IP Library Granted Patent US 12,487,254
Granted Patent B2
US 12,487,254 · App. 18/182,434 · Granted Dec 2, 2025

Packaged current sensor integrated circuit

Inventor: Shixi Louis Liu (Hooksett, NH)
Assignee: Allegro MicroSystems, LLC
G01R15/202H01L23/49575G01R15/207G01R19/0092G01R33/072
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Quick Facts
Patent No.
US 12,487,254
App. No.
18/182,434
Granted
Dec 2, 2025
Kind
B2
Abstract

A current sensor circuit package includes a primary conductor having an input portion into which a current flows, an output portion from which the current flows, and an exposed portion, wherein the input and output portions have a reduced area edge. A secondary lead has an elongated portion that is offset with respect to the exposed portion of the secondary lead. A semiconductor die is disposed adjacent to the primary conductor on an insulator portion and at least one magnetic field sensing element is supported by the semiconductor die. A package body enclosing the semiconductor die and a portion of the primary conductor includes a first cutout in a first side edge configured to expose the reduced area edge of the input portion of the primary conductor and a second cutout on a second side edge configured to expose the reduced area edge of the output portion of the primary conductor, wherein the first side edge of the package body is substantially parallel with respect to the second side edge of the package body.

Claims (24)

1 . A current sensor integrated circuit package comprising:

a primary conductor having an input portion into which a current flows, an output portion from which the current flows, and an exposed portion, wherein the input portion has a reduced area edge and the output portion has a reduced area edge;

a secondary lead having an exposed portion spaced from the exposed portion of the primary conductor by an isolation distance of at least 2.0 mm, wherein an elongated portion of the secondary lead is offset with respect to the exposed portion of the secondary lead;

a semiconductor die disposed adjacent to the primary conductor and positioned on an insulator portion;

at least one magnetic field sensing element supported by the semiconductor die, wherein the at least one magnetic field sensing element is configured to generate a signal corresponding to the current that flows in the primary conductor; and

a package body enclosing the semiconductor die and a portion of the primary conductor and comprising a first cutout in a first side edge configured to expose the reduced area edge of the input portion of the primary conductor and a second cutout on a second side edge configured to expose the reduced area edge of the output portion of the primary conductor, wherein the first side edge of the package body is substantially parallel with respect to the second side edge of the package body.

2 . The current sensor integrated circuit package of claim 1 wherein the reduced area edge of the input portion of the primary conductor is exposed at the first side edge of the package body, wherein the reduced area edge of the output portion of the primary conductor is exposed at the second side edge of the package body, and wherein the elongated portion of the secondary lead extends in a direction parallel to the first and second side edges of the package body.

3 . The current sensor integrated circuit package of claim 2 wherein the reduced area edge of the input portion of the primary conductor does not extend beyond the first side edge of the package body and wherein the reduced area edge of the output portion of the primary conductor does not extend beyond the second side edge of the package body.

4 . The current sensor integrated circuit package of claim 1 wherein the package body is singulated along the reduced area edge of the input portion of the primary conductor and along the reduced area edge of the output portion of the primary conductor.

5 . The current sensor integrated circuit package of claim 1 wherein the secondary lead has a substantially constant thickness and wherein the secondary lead is offset with respect to the exposed portion in a direction of a thickness of the secondary lead.

6 . The current sensor integrated circuit package of claim 1 wherein the isolation distance is at least 4.0 mm.

7 . The current sensor integrated circuit package of claim 1 wherein the isolation distance is at least 7.2 mm.

8 . The current sensor integrated circuit package of claim 1 wherein the secondary lead comprises a first secondary lead providing an output connection of the current sensor integrated circuit package, a second secondary lead providing a voltage input connection of the current sensor integrated circuit package, and a third secondary lead providing a ground connection of the current sensor integrated circuit package.

9 . The current sensor integrated circuit package of claim 1 further comprising a front-end amplifier supported by the semiconductor die, wherein the at least one magnetic field sensing element is coupled to the front-end amplifier.

10 . The current sensor integrated circuit package of claim 1 comprising at least two magnetic field sensing elements.

11 . The current sensor integrated circuit package of claim 10 wherein the at least two magnetic field sensing elements are Hall effect elements.

12 . The current sensor integrated circuit package of claim 11 wherein the at least two magnetic field sensing elements are coupled to provide a differential output.

13 . The current sensor integrated circuit package of claim 1 wherein the secondary lead provides a fault signal connection of the current sensor integrated circuit package.

14 . The current sensor integrated circuit package of claim 1 further comprising a wafer backside coating material on a back of the semiconductor die.

