Etching method for silicon nitride and production method for semiconductor element
There is provided an etching method for silicon nitride that enables selective etching of silicon nitride without using plasma. The etching method for silicon nitride includes placing etching object ( 12 ) containing silicon nitride in an etching gas containing halogen fluoride, which is a compound of bromine or iodine and fluorine, to etch the silicon nitride of the etching object ( 12 ) without using plasma under a pressure of 1 Pa to 80 kPa.
1. An etching method for silicon nitride, comprising:
performing an etching step in which an etching object containing silicon nitride uses an etching gas, to etch the silicon nitride contained in the etching object under a pressure of 1 Pa to 80 kPa without using plasma,
wherein the etching gas consists of
i) a halogen fluoride only,
ii) a halogen fluoride and hydrogen fluoride, or
iii) a halogen fluoride, hydrogen fluoride and an inert gas,
wherein the halogen fluoride is at least one selected from among bromine trifluoride, bromine pentafluoride, iodine pentafluoride, and iodine heptafluoride,
wherein a content of the hydrogen fluoride contained in the etching gas is below 100 ppm by volume,
the etching object contains the silicon nitride and an etching-resistant material configured to suppress etching of the silicon nitride by the etching gas, and
the silicon nitride of the etching object is selectively etched by the etching gas.
2. The etching method for silicon nitride according to claim 1 , wherein a temperature of the etching object is 155° C. to 500° C.
3. The etching method for silicon nitride according to claim 2 , wherein the content of the halogen fluoride contained in the etching gas is equal to or more than 1% by volume.
4. The etching method for silicon nitride according to claim 1 , wherein the content of the halogen fluoride contained in the etching gas is equal to or more than 1% by volume.
5. The etching method for silicon nitride according to claim 1 , wherein the inert gas is at least one selected from among nitrogen gas, helium, argon, neon, krypton, and xenon.
6. The etching method for silicon nitride according to claim 1 , wherein the etching-resistant material contains at least one selected from among silicon dioxide, photoresist, and amorphous carbon.
7. The etching method for silicon nitride according to claim 1 , wherein an etching selectivity ratio is 10 or more, the etching selectivity ratio being a ratio of an etching rate of the silicon nitride to an etching rate of the etching-resistant material.
8. A production method for a semiconductor element for producing a semiconductor element by using the etching method for silicon nitride according to claim 1 .