Granted Patent B2

US 12,298,301 · App. 18/457,155 · Granted May 13, 2025

Inventors: Brett R. Goldsmith (San Diego, CA); Mitchell Lerner (San Diego, CA); Paul Hoffman (San Diego, CA)

Assignee: Cardea Bio, Inc.

G01N33/5438G01N27/4146

Abstract

Claims (30)

1. An apparatus comprising:

a sensor chip fabricated on a semiconductor wafer, the sensor chip comprising:

a graphene channel patterned in a graphene layer disposed on a dielectric substrate;

a first electrode formed in electrode material so as to form one or more of an edge side contact or a top side contact in electrical contact with a first end of the graphene channel;

a second electrode formed in electrode material so as to form one or more of an edge side contact or a top-side contact in electrical contact with a second end of the graphene channel; and

an insulation layer that is layered above at least of portion of the graphene layer and is selected from an inorganic oxide layer and an organic layer.

2. The apparatus of claim 1 , wherein the dielectric substrate is composed of sapphire (Al 2 O 3 ).

3. The apparatus of claim 1 , wherein the dielectric substrate is composed of at least one of silicon (Si), silicon/silicon dioxide (Si/SiO 2 ), silicon dioxide (SiO 2 ), and a metal plate.

4. The apparatus of claim 1 , wherein the insulation layer comprises an oxide layer for charge trap screening, the oxide layer comprising an oxide selected from hexagonal boron nitride (hBN), aluminum oxide (Al 2 O 3 ), hafnium oxide (HfO 2 ), and tantalum oxide (Ta 2 O5).

5. The apparatus of claim 1 , wherein the insulation layer comprises two or more oxide layers, each oxide layer comprising an oxide selected from aluminum oxide (Al 2 O 3 ), a silicon dioxide (SiO 2 ), a hafnium dioxide (HfO 2 ), hafnium silicate (HfSiO 4 ), zirconium silicate (ZrSiO 4 ), zirconium dioxide (ZrO 2 ), lanthanum oxide (La 2 O 3 ), titanium oxide (TiO 2 ), tantalum oxide (Ta 2 O5), iron oxide (Fe 2 O 3 ), or yttrium oxide (Y 2 O 3 ).

6. The apparatus of claim 1 , wherein the insulation layer comprises an organic layer for charge trap screening, the organic layer comprising an organic material selected from a self-assembling monolayer (SAM) and a polyimide (PI).

7. The apparatus of claim 1 , wherein the insulation layer comprises an oxide layer that is an ion permeable structure positioned over at least a portion of the graphene channel to allow one or more ions of interest to pass through to the graphene channel.

8. The apparatus of claim 1 , further comprising a second insulation layer that acts as a passivation layer and is deposited above the insulation layer.

9. The apparatus of claim 8 , wherein the second insulation layer comprises one or more passivation materials selected from a silicon oxide, a silicon nitride, a metal oxide, and a metal nitride.

10. The apparatus of claim 8 , wherein the second insulation layer is patterned to form a passivation opening over the graphene channel.

11. A method for fabricated a sensor chip on a semiconductor wafer, the method comprising:

disposing a graphene layer on a surface of a dielectric substrate on the wafer;

patterning a graphene channel member in the graphene layer;

forming a first electrode in electrode material with one or more of an edge side contact or a top side contact in electrical contact with a first end of the graphene channel;

forming a second electrode in electrode material with one or more of an edge side contact or a top-side contact in electrical contact with a second end of the graphene channel; and

depositing an insulation layer above at least of portion of the graphene layer wherein the insulation layer is selected from an inorganic oxide layer and an organic layer.

12. The method of claim 11 , further comprising forming the dielectric substrate with sapphire (Al 2 O 3 ).

13. The method of claim 11 , further comprising forming the dielectric substrate with at least one of silicon (Si), silicon/silicon dioxide (Si/SiO 2 ), silicon dioxide (SiO 2 ), and a metal plate.

14. The method of claim 11 , further comprising forming the insulation layer with an oxide layer for charge trap screening, the oxide layer comprising an oxide selected from hexagonal boron nitride (hBN), aluminum oxide (Al 2 O 3 ), hafnium oxide (HfO 2 ), and tantalum oxide (Ta 2 O5).

15. The method of claim 11 , further comprising forming the insulation layer with two or more oxide layers, each oxide layer comprising an oxide selected from aluminum oxide (Al 2 O 3 ), a silicon dioxide (SiO 2 ), a hafnium dioxide (HfO 2 ), hafnium silicate (HfSiO 4 ), zirconium silicate (ZrSiO 4 ), zirconium dioxide (ZrO 2 ), lanthanum oxide (La 2 O 3 ), titanium oxide (TiO 2 ), tantalum oxide (Ta 2 O5), iron oxide (Fe 2 O 3 ), or yttrium oxide (Y 2 O 3 ).

16. The method of claim 11 , further comprising forming the insulation layer of an organic layer for charge trap screening, the organic layer comprising an organic material selected from a self-assembling monolayer (SAM) and a polyimide (PI).

17. The method of claim 11 , further comprising forming the insulation layer of an oxide layer that is an ion permeable structure positioned over at least a portion of the graphene channel to allow one or more ions of interest to pass through to the graphene channel.

18. The method of claim 11 , further comprising a second insulation layer that acts as a passivation layer and is deposited above the insulation layer.

19. The method of claim 18 , further comprising forming the second insulation of one or more passivation materials selected from a silicon oxide, a silicon nitride, a metal oxide, and a metal nitride.

20. The method of claim 18 , further comprising patterning the second insulation to form a passivation opening over the graphene channel.

Assignments (4)

Continuity (38)

References Cited (189)