IP Library › Granted Patent US 12,688,349
Granted Patent B2
US 12,688,349 · App. 18/482,703 · Granted Jul 21, 2026

Monitor circuit to determine integrated circuit condition based on diagnostic code sequence

Inventors: Anatoly Gelman (San Diego, CA); Michael James Smith (Vancouver, CA); James Cheng-Huan Wu (Vancouver, CA); Olivier Alavoine (San Diego, CA); Amit Aneja (Chandler, AZ)
Assignee: QUALCOMM INCORPORATED
G06F30/343G01R31/318566G06F1/3228G06F1/3296G06F11/27G06F30/327G06F2119/06G06F2119/12
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,688,349
App. No.
18/482,703
Filed
Oct 6, 2023
Granted
Jul 21, 2026
Kind
B2
Art Unit
2175
USPC
713/323
Abstract

Aspects relate to monitoring timing margin of logic paths and its degradation through an integrated circuit. In one example an apparatus includes an integrated circuit having a logic path formed in the integrated circuit and a monitor circuit formed in the integrated circuit. The monitor circuit is configured to monitor a condition of the logic path and to generate a diagnostic code sequence to indicate the condition of the logic path over time. A monitor controller is configured to receive diagnostic codes of the diagnostic code sequence, to store the diagnostic codes in a log with a corresponding time stamp and to determine a condition of the integrated circuit based on the diagnostic code sequence.

Claims (38)

1 . An apparatus comprising:

an integrated circuit having a logic path formed in the integrated circuit;

a monitor circuit formed in the integrated circuit, the monitor circuit being configured to monitor a condition of the logic path and to generate a diagnostic code sequence to indicate the condition of the logic path over time; and

a monitor controller configured to receive diagnostic codes of the diagnostic code sequence, to store the diagnostic codes in a log with a corresponding time stamp when a code of the diagnostic code sequence exceeds a marginality threshold and to determine a condition of the integrated circuit based on the diagnostic codes.

2 . The apparatus of claim 1 , wherein the monitor controller is configured to store the diagnostic codes in the log with one or more of timing margin code, time stamp, voltage, frequency, and a use case.

3 . The apparatus of claim 1 , comprising a second monitor circuit formed in the integrated circuit, the second monitor circuit being configured to generate a second diagnostic code to indicate the conditions of the logic path and wherein the monitor controller is configured to aggregate the first diagnostic code and the second diagnostic code.

4 . The apparatus of claim 1 , wherein the monitor controller is configured to generate a health signal in response to the diagnostic codes and to send the health signal to a higher layer.

5 . The apparatus of claim 4 , wherein the monitor controller is configured to compare the health signal to a health threshold and to send the health signal to the higher layer in response to the health signal crossing the health threshold.

6 . The apparatus of claim 5 , wherein the crossing the health threshold comprises detecting a lower timing margin.

7 . The apparatus of claim 1 , comprising:

the log to store the diagnostic codes; and

an external data port,

wherein the log is accessible through the external data port.

8 . The apparatus of claim 7 , wherein the monitor controller is coupled to an external safety management control unit through the external data port and wherein the monitor controller is configured to send the condition of the integrated circuit to the external safety management control unit through the external data port.

9 . The apparatus of claim 7 , wherein the monitor controller is configured to receive a shutdown, or reduced functionality command from the external safety management control unit.

10 . The apparatus of claim 7 , wherein the external safety management control unit comprises a functional safety system controller coupled to the log through the external data port, wherein the external safety management control unit is configured to analyze the diagnostic code sequence and to predict maintenance.

11 . The apparatus of claim 1 , wherein the monitor controller is configured to generate a user notification in response to the diagnostic code sequence.

12 . The apparatus of claim 11 , wherein the user notification is an interrupt.

13 . The apparatus of claim 11 , wherein the user notification is sent to an external display.

14 . The apparatus of claim 11 , wherein the user notification is sent through a radio interface to a maintenance facility.

15 . The apparatus of claim 1 , wherein the monitor controller is configured to determine an error condition of the integrated circuit and wherein the user notification indicates that a system associated with the IC is not operational.

16 . A method comprising:

monitoring a condition of a logic path formed in an integrated circuit at a monitor circuit formed in the integrated circuit near the logic path;

generating a diagnostic code sequence to indicate the condition of the logic path over time;

storing diagnostic codes of the diagnostic code sequence in a log with a corresponding time stamp when a code of the diagnostic code sequence exceeds a marginality threshold; and

determining a condition of the integrated circuit based on the diagnostic code sequence.

17 . The method of claim 16 , further comprising:

generating a health signal in response to the diagnostic codes;

comparing the health signal to a health threshold; and

sending the health signal to a higher layer in response to the health signal crossing the health threshold.

18 . A non-transitory computer-readable medium having instructions that when executed by the machine cause the machine to perform operations including:

monitoring a condition of a logic path formed in an integrated circuit at a monitor circuit formed in the integrated circuit near the logic path;

generating a diagnostic code sequence to indicate the condition of the logic path over time;

storing diagnostic codes of the diagnostic code sequence in a log with a corresponding time stamp when a code of the diagnostic code sequence exceeds a marginality threshold; and

determining a condition of the integrated circuit based on the diagnostic code sequence.

19 . The non-transitory computer-readable medium of claim 18 , the operations further comprising:

receiving a shutdown command in response to the condition of the logic path; and

initiating a complete shutdown of one or all systems of the IC.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2023
From: GELMAN, ANATOLY; SMITH, MICHAEL JAMES; WU, JAMES CHENG-HUAN; ALAVOINE, OLIVIER; ANEJA, AMIT
To: QUALCOMM INCORPORATED
Reel/Frame 065607/0282 →
Continuity (2)
Provisional Application 63514774 · Jul 20, 2023
Related Publication 20250027996A1 · Jan 23, 2025
References Cited (22)
US 5550841A · O'Brien · 1996 [cited by examiner]
US 5701409A · Gates · 1997 [cited by examiner]
US 8132136B2 · Bueti et al. · 2012 [cited by applicant]
US 8860502B2 · Gemmeke et al. · 2014 [cited by applicant]
US 11386252B1 · Chingudi · 2022 [cited by examiner]
US 12455996B2 · Gelman · 2025 [cited by examiner]
US 20040148111A1 · Gauthier et al. · 2004 [cited by applicant]
US 20100218026A1 · Toshimitsu · 2010 [cited by examiner]
US 20130088256A1 · Chlipala et al. · 2013 [cited by applicant]
US 20140167812A1 · Jain et al. · 2014 [cited by applicant]
US 20150039916A1 · Case · 2015 [cited by examiner]
US 20150042369A1 · Chen et al. · 2015 [cited by applicant]
US 20160188394A1 · Schumacher · 2016 [cited by examiner]
US 20170170815A1 · Stuijt · 2017 [cited by applicant]
US 20190286179A1 · Singh · 2019 [cited by examiner]
US 20200213452A1 · Ito · 2020 [cited by examiner]
US 20220006459A1 · Bautista Gabriel et al. · 2022 [cited by applicant]
US 20230214292A1 · Pandey · 2023 [cited by examiner]
US 20250028377A1 · Gelman et al. · 2025 [cited by applicant]
US 20250028890A1 · Gelman et al. · 2025 [cited by applicant]
PT 110840B · 2022 [cited by applicant]
International Search Report and Written Opinion—PCT/US2024/038775—ISA/EPO—Nov. 19, 2024. [cited by applicant]