Substrate processing method and substrate processing apparatus
A substrate processing method is a method of performing an etching process on a substrate with an etching solution in a processing tank. The substrate includes silicon oxide films and silicon nitride films stacked alternately. The etching solution contains phosphoric acid. The substrate processing method includes immersing the substrate in the etching solution, and replenishing the etching solution in the processing tank with phosphoric acid during the etching process on the substrate to cause a silicon concentration in the etching solution to vary.
1. A substrate processing method performing an etching process on a substrate with an etching solution in a processing tank, the substrate including silicon oxide films and silicon nitride films stacked alternately, the etching solution containing phosphoric acid,
the substrate processing method including:
immersing the substrate in the etching solution and start etching; and
increasing silicon concentration of the etching solution from a first silicon concentration to a second silicon concentration that is higher than the first silicon concentration by replenishing the etching solution in the processing tank with phosphoric acid during the etching process on the substrate to cause the silicon concentration in the etching solution to increase first at a first rate, and then, before reaching the second silicon concentration, increasing a replenishment flow rate of the phosphoric acid to increase the silicon concentration at a second rate, the second rate being smaller than the first rate.
2. The substrate processing method according to claim 1 , wherein in the replenishing,
the replenishment flow rate of the phosphoric acid that the etching solution is replenished with is controlled based on a set value for a replenishment flow rate of phosphoric acid that is set according to a structure of a semiconductor device to be manufactured using the substrate.
3. The substrate processing method according to claim 2 , wherein the structure of the semiconductor device indicates size of a gap between the silicon oxide films adjacent to each other in a stacking direction in the semiconductor device.
4. The substrate processing method according to claim 1 , wherein in the replenishing,
the replenishment flow rate of the phosphoric acid that the etching solution is replenished with is controlled based on the silicon concentration in the etching solution, the silicon concentration being measured during the etching process on the substrate.
5. The substrate processing method according to claim 1 , wherein in the replenishing,
the phosphoric acid that the etching solution is replenished with is supplied with a silicon containing liquid, the silicon containing liquid being a liquid that contains silicon.
6. The substrate processing method according to claim 5 , wherein in the replenishing,
a supply flow rate of the silicon containing liquid to be supplied to the phosphoric acid is controlled based on a set value for a supply flow rate of a silicon containing liquid that is set according to a structure of a semiconductor device to be manufactured using the substrate.
7. The substrate processing method according to claim 6 , wherein the structure of the semiconductor device indicates size of a gap between the silicon oxide films adjacent to each other in a stacking direction in the semiconductor device.
8. The substrate processing method according to claim 5 , wherein in the replenishing,
a supply flow rate of the silicon containing liquid to be supplied to the phosphoric acid is controlled based on the silicon concentration in the etching solution measured during the etching process on the substrate.
9. The substrate processing method according to claim 1 , wherein in the replenishing,
the replenishment flow rate of the phosphoric acid that the etching solution is replenished with is controlled based on data stored in a storage and indicative of a predetermined silicon concentration variation such that the silicon concentration in the etching solution in the processing tank measured during the etching process on the substrate follows the predetermined silicon concentration variation.
10. The substrate processing method according to claim 9 , wherein the data stored in the storage indicates a relationship between a processing time of the etching process and the silicon concentration.
11. The substrate processing method according to claim 9 , wherein the data stored in the storage indicates a relationship between a processing time of the etching process and a varying rate of the silicon concentration.
12. The substrate processing method of claim 1 , wherein the increasing the silicon concentration starts when etching starts.