Three-dimensional semiconductor memory device
According to one embodiment, a semiconductor memory device includes a substrate; an insulating layer provided on the substrate; a conductive layer provided on the insulating layer; a stacked body provided on the conductive layer and including a plurality of electrode layers and a plurality of insulating layers respectively provided among the plurality of electrode layers; a columnar section piercing through the stacked body to reach the conductive layer and extending in a first direction in which the stacked body is stacked; and a source layer. The columnar section includes a channel body and a charge storage film provided between the channel body and the respective electrode layers. The conductive layer includes a first film having electric conductivity and in contact with the lower end portion of the channel body; and an air gap provided to be covered by the first film.
1. A semiconductor memory device, comprising:
a substrate;
an insulating layer provided above the substrate;
a stacked body provided above the insulating layer and including a plurality of electrode layers separately stacked from each other in a first direction;
at least three semiconductor bodies extending in the first direction through the stacked body and including lower end portions below the stacked body;
a memory portion provided between one of the at least three semiconductor bodies and one of the plurality of electrode layers; and
a conductive layer comprising a first film of titanium nitride, being provided between the insulating layer and the stacked body, and having at least three portions electrically connected with the lower end portions of the at least three semiconductor bodies respectively,
the conductive layer being not separated among the at least three portions,
wherein the conductive layer further comprises a second film including tungsten.
2. The device according to claim 1 , wherein the conductive layer further comprises a polysilicon film.
3. The device according to claim 2 , wherein the second film is provided on the first film in the conductive layer.
4. The device according to claim 3 , wherein the polysilicon film is provided in an uppermost portion of the conductive layer.
5. The device according to claim 2 , wherein the polysilicon film is in contact with the lower end portions of the at least three semiconductor bodies.
6. The device according to claim 1 , wherein the conductive layer extends in a plane crossing the first direction and is not separated among the at least three portions in directions included in the plane.
7. The device according to claim 1 , further comprising:
a plurality of bit lines electrically connected to upper end portions of the at least three semiconductor bodies respectively above the stacked body.
8. The device according to claim 1 , wherein one of the plurality of electrode layers adjacent to the conductive layer in the first direction is a source side selection gate.
9. The device according to claim 1 , wherein the at least three semiconductor bodies include a first semiconductor body, a second semiconductor body, and a third semiconductor body, the first semiconductor body and the second semiconductor body being arranged in a second direction crossing the first direction, the first semiconductor body and the third semiconductor body being arranged in a third direction crossing the first direction and the second direction; and
wherein the first semiconductor body, the second semiconductor body, and the third semiconductor body are in contact with the conductive layer in common via respective contact portions.
10. The device according to claim 1 , further comprising:
an insulator extending in the first direction through the stacked body to reach the conductive layer.
11. The device according to claim 10 , wherein the insulator further extends in a second direction crossing the first direction and a bit line extending direction, the bit line being electrically connected to an upper end portion of one of the at least three semiconductor bodies above the stacked body.
12. A semiconductor memory device, comprising:
a substrate;
an insulating layer provided above the substrate;
a stacked body provided above the insulating layer and including a plurality of electrode layers separately stacked from each other in a first direction;
a semiconductor body extending in the first direction through the stacked body;
a memory portion provided between the semiconductor body and one of the plurality of electrode layers; and
a conductive layer electrically connected with a lower end portion of e semiconductor body between the insulating layer and the stacked body,
the conductive layer comprising a first film of titanium nitride and a polysilicon film, and
one of the plurality of electrode layers adjacent to the conductive layer in the first direction being a source side selection gale.
13. The device according to claim 12 , wherein the conductive layer further comprises a second film including tungsten.
14. The device according to claim 13 , wherein the second film is provided on the first film in the conductive layer.
15. The device according to claim 14 , wherein the polysilicon film is provided in an uppermost portion of the conductive layer.
16. The device according to claim 12 , wherein the polysilicon film is in contact with the lower end portion of the semiconductor body.
17. The device according to claim 12 , further comprising:
an insulator extending in the first direction through the stacked body to reach the conductive layer.
18. The device according to claim 17 , wherein the insulator further extends in a second direction crossing the first direction and a bit line extending direction, the bit line being electrically connected to an upper end portion of the semiconductor body above the stacked body.