IP Library Granted Patent US 12,463,059
Granted Patent B2
US 12,463,059 · App. 17/914,187 · Granted Nov 4, 2025

Production method for semiconductor packages

Inventors: Shizu Fukuzumi (Tokyo, JP); Naoya Suzuki (Tokyo, JP)
Assignee: RESONAC CORPORATION
H01L21/568H01L21/561H01L23/552
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Quick Facts
Patent No.
US 12,463,059
App. No.
17/914,187
Granted
Nov 4, 2025
Kind
B2
Abstract

A method for manufacturing a semiconductor package, the method includes: (A) forming a temporary fixing material layer on the first surface (circuit exposed surface) of a panel member including a plurality of semiconductor packages, (B) attaching an adhesive film to the second surface of the panel member; (C) singulating the panel member and the temporary fixing material layer on the adhesive film to obtain a plurality of temporary fixing material piece-attached semiconductor packages; (D) arranging a plurality of the temporary fixing material piece-attached semiconductor packages on a support carrier so that the distance between the adjacent temporary fixing material piece-attached semiconductor packages is 0.1 mm or more; (E) peeling off the first adhesive film from the support carrier and the plurality of temporary fixing material piece-attached semiconductor packages; and (F) forming a functional layer on surfaces of the plurality of temporary fixing material piece-attached semiconductor packages.

Claims (17)

1 . A method for manufacturing a semiconductor package, the method comprising:

(A) forming a temporary fixing material layer on a first surface of a panel member including a plurality of semiconductor packages, circuit surfaces or redistribution layers of the plurality of semiconductor packages being exposed to the first surface;

(B) attaching a first adhesive film to a second surface of the panel member;

(C) singulating the panel member and the temporary fixing material layer on the first adhesive film to obtain a plurality of temporary fixing material piece-attached semiconductor packages;

(D) arranging the plurality of the temporary fixing material piece-attached semiconductor packages on a support carrier so that temporary fixing material pieces of the plurality of temporary fixing material piece-attached semiconductor packages are in contact with the support carrier and a distance between two adjacent of the plurality of temporary fixing material piece-attached semiconductor packages is 0.1 mm or more;

(E) peeling off the first adhesive film from the support carrier and the plurality of temporary fixing material piece-attached semiconductor packages; and

(F) forming a functional layer on surfaces of the plurality of temporary fixing material piece-attached semiconductor packages, which are exposed by peeling off the first adhesive film.

2 . The method for manufacturing a semiconductor package according claim 1 , wherein the first adhesive film has stretchability, and

the step (D) includes:

(d1) increasing a distance between two adjacent of the plurality of temporary fixing material piece-attached semiconductor packages by applying tension to the first adhesive film; and

(d2) transferring the plurality of temporary fixing material piece-attached semiconductor packages on the first adhesive film to the support carrier in a state in which tension is applied to the first adhesive film.

3 . The method for manufacturing a semiconductor package according claim 1 , wherein the functional layer is a metal layer formed by sputtering or vapor deposition.

4 . The method for manufacturing a semiconductor package according to claim 1 , further comprising:

(G) attaching a second adhesive film so as to cover the functional layer formed on the surfaces of the plurality of temporary fixing material piece-attached semiconductor packages; and

(H) peeling off the temporary fixing material pieces and the support carrier from the plurality of semiconductor packages on the second adhesive film.

5 . The method for manufacturing a semiconductor package according to claim 1 , wherein the functional layer is an electromagnetic wave shield layer.

6 . The method for manufacturing a semiconductor package according to claim 5 , wherein the semiconductor package has a redistribution layer of less than 50 μm and a ground contact point provided on a side surface of the redistribution layer.

Assignments (3)
CHANGE OF ADDRESS Recorded Feb 9, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066547/0677 →
CHANGE OF NAME Recorded Mar 8, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062992/0805 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2022
From: FUKUZUMI, SHIZU; SUZUKI, NAOYA
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 061628/0618 →
Priority Claims (1)
JP 2020-058786 · Mar 27, 2020 · national
Continuity (1)
Related Publication 20230207334A1 · Jun 29, 2023
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