Apparatus for analyzing and/or processing a sample with a particle beam and method
An apparatus for analyzing and/or processing a sample with a particle beam includes a providing unit for providing the particle beam, and a shielding element for shielding an electric field (E) generated by charges (Q) accumulated on the sample. The shielding element has a through opening for the particle beam to pass through towards the sample. The apparatus further includes a detecting unit configured to detect an actual position of the shielding element, and an adjusting unit for adjusting the shielding element from the actual position into a target position.
1 . An apparatus for analyzing and/or processing a sample with a particle beam, comprising:
a providing unit for providing the particle beam;
a shielding element for shielding an electric field (E) generated by charges (Q) accumulated on the sample when the shielding element is at a distance from the sample of at most 100 μm, wherein the shielding element has a through opening for the particle beam to pass through towards the sample;
a detecting unit configured to detect an actual position of the shielding element;
an adjusting unit for adjusting the shielding element from the actual position into a target position; and
a securing device for securing the shielding element in a frictionally locking manner, and wherein the adjusting unit is configured to move the shielding element from the actual position thereof into the target position thereof while overcoming the frictional locking.
2 . The apparatus of claim 1 , comprising a vacuum housing for providing a vacuum within same, wherein at least the shielding element and the adjusting unit are arranged in the vacuum housing.
3 . The apparatus of claim 2 , wherein the detecting unit comprises an electron microscope, in particular a scanning electron microscope.
4 . The apparatus of claim 1 , wherein the adjusting unit is able to be operatively connected to the shielding element.
5 . The apparatus of claim 1 , furthermore comprising an engagement element and a receiving element, which are able to be engaged with one another in a releasable manner in order to provide an operative connection, wherein the adjusting unit comprises one element from the engagement element and the receiving element and the shielding element or a holder holding the shielding element comprises the respective other element from the engagement element and the receiving element.
6 . The apparatus of claim 1 , furthermore comprising an engagement element and a receiving element, wherein the engagement element is embodied as a pin and/or the receiving element is embodied as a hole, in particular as a hole in the shielding element or a holder.
7 . The apparatus of claim 6 , wherein the engagement element forms a force transmission element for providing an operative connection between the adjusting unit and the shielding element, wherein a mechanical stability of the force transmission element is chosen such that a force transmission along the operative connection is limited to a predefined measure.
8 . The apparatus of claim 1 , comprising a further detecting unit configured to detect a position of an engagement element in relation to a receiving element.
9 . The apparatus of claim 8 , wherein the further detecting unit comprises a camera and/or records an image with the aid of a deflection mirror.
10 . The apparatus of claim 8 , wherein the engagement element projects from a deflection mirror.
11 . The apparatus of claim 8 , wherein the adjusting unit has a sample stage for holding the sample and/or a sample.
12 . The apparatus of claim 8 , wherein the adjusting unit is configured to displace the shielding element in a direction transversely with respect to the particle beam.
13 . The apparatus of claim 1 , comprising a circulating plate for providing process gases, wherein the shielding element, in terms of its actual and target positions, is in each case secured to the circulating plate in a releasable manner.
14 . A method for setting a position of a shielding element in an apparatus for analyzing and/or processing a sample with a particle beam, wherein the shielding element is for shielding an electric field (E) generated by charges (Q) accumulated on the sample when the shielding element is at a distance from the sample of at most 100 μm, and wherein the method comprises the following steps:
a) mounting the shielding element in a vacuum housing of the apparatus, wherein the shielding element is secured in a frictionally locking manner;
b) producing the vacuum in the vacuum housing;
c) detecting an actual position of the shielding element; and
d) adjusting the shielding element from the actual position into a target position in the presence of vacuum while overcoming the frictional locking.
15 . The apparatus of claim 2 , wherein the adjusting unit is able to be operatively connected to the shielding element.
16 . The apparatus of claim 3 , wherein the adjusting unit is able to be operatively connected to the shielding element.
17 . The apparatus of claim 2 , furthermore comprising an engagement element and a receiving element, which are able to be engaged with one another in a releasable manner in order to provide an operative connection, wherein the adjusting unit comprises one element from the engagement element and the receiving element and the shielding element or a holder holding the shielding element comprises the respective other element from the engagement element and the receiving element.
18 . The apparatus of claim 3 , furthermore comprising an engagement element and a receiving element, which are able to be engaged with one another in a releasable manner in order to provide an operative connection, wherein the adjusting unit comprises one element from the engagement element and the receiving element and the shielding element or a holder holding the shielding element comprises the respective other element from the engagement element and the receiving element.
19 . The apparatus of claim 2 , furthermore comprising an engagement element and a receiving element, wherein the engagement element is embodied as a pin and/or the receiving element is embodied as a hole, in particular as a hole in the shielding element or a holder.
20 . The apparatus of claim 5 , wherein the engagement element forms a force transmission element for providing the operative connection between the adjusting unit and the shielding element, wherein a mechanical stability of the force transmission element is chosen such that a force transmission along the operative connection is limited to a predefined measure.