IP Library Granted Patent US 12,258,491
Granted Patent B2
US 12,258,491 · App. 17/771,919 · Granted Mar 25, 2025

Polishing liquid, polishing liquid set, and polishing method

Inventors: Tomomi Kukita (Tokyo, JP); Tomohiro Iwano (Tokyo, JP); Tomoyasu Hasegawa (Tokyo, JP)
Assignee: Resonac Corporation
C09G1/02
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Quick Facts
Patent No.
US 12,258,491
App. No.
17/771,919
Granted
Mar 25, 2025
Kind
B2
Abstract

A polishing liquid containing: abrasive grains; at least one hydroxy acid component selected from the group consisting of a hydroxy acid and a salt thereof; and a compound Z, in which the compound Z has a hydrocarbon group which may be substituted and a polyoxyalkylene group, and a Z value represented by General Formula (1) below is 20 or more: Z =0.1× a 2 ×b/c   (1) [in Formula (1), “a” represents the number of carbon atoms of the hydrocarbon group, “b” represents the total number of oxyalkylene groups in the compound Z, and “c” represents an HLB value of the compound Z.]

Claims (41)

1. A polishing liquid comprising: abrasive grains; at least one hydroxy acid component selected from the group consisting of a hydroxy acid and a salt thereof; and a compound Z, wherein

the abrasive grains contain a cerium oxide,

a content of the cerium oxide is more than 50% by mass on the basis of the whole abrasive grains contained in the polishing liquid,

the compound Z has a hydrocarbon group which may be substituted and a polyoxyalkylene group, and

a Z value represented by General Formula (1) below is 20 or more:

Z= 0.1× a 2 ×b/c   (1)

[in Formula (1), “a” represents the number of carbon atoms of the hydrocarbon group, “b” represents the total number of oxyalkylene groups in the compound Z, and “c” represents an HLB value of the compound Z].

2. The polishing liquid according to claim 1 , wherein a zeta potential of the abrasive grains is positive.

3. The polishing liquid according to claim 1 , wherein the abrasive grains further contain cerium hydroxide.

4. The polishing liquid according to claim 1 , wherein the total number of a carboxy group and a carboxylate group in the hydroxy acid component is 1.

5. The polishing liquid according to claim 1 , wherein the number of a hydroxyl group in the hydroxy acid component is 1 or 2.

6. The polishing liquid according to claim 1 , wherein the number of a hydroxyl group in the hydroxy acid component is 2 or more.

7. The polishing liquid according to claim 1 , wherein the HLB value of the compound Z is 8.0 or more.

8. The polishing liquid according to claim 1 , wherein the compound Z contains a compound represented by General Formula (z1) below:

[in Formula (z1), A 1 represents an alkylene group, R 1 represents the hydrocarbon group, and n1 represents an integer of 2 or more].

9. The polishing liquid according to claim 8 , wherein the hydrocarbon group of the compound represented by General Formula (z1) is an aryl group having a plurality of aromatic rings.

10. The polishing liquid according to claim 1 , wherein the compound Z contains a compound having a nitrogen atom to which the hydrocarbon group and the polyoxyalkylene group are bonded.

11. The polishing liquid according to claim 1 , wherein the compound Z contains a compound represented by General Formula (z2) below:

[in Formula (z2), A 21 and A 22 each independently represent an alkylene group, R 2 represents the hydrocarbon group, and n21 and n22 each independently represent an integer of 2 or more].

12. The polishing liquid according to claim 11 , wherein the hydrocarbon group of the compound represented by General Formula (z2) is an alkyl group.

13. The polishing liquid according to claim 1 , wherein the HLB value “c” of the compound Z is 14.0 or more.

14. The polishing liquid according to claim 1 , wherein the number of carbon atoms “a” of the hydrocarbon group is 18 or more.

15. A polishing liquid set comprising constituent components of the polishing liquid according to claim 1 separately stored as a first liquid and a second liquid, wherein

the first liquid contains the abrasive grains, and the second liquid contains the hydroxy acid component and the compound Z.

16. A polishing method comprising a polishing step of polishing a surface to be polished by using a polishing liquid obtained by mixing the first liquid and the second liquid of the polishing liquid set according to claim 15 .

17. A polishing method comprising a polishing step of polishing a surface to be polished by using the polishing liquid according to claim 1 .

18. The polishing method according to claim 17 , wherein the surface to be polished contains silicon oxide.

19. The polishing method according to claim 18 , wherein the surface to be polished further contains silicon nitride.

20. A polishing liquid comprising: abrasive grains; at least one hydroxy acid component selected from the group consisting of a hydroxy acid and a salt thereof; and a compound Z, wherein

a content of the compound Z is 1 to 100 parts by mass with respect to 100 parts by mass of the hydroxy acid component,

the compound Z has a hydrocarbon group which may be substituted and a polyoxyalkylene group, and

a Z value represented by General Formula (1) below is 20 or more:

Z= 0.1× a 2 ×b/c   (1)

[in Formula (1), “a” represents the number of carbon atoms of the hydrocarbon group, “b” represents the total number of oxyalkylene groups in the compound Z, and “c” represents an HLB value of the compound Z].

21. A polishing liquid comprising: abrasive grains; at least one hydroxy acid component selected from the group consisting of a hydroxy acid and a salt thereof; and a compound Z, wherein

the abrasive grains contain cerium hydroxide,

a zeta potential of the abrasive grains is positive,

the compound Z has a hydrocarbon group which may be substituted and a polyoxyalkylene group, and

a Z value represented by General Formula (1) below is 20 or more:

Z= 0.1× a 2 ×b/c.   (1)

[in Formula (1), “a” represents the number of carbon atoms of the hydrocarbon group, “b” represents the total number of oxyalkylene groups in the compound Z, and “c” represents an HLB value of the compound Z].

Assignments (3)
CHANGE OF ADDRESS Recorded Feb 9, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066547/0677 →
CHANGE OF NAME Recorded Mar 8, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062992/0805 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2022
From: KUKITA, TOMOMI; IWANO, TOMOHIRO; HASEGAWA, TOMOYASU
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 059803/0854 →
Continuity (1)
Related Publication 20230203342A1 · Jun 29, 2023
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