Lift assembly for semiconductor manufacturing processing chamber
Apparatuses and methods for loading and unloading substrates from a semiconductor manufacturing processing chamber are described. Some embodiments advantageously provide improved lift assemblies (e.g., lift ring designs) for centering lift pins in semiconductor processing chambers by allowing for unconstrained translation of the lift pins in the x-y plane. Some embodiments advantageously prevent lift pin tilting. Some embodiments advantageously provide a seal between the top end portion of the lift pins and the openings in the top surface. The lift assemblies include a ring-shaped body, a plurality of movable blocks configured to cooperatively interact with one or more openings of the ring-shaped body, and at least one ball bearing. The movable blocks include at least one indentation in a top surface of a bottom portion of the block and a complementary sized ball bearing in the at least one indentation.
1 . A lift assembly for a semiconductor manufacturing processing chamber, the lift assembly comprising:
a ring-shaped body having a top surface and a bottom surface defining a thickness of the ring-shaped body, an inner peripheral face and an outer peripheral face defining a width of the ring-shaped body, and a plurality of openings on the top surface and the inner peripheral face, the plurality of openings extending through a portion of the thickness and a portion of the width from the inner peripheral face towards the outer peripheral face, each of the plurality of openings having a top portion and a bottom portion, the top portion having a first width and the bottom portion having a second width, the second width greater than the first width; and
a plurality of movable blocks, each of the plurality of movable blocks having a top portion and a bottom portion, the top portion having a top surface, the bottom portion having a top surface and a bottom surface, the top portion defining a first width and the bottom portion defining a second width, the second width greater than the first width, each of the plurality of movable blocks configured to cooperatively interact with one or more of the plurality of openings of the ring-shaped body, each of the plurality of movable blocks comprising a hole extending into the top portion.
2 . The lift assembly of claim 1 , wherein the top surface of the top portion and the bottom surface of the bottom portion define a height of the respective movable block.
3 . The lift assembly of claim 2 , wherein the hole extends into a portion of the height of the respective movable block.
4 . The lift assembly of claim 1 , wherein the hole in each of the plurality of movable blocks is a threaded opening.
5 . The lift assembly of claim 1 , wherein each of the plurality of movable blocks comprises at least one indentation in the top surface of the bottom portion.
6 . The lift assembly of claim 5 , wherein each of the plurality of movable blocks further comprises a ball bearing in the at least one indentation.
7 . The lift assembly of claim 1 , wherein the first width and the second width of each of the plurality of openings are greater than the first width and the second width of a corresponding one of the plurality of movable blocks, respectively.
8 . The lift assembly of claim 1 , wherein there is a gap between the first width of each of the plurality of openings and the first width of a corresponding one of the plurality of movable blocks.
9 . The lift assembly of claim 1 , wherein there is a gap between the second width of each of the plurality of openings and the second width of a corresponding one of the plurality of movable blocks.
10 . The lift assembly of claim 1 , comprising three openings and three movable blocks.
11 . The lift assembly of claim 10 , wherein the plurality of openings are spaced 120° apart.
12 . The lift assembly of claim 1 , wherein each of the plurality of movable blocks comprises a ceramic material.
13 . A semiconductor manufacturing processing chamber comprising:
a substrate support having a support surface and a bottom surface, the support surface comprising a plurality of openings, the support surface configured to support a wafer during processing;
a substrate support shaft connected to and extending from the bottom surface of the substrate support, the substrate support shaft having a location that is aligned with a central axis of the processing chamber;
a lift assembly spaced a distance from the bottom surface of the substrate support, the lift assembly comprising:
a ring-shaped body having a top surface and a bottom surface defining a thickness of the ring-shaped body, an inner peripheral face and an outer peripheral face defining a width of the ring-shaped body, and a plurality of openings on the top surface extending through a portion of the thickness and from the inner peripheral face towards the outer peripheral face, each of the plurality of openings on the top surface having a top portion and a bottom portion, the top portion having a first width and the bottom portion having a second width, the second width greater than the first width; and
a plurality of movable blocks, each of the plurality of movable blocks having a top portion and a bottom portion, the top portion having a top surface, the bottom portion having a top surface and a bottom surface, the top portion defining a first width and the bottom portion defining a second width, the second width greater than the first width, each of the plurality of movable blocks configured to cooperatively interact with one or more of the plurality of openings of the ring-shaped body, each of the plurality of movable blocks comprising a hole extending into the top portion; and
a plurality of lift pins positioned within the plurality of openings in the support surface, the plurality of lift pins extending through the bottom surface of the substrate support to the holes in the plurality of movable blocks.
14 . The processing chamber of claim 13 , wherein each of the plurality of movable blocks comprises at least one indentation in the top surface of the bottom portion.
15 . The processing chamber of claim 14 , wherein each of the plurality of movable blocks further comprises a ball bearing in the at least one indentation.
16 . The processing chamber of claim 13 , each of the plurality of lift pins has a top end and a bottom end defining a length of the lift pins.
17 . The processing chamber of claim 16 , wherein the bottom end of each of the plurality of lift pins is threaded and the hole in each of the plurality of movable blocks has a threaded opening.
18 . The process chamber of claim 16 , wherein the top end of each of the plurality of lift pins has a convex top surface and a flared width, and the plurality of openings in the substrate support have a flared surface to prevent the top ends of the plurality of lift pins from passing through the bottom surface of the substrate support.
19 . The process chamber of claim 16 , wherein the plurality of lift pins and the plurality of openings in the substrate support are configured to prevent the plurality of lift pins from tilting.
20 . A processing tool comprising:
a central transfer station comprising a robot configured to move a wafer;
a plurality of process stations, each process station connected to the central transfer station and providing a processing region separated from processing regions of adjacent process stations, the plurality of process stations comprising at least one semiconductor manufacturing processing chamber, the at least one semiconductor manufacturing processing chamber comprising a lift assembly according to claim 1 spaced a distance from a bottom surface of a substrate support; and
a controller connected to the central transfer station and the plurality of process stations, the controller configured to activate the robot to move the wafer between the process stations, and to control one or more processes occurring in each of the process stations.