Read parameter zoning

1 . An apparatus comprising:

one or more control circuits configured to connect to a memory structure having a plurality of physically contiguous regions, each region having a plurality of sets of memory cells, the one or more control circuits configured to:

assign each set of memory cells in a region of the memory structure to a zone of a plurality of zones based on a ranking of a target read level for each set of memory cells in the region; and

read each particular set of memory cells in the region using a representative read level for the zone into which the particular set of memory cells is assigned.

2 . The apparatus of claim 1 , wherein the one or more control circuits is further configured to:

form the zones to have substantially equal size voltage ranges in target read levels, wherein each zone of the plurality of zones covers a different range of target read levels; and

assign each particular set of memory cells in the region into one of the zones based on the target read level of the particular set of memory cells.

3 . The apparatus of claim 1 , wherein:

the memory structure comprises a plurality of blocks of memory cells;

each block comprises one of the plurality of physically contiguous regions;

each block has a plurality of word lines;

each set of memory cells in a particular block is connected to a different word line in the particular block; and

the ranking of the target read level for each set of memory cells in the region comprises a ranking of target read levels for the word lines in the particular block.

4 . The apparatus of claim 3 , wherein the target read level is a target read voltage and the one or more control circuits is further configured to:

divide a voltage range between a largest target read voltage and a smallest target read voltage into substantially equal sized non-overlapping voltage ranges; and

define each particular zone to correspond to one of the approximately equal sized non-overlapping voltage ranges.

5 . The apparatus of claim 3 , wherein the one or more control circuits is further configured to:

determine a read level offset for each word line in the particular block, the read level offset being a difference between a base read level and the target read level for the word line;

rank each word line in the particular block in accordance with the read level offset; and

assign each word line in the particular block to a zone of the plurality of zones in accordance with a low to high ranking of the read level offsets.

6 . The apparatus of claim 5 , wherein the one or more control circuits is further configured to:

calculate a total offset range as a difference between a largest read level offset and a smallest read level offset of the word lines in the particular block; and

divide the total offset range into the plurality of zones, each zone having approximately equal range of read level offsets.

7 . The apparatus of claim 3 , wherein the one or more control circuits are configured to assign the word lines to zones that contain non-consecutive word lines based on the ranking of read levels for the word lines.

8 . The apparatus of claim 1 , wherein the one or more control circuits is further configured to:

calculate the target read level for each set of memory cells in the region, wherein the region comprises a block of memory cells in the memory structure.

9 . The apparatus of claim 1 , wherein the one or more control circuits is further configured to:

select a number of zones for the plurality of zones;

calculate a voltage difference between a highest target read level and a lowest target read level for each set of memory cells in the region;

divide the voltage difference by the number of zones to result in a voltage size for each zone;

determine a unique read level range for each zone; and

assign each particular set of memory cells in the region into one of the zones in accordance with the unique read level range for each zone and the target read level for the particular set of memory cells.

10 . A method for operating a memory system, the method comprising:

calculating a separate read voltage offset for each word line of memory cells in a block of the memory system, the read voltage offset being an offset from a base read voltage;

ranking the word lines in order from low to high based on the read voltage offsets of the word lines;

forming zones that each contain word lines having a unique non-overlapping range of read voltage offsets;

assigning a representative read voltage offset for each zone, the representative read voltage offset for a particular zone being within the range of read voltage offsets for the particular zone; and

reading each particular word line in the block based on the representative read voltage offset for the zone containing the particular word line, including adding the representative read voltage offset for the zone containing the particular word line to the base read voltage.

11 . The method of claim 10 , wherein forming the zones that each contain word lines having a unique range of read voltage offsets includes:

forming at least one zone that contains a physically non-contiguous set of word lines.

12 . The method of claim 10 , wherein forming the zones that each contain word lines having a unique range of read voltage offsets includes:

forming zones that each have substantially the same voltage gap in their respective unique range of read voltage offsets.

13 . The method of claim 10 , wherein forming the zones that each contain word lines having a unique range of read voltage offsets includes:

dividing a total range of read voltage offsets for all word lines in the block approximately equally to each zone.

14 . The method of claim 10 , wherein forming the zones that each contain word lines having a unique range of read voltage offsets includes:

selecting a number of zones for the block; and

forming zones that each contain word lines to minimize a voltage gap in read voltage offsets in each zone given the number of zones.

15 . The method of claim 10 , wherein forming the zones that each contain word lines having a unique contiguous range of read voltage offsets includes:

selecting a number of zones to use for the block;

calculating a total read voltage offset range for the word lines in the block;

dividing the total read voltage offset range by the number of zones to arrive at a voltage gap per zone;

defining a lower read voltage offset and an upper read voltage offset for each zone based on the voltage gap per zone; and

assigning each particular word line into one of the zones based on the read voltage offset for the particular word line.

16 . A non-volatile storage system, comprising:

blocks having word lines and non-volatile memory cells connected to the word lines;

means for assigning each particular word line in a block into a zone of a plurality of zones in accordance with a ranking of read voltage offsets for the memory cells connected to the word lines; and

means for reading each particular word line in the block based on a representative read voltage offset for the zone into which the particular word line being read was assigned.

17 . The non-volatile storage system of claim 16 , wherein the means for assigning each particular word line in the block into a zone of a plurality of zones in accordance with a ranking of read voltage offsets for the memory cells connected to the word lines is configured to:

divide a voltage range between a largest read voltage offset and a smallest read voltage offset into substantially equal sized zones; and

assign each word line in the block in into one of the zones based on the read voltage offsets of the particular word line.

18 . The non-volatile storage system of claim 16 , wherein the means for assigning each particular word line in the block into a zone of a plurality of zones in accordance with a ranking of read voltage offsets for the memory cells connected to the word lines is configured to:

calculate a total read voltage offset range as a difference between a largest read voltage offset and a smallest read voltage offset of the word lines in the block;

divide the total read voltage offset range into the plurality of zones, each zone having approximately equal gap in read voltage offsets; and

assign each particular word line in the block into a zone of the plurality of zones based on the read voltage offsets of the particular word line.

19 . The non-volatile storage system of claim 16 , wherein the wherein the means for assigning each particular word line in the block into a zone of a plurality of zones in accordance with a ranking of read voltage offsets for the memory cells connected to the word lines is configured to:

select a number of zones;

calculate a difference between a highest read level offset and a lowest read level offset for the word lines in the block;

divide the difference by the number of zones to result in a read level offset gap;

determine a read voltage offset range for each zone; and

assign each particular word line in the block into one of the zones in accordance with a read voltage offset range for each zone and the read voltage offset for the particular word line.

20 . The non-volatile storage system of claim 16 , wherein the means for reading each particular word line in the block based on the representative read voltage offset for the zone into which the particular word line being read was assigned is configured to:

add the read voltage offset for the zone into which the particular word line being read was assigned to an optimal read voltage of a reference word line in the block.