IP Library Granted Patent US 11,784,155
Granted Patent B2
US 11,784,155 · App. 17/702,868 · Granted Oct 10, 2023

Systems and processes for increasing semiconductor device reliability

Inventors: Sung Chul Joo (Cary, NC); Jack Powell (Wake Forest, NC); Donald Farrell (Raleigh, NC); Bradley Millon (Durham, NC)
Assignee: WOLFSPEED, INC.
H01L24/37H01L23/562H01L23/66H01L24/35H01L24/40H01L24/84H01P3/003H01P11/003H01L2223/6627H01L2224/37012H01L2224/40157H01L2924/19033H01L2924/35121
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Quick Facts
Patent No.
US 11,784,155
App. No.
17/702,868
Granted
Oct 10, 2023
Kind
B2
Abstract

A system configured to increase a reliability of electrical connections in a device. The system including a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component. The lead includes an upper portion that includes a lower surface arranged on a lower surface thereof. The lower surface of the upper portion is arranged vertically above a first upper surface of a first pad connection portion; and the lower surface of the upper portion is arranged vertically above a second upper surface of the second pad connection portion. A process configured to increase a reliability of electrical connections in a device is also disclosed.

Claims (85)

1. A system configured to increase a reliability of electrical connections in a device, the system comprising:

a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component;

the lead includes a first pad connection portion that includes a first upper surface;

the first pad connection portion configured to connect the lead to the pad of at least one support structure;

the lead includes a second pad connection portion that includes a second upper surface;

the second pad connection portion configured to connect the lead to the pad of at least one electrical component;

the lead includes an upper portion that includes a lower surface arranged on a lower surface thereof;

the upper portion being arranged between the first pad connection portion and the second pad connection portion; and

an element configured to alleviate signaling degradation through the lead,

wherein the lower surface of the upper portion is arranged vertically above the first upper surface of the first pad connection portion;

wherein the lower surface of the upper portion is arranged vertically above the second upper surface of the second pad connection portion; and

wherein the element is arranged under the lead.

2. The system according to claim 1 wherein the element comprises at least one of the following: a metallic portion, a metallic component, and/or a metallic pad.

3. The system according to claim 1 wherein a width of the element is greater than a width of the pad of at least one support structure.

4. The system according to claim 1 further comprising:

at least one support structure; and

wherein the element comprises a metallic construction; and

wherein the element is arranged in one of the following: on the at least one support structure or within the at least one support structure.

5. The system according to claim 4 wherein:

the at least one support structure comprises a zone that includes a limited number of additional features; and

the element is arranged in the zone.

6. The system according to claim 5 wherein:

the at least one support structure comprises a Co-Planar Wave Guide (CPWG) printed circuit board (PCB) having vias; and

the zone that includes the element does not include the vias.

7. The system according to claim 6 further comprising at least one electrical component,

wherein the electrical component comprises an RF (Radio Frequency) component.

8. The system according to claim 1 wherein the upper portion comprises a curved convex construction.

9. The system according to claim 1 wherein:

the lead is configured to reduce stress in a first lead—solder interface arranged between the first pad connection portion of the lead and the pad of at least one support structure; and

the lead is configured to reduce stress in a second lead—solder interface arranged between the second pad connection portion of the lead and the pad of at least one electrical component.

10. The system according to claim 1 wherein:

the lead includes a first connection portion that connects between the first pad connection portion and the upper portion; and

the lead includes a second connection portion that connects between the second pad connection portion and the upper portion,

wherein portions of the first connection portion are arranged vertically above the first upper surface of the first pad connection portion; and

wherein portions of the second connection portion are arranged vertically above the second upper surface of the second pad connection portion.

11. The system according to claim 1 wherein

the lead includes a first connection portion that connects between the first pad connection portion and the upper portion; and

the lead includes a second connection portion that connects between the second pad connection portion and the upper portion,

wherein the first connection portion and the second connection portion each comprise a concave construction.

12. The system according to claim 1 wherein:

the lead includes a first end portion and a second end portion;

the first end portion forming a terminating end of the lead and the second end portion forming another terminating end of the lead; and

a curved distance from the first end portion to the second end portion along the lead is greater than a linear distance from the first end portion to the second end portion.

