of vias (“TSV”) disposed through said third thinned single crystal substrate.
16. The device according to claim 15 ,
wherein said first thinned single crystal substrate thickness is less than 25 microns and greater than 0.1 microns.
17. The device according to claim 15 , further comprising:
a logic level disposed either above or below said first memory level; and
a thermal isolation layer disposed between said logic level and said first memory level,
wherein said thermal isolation layer is designed so during said device operation a first temperature of memory cells of said first memory level is at least 20° C. lower than a second temperature of said logic level.
18. The device according to claim 15 ,
wherein said bonded additionally comprises conductor to conductor bonding.
19. The device according to claim 15 ,
wherein a portion of said first memory level is used as an alternative for a portion of said second memory level, or a portion of said second memory level is used as an alternative for a portion of said first memory level.
20. The device according to claim 15 ,
wherein said device has been diced from a wafer structure resulting in a planar size greater than 40 mm×40 mm.