IP Library Granted Patent US 11,942,366
Granted Patent B2
US 11,942,366 · App. 17/937,499 · Granted Mar 26, 2024

Backside metal patterning die singulation systems and related methods

Inventor: Michael J. Seddon (Gilbert, AZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01L21/76871H01L21/32136H01L21/32139H01L21/78
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Quick Facts
Patent No.
US 11,942,366
App. No.
17/937,499
Granted
Mar 26, 2024
Kind
B2
Abstract

Implementations of die singulation systems and related methods may include forming a plurality of die on a first side of a substrate, forming a seed layer on a second side of a substrate opposite the first side of the substrate, using a shadow mask, applying a mask layer over the seed layer, forming a backside metal layer over the seed layer, removing the mask layer, and singulating the plurality of die included in the substrate through removing substrate material in the die street and through removing seed layer material in the die street.

Claims (40)

1. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

using a shadow mask, applying a mask layer over a second side of the substrate;

forming a backside metal layer over the second side of the substrate;

removing the mask layer;

flipping the substrate; and

singulating the plurality of die comprised in the substrate through removing substrate material in a die street from the first side of the substrate.

2. The method of claim 1 , wherein the mask layer comprises a polymer material.

3. The method of claim 1 , wherein the mask layer comprises a photoresist material.

4. The method of claim 1 , wherein the backside metal layer comprises copper.

5. The method of claim 1 , wherein removing substrate material in the die street further comprises plasma etching.

6. The method of claim 1 , further comprising forming a seed layer over the second side of the substrate.

7. The method of claim 1 , further comprising thinning the second side of the substrate to a thickness less than 30 micrometers.

8. The method of claim 1 , further comprising aligning the substrate from a backside of the substrate.

9. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a seed layer over a second side of the substrate;

using a shadow mask, applying a mask layer over the second side of the substrate;

forming a backside metal layer over the second side of the substrate;

removing the mask layer;

flipping the substrate;

removing substrate material in a die street; and

removing seed layer material in the die street after removing the substrate material.

10. The method of claim 9 , wherein the mask layer comprises a photoresist material.

11. The method of claim 9 , wherein removing substrate material in the die street comprises plasma etching the substrate.

12. The method of claim 9 , further comprising thinning the second side of the substrate to a thickness less than 30 micrometers.

13. The method of claim 9 , further comprising aligning the substrate from a backside of the substrate.

14. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a seed layer over a second side of the substrate;

using a shadow mask, applying a mask layer over the second side of the substrate;

forming a backside metal layer over the second side of the substrate;

removing the mask layer;

flipping the substrate;

etching the substrate from the first side of the substrate in a die street; and

singulating the plurality of die through jet ablating the seed layer in the die street after etching the substrate.

15. The method of claim 14 , wherein the mask layer comprises a photoresist material.

16. The method of claim 14 , further comprising thinning the substrate.

17. The method of claim 14 , wherein the backside metal layer is 10 micrometers thick.

18. The method of claim 14 , wherein the mask layer comprises a resin.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 062882, FRAME 0265 Recorded Aug 16, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 064615/0423 →
SECURITY INTEREST Recorded Feb 24, 2023
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 062882/0265 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2022
From: SEDDON, MICHAEL J.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 061286/0392 →
Continuity (4)
Continuation 17082579 · Oct 28, 2020
Continuation 16505902 · Jul 9, 2019
Provisional Application 62796668 · Jan 25, 2019
Related Publication 20230028096A1 · Jan 26, 2023
Cited By (1)
US 12,315,765