15 . The current sensor integrated circuit package of claim 14 further comprising a second wafer backside coating material on the back of the semiconductor die.

16 . The current sensor integrated circuit package of claim 1 wherein the exposed portion of the primary conductor is substantially orthogonal to the first side edge of the package body and the second side edge of the package body.

17 . The current sensor integrated circuit of claim 1 wherein the insulator portion extends beyond an edge of the primary conductor in a direction towards the secondary lead.

18 . The current sensor integrated circuit of claim 17 wherein the insulator portion extends beyond the edge of the primary conductor in the direction towards the secondary lead by at least 0.1 mm.

19 . The current sensor integrated circuit of claim 17 wherein the insulator portion extends beyond the edge of the primary conductor in the direction towards the secondary lead by at least 0.4 mm.

Assignments (2)
PATENT SECURITY AGREEMENT Recorded Jun 22, 2023
From: ALLEGRO MICROSYSTEMS, LLC
To: MORGAN STANLEY SENIOR FUNDING, INC., AS THE COLLATERAL AGENT
Reel/Frame 064068/0459 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2023
From: LIU, SHIXI LOUIS
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 062999/0801 →
Continuity (4)
Continuation In Part 18053480 · Nov 8, 2022
Continuation In Part 17654254 · Mar 10, 2022
Continuation In Part 17409011 · Aug 23, 2021
Related Publication 20230221355A1 · Jul 13, 2023
References Cited (139)
US 5255157A · Hegel · 1993 [cited by applicant]
US 5289344A · Gagnon et al. · 1994 [cited by applicant]
US 5557504A · Siegel et al. · 1996 [cited by applicant]
US 5570273A · Siegel et al. · 1996 [cited by applicant]
US 5963028A · Engel et al. · 1999 [cited by applicant]
US 6211462B1 · Carter, Jr. et al. · 2001 [cited by applicant]
US 6265865B1 · Engel et al. · 2001 [cited by applicant]
US 6306684B1 · Richardson et al. · 2001 [cited by applicant]
US 6326243B1 · Suzuya et al. · 2001 [cited by applicant]
US 6356068B1 · Steiner et al. · 2002 [cited by applicant]
US 6781359B2 · Stauth et al. · 2004 [cited by applicant]
US 6995315B2 · Sharma et al. · 2006 [cited by applicant]
US 7005754B2 · Howarth · 2006 [cited by applicant]
US 7075287B1 · Mangtani et al. · 2006 [cited by applicant]
US 7166807B2 · Gagnon et al. · 2007 [cited by applicant]
US 7183485B2 · Groothuis et al. · 2007 [cited by applicant]
US 7259545B2 · Stauth et al. · 2007 [cited by applicant]
US 7265531B2 · Stauth et al. · 2007 [cited by applicant]
US 7301229B2 · Yau · 2007 [cited by applicant]
US 7372147B2 · Dai et al. · 2008 [cited by applicant]
US 7476816B2 · Doogue et al. · 2009 [cited by applicant]
US 7518354B2 · Stauth et al. · 2009 [cited by applicant]
US 7554180B2 · McKerreghan et al. · 2009 [cited by applicant]
US 7598601B2 · Taylor et al. · 2009 [cited by applicant]
US 7746056B2 · Stauth et al. · 2010 [cited by applicant]
US 7816905B2 · Doogue et al. · 2010 [cited by applicant]
US 8080994B2 · Taylor et al. · 2011 [cited by applicant]
US 8461677B2 · Ararao et al. · 2013 [cited by applicant]
US 8486755B2 · Ararao et al. · 2013 [cited by applicant]
US 8604777B2 · Doogue et al. · 2013 [cited by applicant]
US 8629539B2 · Milano et al. · 2014 [cited by applicant]
US 8907437B2 · Milano et al. · 2014 [cited by applicant]
US 9190606B2 · Liu et al. · 2015 [cited by applicant]
US 9228860B2 · Sharma et al. · 2016 [cited by applicant]
US 9299915B2 · Milano et al. · 2016 [cited by applicant]
US 9383425B2 · Milano et al. · 2016 [cited by applicant]
US 9411025B2 · David et al. · 2016 [cited by applicant]
US 9494660B2 · David et al. · 2016 [cited by applicant]
US 9620705B2 · Milano et al. · 2017 [cited by applicant]
