Solid-state device with multi-tier extreme thermal throttling
Aspects of a storage device are provided that apply advanced thermal throttling with multi-tier extreme thermal throttling. Initially, a controller determines whether a first temperature measurement indicates that a temperature of the memory meets a first thermal threshold associated with a first-tier extreme thermal throttling or a second thermal threshold associated with a second-tier extreme thermal throttling. Subsequently, the controller enables the first-tier extreme thermal throttling when the temperature measurement indicates that the temperature of the memory meets the first thermal threshold, or the controller enables the second-tier extreme thermal throttling when the temperature measurement indicates that the temperature of the memory meets the second thermal threshold. The controller then determines whether a second temperature measurement indicates that the temperature of the memory has decreased to avoid thermal shutdown of the storage device. Storage device performance is thus improved through advanced thermal throttling without compromising data integrity.
1. A storage device, comprising:
a memory; and
a controller coupled to the memory and configured to:
determine whether a first temperature measurement indicates that a temperature of the memory meets a first thermal threshold associated with a first-tier extreme thermal throttling or a second thermal threshold associated with a second-tier extreme thermal throttling,
enable the first-tier extreme thermal throttling when the first temperature measurement indicates that the temperature of the memory meets the first thermal threshold,
enable the second-tier extreme thermal throttling when the first temperature measurement indicates that the temperature of the memory meets the second thermal threshold, and
determine whether a second temperature measurement indicates that the temperature of the memory has decreased to avoid thermal shutdown of the storage device based on a first thermal mitigation configuration or a second thermal mitigation configuration,
wherein the controller configured to enable the second-tier extreme thermal throttling is further configured to:
initiate an operational timer indicating a proportion of a clock cycle that the storage device is active to perform one or more storage operations with the memory,
initiate a fetch command procedure that tracks one or more host commands for performing the one or more storage operations while the operational timer is active,
determine that the operational timer has reached a first timeout condition,
initiate a non-operational timer indicating a proportion of a clock cycle that the storage device is idle and not active to perform the one or more storage operations with the memory,
cease the fetch command procedure,
drain a pipeline associated with the memory to complete one or more pending storage device operations,
reduce a queue depth associated with an interface to a host device, and
determine that the non-operational timer has reached a second timeout condition.
2. The storage device of claim 1 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to apply one or more thermal mitigation parameters associated with the first-tier extreme thermal throttling that decreases a queue depth size of a host device interface and decreases a clock frequency by a predetermined percentage.
3. The storage device of claim 1 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to:
obtain one or more temperature measurements of the memory in a thermal power state associated with the first-tier extreme thermal throttling based on the first thermal mitigation configuration, and
determine whether the one or more temperature measurements is greater than an exit thermal throttling threshold associated with the first-tier extreme thermal throttling and lesser than an entry thermal throttling threshold associated with the second-tier extreme thermal throttling.
4. The storage device of claim 1 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to supply a first voltage that supports a single die operation and adjust a clock rate down to a predetermined percentage that is proportionate to a clock rate operating without thermal throttling.
5. The storage device of claim 1 , wherein the controller configured to enable the second-tier extreme thermal throttling is further configured to:
obtain one or more temperature measurements of the memory in a thermal power state associated with the second-tier extreme thermal throttling based on the second thermal mitigation configuration, and
determine whether the one or more temperature measurements is greater than an exit thermal throttling threshold associated with the second-tier extreme thermal throttling and lesser than an entry thermal throttling threshold associated with a thermal shutdown state.
6. The storage device of claim 1 , wherein the controller is further configured to initiate thermal shutdown of the storage device when the second temperature measurement indicates that the temperature of the memory did not decrease based on the second-tier extreme thermal throttling.
7. A storage device, comprising:
a memory; and
a controller configured to determine whether a first temperature measurement indicates that a temperature of the memory meets a first thermal threshold associated with a first-tier extreme thermal throttling or a second thermal threshold associated with a second-tier extreme thermal throttling, apply a first thermal mitigation configuration associated with the first-tier extreme thermal throttling when the first temperature measurement indicates that the temperature of the memory meets the first thermal threshold, apply a second thermal mitigation configuration associated with the second-tier extreme thermal throttling when the first temperature measurement indicates that the temperature of the memory meets the second thermal threshold, and determine whether a second temperature measurement indicates that the temperature of the memory has decreased to avoid thermal shutdown of the storage device based on the first thermal mitigation configuration or the second thermal mitigation configuration,
wherein the controller configured to apply the second thermal mitigation configuration is further configured to:
initiate an operational timer indicating a proportion of a clock cycle that the storage device is active to perform one or more storage operations with the memory,
initiate a fetch command procedure that tracks one or more host commands for performing the one or more storage operations while the operational timer is active,
determine that the operational timer has reached a first timeout condition,
initiate a non-operational timer indicating a proportion of a clock cycle that the storage device is idle and not active to perform the one or more storage operations with the memory,
cease the fetch command procedure,
drain a pipeline associated with the memory to complete one or more pending storage device operations,
reduce a queue depth associated with an interface to a host device, and
determine that the non-operational timer has reached a second timeout condition.