13. A process configured to increase a reliability of electrical connections in a device, the process comprising:

forming a lead that is configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component;

providing the lead with a first pad connection portion that includes a first upper surface;

configuring the first pad connection portion to connect the lead to the pad of at least one support structure;

providing the lead with a second pad connection portion that includes a second upper surface;

configuring the second pad connection portion to connect the lead to the pad of at least one electrical component;

arranging the lead to include an upper portion that includes a lower surface arranged on a lower surface thereof;

arranging the upper portion between the first pad connection portion and the second pad connection portion;

arranging the lower surface of the upper portion to be vertically above the first upper surface of the first pad connection portion;

arranging the lower surface of the upper portion to be arranged vertically above the second upper surface of the second pad connection portion; and

arranging an element configured to alleviate signaling degradation through the lead,

wherein the element is arranged under the lead.

14. The process according to claim 13 wherein the element comprises at least one of the following: a metallic portion, a metallic component, and/or a metallic pad.

15. The process according to claim 13 wherein a width of the element is greater than a width of the pad of at least one support structure.

16. The process according to claim 13 further comprising:

providing at least one support structure; and

wherein the element comprises a metallic construction; and

wherein the element is arranged in one of the following: on the at least one support structure or within the at least one support structure.

17. The process according to claim 16 further comprising:

forming a zone that includes a limited number of additional features in the at least one support structure; and

arranging the element in the zone.

18. The process according to claim 17 wherein:

the at least one support structure comprises a Co-Planar Wave Guide (CPWG) printed circuit board (PCB) having vias; and

the zone that includes the element does not include the vias.

19. The process according to claim 18 further comprising providing at least one electrical component,

wherein the electrical component comprises an RF (Radio Frequency) component.

20. The process according to claim 13 further comprising forming the upper portion to have a curved convex construction.

21. The process according to claim 13 further comprising:

implementing the lead to reduce stress in a first lead—solder interface arranged between the first pad connection portion of the lead and the pad of at least one support structure; and

implementing the lead to reduce stress in a second lead—solder interface arranged between the second pad connection portion of the pad of at least one electrical component.

22. The process according to claim 13 further comprising:

configuring the lead to include a first connection portion that connects between the first pad connection portion and the upper portion;

configuring the lead to include a second connection portion that connects between the second pad connection portion and the upper portion;

arranging portions of the first connection portion vertically above the first upper surface of the first pad connection portion; and

arranging portions of the second connection portion vertically above the second upper surface of the second pad connection portion.

23. The process according to claim 13 wherein

arranging the lead to include a first connection portion that connects between the first pad connection portion and the upper portion;

arranging the lead to include a second connection portion that connects between the second pad connection portion and the upper portion; and

configuring the first connection portion and the second connection portion to each have a concave construction.

24. The process according to claim 13 further comprising:

configuring the lead to include a first end portion and a second end portion, the first end portion forming a terminating end of the lead and the second end portion forming another terminating end of the lead; and

configuring the lead such that a curved distance from the first end portion to the second end portion along the lead is greater than a linear distance from the first end portion to the second end portion.

Assignments (8)
NOTICE OF GRANT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Mar 26, 2026
From: WOLFSPEED, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 075280/0919 →
RELEASE OF SECURITY INTEREST IN INTELLECTUAL PROPERTY COLLATERAL AT REEL/FRAME NO. 64185/0755 Recorded Sep 30, 2025
From: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: WOLFSPEED, INC.
Reel/Frame 072989/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Sep 30, 2025
From: WOLFSPEED, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 072992/0113 →
NOTICE OF GRANT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Sep 30, 2025
From: WOLFSPEED, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 072992/0381 →
NOTICE OF GRANT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Sep 30, 2025
From: WOLFSPEED, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 072992/0467 →
NOTICE OF GRANT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Sep 30, 2025
From: WOLFSPEED, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 072992/0588 →
SECURITY INTEREST Recorded Jun 30, 2023
From: WOLFSPEED, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION
Reel/Frame 064185/0755 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2022
From: JOO, SUNG CHUL; POWELL, JACK; FARRELL, DONALD; MILLION, BRADLEY
To: CREE, INC.
Reel/Frame 059409/0635 →
Continuity (2)
Continuation 16597224 · Oct 9, 2019
Related Publication 20220216175A1 · Jul 7, 2022