US 9666788B2 · Taylor et al. · 2017 [cited by applicant]
US 9788403B2 · Mrusek · 2017 [cited by applicant]
US 9812588B2 · Vig et al. · 2017 [cited by applicant]
US 9865807B2 · Liu et al. · 2018 [cited by applicant]
US 10230006B2 · Vig et al. · 2019 [cited by applicant]
US 10234513B2 · Vig et al. · 2019 [cited by applicant]
US 10333055B2 · Milano et al. · 2019 [cited by applicant]
US 10345343B2 · Milano et al. · 2019 [cited by applicant]
US 10509058B2 · Cadugan et al. · 2019 [cited by applicant]
US 10578684B2 · Cadugan et al. · 2020 [cited by applicant]
US 10718794B2 · El Bacha et al. · 2020 [cited by applicant]
US 10753963B2 · Milano et al. · 2020 [cited by applicant]
US 10916665B2 · Vig et al. · 2021 [cited by applicant]
US 11024576B1 · West et al. · 2021 [cited by applicant]
US 11085952B2 · Cadugan et al. · 2021 [cited by applicant]
US 11183436B2 · Liu et al. · 2021 [cited by applicant]
US 11519946B1 · Rock et al. · 2022 [cited by applicant]
US 11538744B2 · Yandoc · 2022 [cited by examiner]
US 11768229B2 · Boden et al. · 2023 [cited by applicant]
US 20020190703A1 · Goto et al. · 2002 [cited by applicant]
US 20030193018A1 · Tao et al. · 2003 [cited by applicant]
US 20040124505A1 · Mahle et al. · 2004 [cited by applicant]
US 20050030018A1 · Shibahara et al. · 2005 [cited by applicant]
US 20050124185A1 · Cromwell et al. · 2005 [cited by applicant]
US 20070126092A1 · San Antonio et al. · 2007 [cited by applicant]
US 20070279053A1 · Taylor et al. · 2007 [cited by applicant]
US 20080297138A1 · Taylor et al. · 2008 [cited by applicant]
US 20100156394A1 · Ausserlechner et al. · 2010 [cited by applicant]
US 20110049685A1 · Park et al. · 2011 [cited by applicant]
US 20110234215A1 · Ausserlechner · 2011 [cited by applicant]
US 20110248711A1 · Ausserlechner · 2011 [cited by applicant]
US 20120080781A1 · Li · 2012 [cited by examiner]
US 20120089266A1 · Tomimbang et al. · 2012 [cited by applicant]
US 20130015843A1 · Doogue et al. · 2013 [cited by applicant]
US 20130020660A1 · Milano et al. · 2013 [cited by applicant]
US 20130138372A1 · Ausserlechner · 2013 [cited by applicant]
US 20140253103A1 · Racz et al. · 2014 [cited by applicant]
US 20140264678A1 · Liu et al. · 2014 [cited by applicant]
US 20140266181A1 · Milano et al. · 2014 [cited by applicant]
US 20150108967A1 · Barczyk · 2015 [cited by applicant]
US 20150270198A1 · Cuoco et al. · 2015 [cited by applicant]
US 20150285874A1 · Taylor et al. · 2015 [cited by applicant]
US 20160187388A1 · Suzuki et al. · 2016 [cited by applicant]
US 20160216296A1 · Nakayama et al. · 2016 [cited by applicant]
US 20160223594A1 · Suzuki et al. · 2016 [cited by applicant]
US 20160282388A1 · Milano et al. · 2016 [cited by applicant]
US 20160282425A1 · Haas et al. · 2016 [cited by applicant]
US 20160313375A1 · Etschmaier · 2016 [cited by applicant]
US 20170179067A1 · Aoki et al. · 2017 [cited by applicant]
US 20170336481A1 · Latham et al. · 2017 [cited by applicant]
US 20180149677A1 · Milano et al. · 2018 [cited by applicant]
US 20180166350A1 · Racz et al. · 2018 [cited by applicant]
US 20180306843A1 · Bussing et al. · 2018 [cited by applicant]
US 20190006266A1 · Gomez et al. · 2019 [cited by applicant]
US 20190049527A1 · Vig et al. · 2019 [cited by applicant]
US 20190109072A1 · David et al. · 2019 [cited by applicant]
US 20190154737A1 · Nobira · 2019 [cited by applicant]
US 20190204363A1 · Suzuki et al. · 2019 [cited by applicant]
US 20190369144A1 · Mauder et al. · 2019 [cited by applicant]
US 20200033384A1 · Kishi et al. · 2020 [cited by applicant]
US 20200064382A1 · Takata et al. · 2020 [cited by applicant]
US 20200191835A1 · Bilbao de Mendizabal et al. · 2020 [cited by applicant]
US 20210082789A1 · Briano et al. · 2021 [cited by applicant]
US 20210111284A1 · Vig et al. · 2021 [cited by applicant]