8. The storage device of claim 7 , wherein the controller configured to apply the first thermal mitigation configuration is further configured to apply one or more thermal mitigation parameters associated with the first thermal mitigation configuration that decreases a queue depth size of a host device interface and decreases a clock frequency by a predetermined percentage.
9. The storage device of claim 7 , wherein the controller configured to apply the first thermal mitigation configuration is further configured to:
obtain one or more temperature measurements of the memory in a thermal power state associated with the first-tier extreme thermal throttling based on the first thermal mitigation configuration, and
determine whether the one or more temperature measurements is greater than an exit thermal throttling threshold associated with the first-tier extreme thermal throttling and lesser than an entry thermal throttling threshold associated with the second-tier extreme thermal throttling.
10. The storage device of claim 7 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to supply a first voltage that supports a single die operation and adjust a clock rate down to a predetermined percentage that is proportionate to a clock rate operating without thermal throttling.
11. The storage device of claim 7 , wherein the controller configured to apply the second thermal mitigation configuration is further configured to:
obtain one or more temperature measurements of the memory in a thermal power state associated with the second-tier extreme thermal throttling based on the second thermal mitigation configuration, and
determine whether the one or more temperature measurements is greater than an exit thermal throttling threshold associated with the second-tier extreme thermal throttling and lesser than an entry thermal throttling threshold associated with a thermal shutdown state.
12. The storage device of claim 7 , wherein the controller is further configured to initiate thermal shutdown of the storage device when the second temperature measurement indicates that the temperature of the memory did not decrease based on the second-tier extreme thermal throttling.
13. A storage device, comprising:
a memory having a block of cells; and
a controller configured to obtain a first temperature of the block of cells, determine whether the first temperature exceeds a first thermal threshold associated with a first-tier extreme thermal throttling or a second thermal threshold associated with a second-tier extreme thermal throttling, the second thermal threshold being greater in value than the first thermal threshold, enable the first-tier extreme thermal throttling when the first temperature exceeds the first thermal threshold, enable the second-tier extreme thermal throttling when the first temperature exceeds the second thermal threshold, obtain a second temperature of the block of cells, transition to a thermal power state associated with a third thermal threshold smaller than the first thermal threshold when the second temperature does not exceed the first thermal threshold and the second thermal threshold, and transition to a thermal shutdown state associated with a fourth thermal threshold greater than the second thermal threshold when the second temperature exceeds the first thermal threshold and the second thermal threshold,
wherein the controller configured to enable the second-tier extreme thermal throttling is further configured to:
initiate an operational timer indicating a proportion of a clock cycle that the storage device is active to perform one or more storage operations with the memory,
initiate a fetch command procedure that tracks one or more host commands for performing the one or more storage operations while the operational timer is active,
determine that the operational timer has reached a first timeout condition,
initiate a non-operational timer indicating a proportion of a clock cycle that the storage device is idle and not active to perform the one or more storage operations with the memory,
cease the fetch command procedure,
drain a pipeline associated with the memory to complete one or more pending storage device operations,
reduce a queue depth associated with an interface to a host device, and
determine that the non-operational timer has reached a second timeout condition.
14. The storage device of claim 13 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to apply one or more thermal mitigation parameters associated with the first-tier extreme thermal throttling that decreases a queue depth size of a host device interface and decreases a clock frequency by a predetermined percentage.
15. The storage device of claim 13 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to:
obtain one or more temperature measurements of the memory in a thermal power state associated with the first-tier extreme thermal throttling based on a first thermal mitigation configuration, and
determine whether the one or more temperature measurements is greater than an exit thermal throttling threshold associated with the first-tier extreme thermal throttling and lesser than an entry thermal throttling threshold associated with the second-tier extreme thermal throttling.
16. The storage device of claim 13 , wherein the controller configured to enable the first-tier extreme thermal throttling is further configured to supply a first voltage that supports a single die operation and adjust a clock rate down to a predetermined percentage that is proportionate to a clock rate operating without thermal throttling.
17. The storage device of claim 13 , wherein the controller configured to enable the second-tier extreme thermal throttling is further configured to:
obtain one or more temperature measurements of the memory in a thermal power state associated with the second-tier extreme thermal throttling based on a second thermal mitigation configuration, and
determine whether the one or more temperature measurements is greater than an exit thermal throttling threshold associated with the second-tier extreme thermal throttling and lesser than an entry thermal throttling threshold associated with a thermal shutdown state.