US 20210243911A1 · Tang et al. · 2021 [cited by applicant]
US 20210263077A1 · Hirano et al. · 2021 [cited by applicant]
US 20210397015A1 · Moon · 2021 [cited by applicant]
US 20220018880A1 · Houis · 2022 [cited by applicant]
US 20230058695A1 · Boden et al. · 2023 [cited by applicant]
US 20230060219A1 · Liu et al. · 2023 [cited by applicant]
EP 3671228 · 2020 [cited by applicant]
EP 4141451 · 2023 [cited by applicant]
FR 3090121 · 2020 [cited by applicant]
European Response filed on Jun. 14, 2023 for European Application No. 22183450.0; 24 pages. [cited by applicant]
U.S. Appl. No. 18/512,122, filed Nov. 17, 2023, McNally et al. [cited by applicant]
Response to European Rules 161/162 Communication dated Aug. 19, 2024 for European Application No. 22847650.3; Response Filed Feb. 18, 2025; 21 Pages. [cited by applicant]
U.S. Appl. No. 18/490,815, filed Oct. 20, 2023, Briano, et al. [cited by applicant]
Response to European Examination Report dated Aug. 28, 2023 for European Application No. 22183450.0 as filed on Oct. 30, 2023; 18 pages. [cited by applicant]
U.S. Non-Final Office Action dated Oct. 1, 2024 for U.S. Appl. No. 18/053,480; 17 Pages. [cited by applicant]
Response to U.S. Non-Final Office Action dated Oct. 1, 2024 for U.S. Appl. No. 18/053,480; Response filed Oct. 7, 2024; 9 Pages. [cited by applicant]
Notice of Allowance dated Oct. 23, 2024 for U.S. Appl. No. 18/053,480; 7 pages. [cited by applicant]
U.S. Appl. No. 17/657,135, filed Mar. 30, 2022, Liu, et al. [cited by applicant]
U.S. Appl. No. 17/817,796, filed Aug. 5, 2022, Briano, et al. [cited by applicant]
Steve Bush, DNP claims world's thinnest chip package, https://www.electronicsweekly.com/news/products/micros/ dnp-claims-worlds-thinnest-chip-package-2009-03/ (Year: 2009). [cited by applicant]
Preliminary Amendment filed Jan. 12, 2022 for U.S. Appl. No. 17/409,011; 6 pages. [cited by applicant]
U.S. Notice of Allowance dated Aug. 23, 2022 for U.S. Appl. No. 17/409,011; 10 pages. [cited by applicant]
European Extended Search Reporting dated Dec. 22, 2022 for European Application No. 22183450.0; 7 pages. [cited by applicant]
Office Action dated Mar. 15, 2023 for U.S. Appl. No. 17/654,254, 19 pages. [cited by applicant]
Response to Office Action dated Mar. 15, 2023 filed Mar. 22, 2023 for U.S. Appl. No. 17/654,254, 10 pages. [cited by applicant]
Office Action dated May 19, 2023 for U.S. Appl. No. 17/654,254; 15 pages. [cited by applicant]
Response to Office Action dated May 19, 2023 filed May 25, 2023 for U.S. Appl. No. 17/654,254; 15 pages. [cited by applicant]
Search Reporting and Written Opinion dated Apr. 25, 2023 for PCT Application No. PCT/US2022/051968; 16 pages. [cited by applicant]
Notice of Allowance dated Aug. 9, 2023 for U.S. Appl. No. 17/654,254; 5 pages. [cited by applicant]
European Examination Report dated Aug. 28, 2023 for European Application No. 22183450.0, 4 pages. [cited by applicant]
European Examination Report dated Apr. 24, 2025 for European Application No. 22183450.0; 4 Pages. [cited by applicant]
U.S. Appl. No. 18/624,271, filed Apr. 2, 2024, Wang et al. [cited by applicant]
Allegro MicroSystems, LLC, “Thermal Design for Plastic Integrated Circuits;” Package Information document; Mar. 3, 2016; 4 Pages. [cited by applicant]
Beeker, “PCB Design Techniques to Improved ESD Robustness;” AMF-DES-T2360; PowerPoint Presentation; Oct. 2016; 72 Pages. [cited by applicant]
Chen, “The Intricacies of Lead Frames in the Semiconductor Industry;” Article Published Sep. 2, 2023; 12 Pages. [cited by applicant]
Sauber et al., “Guidelines for Designing Subassemblies Using Hall-Effect Devices;” Allegro MicroSystems, LLC Product Information Data Sheet AN277031, Rev. 19; May 4, 2021; 10 Pages. [cited by applicant]