IP Library › Granted Patent US 12,642,009
Granted Patent B2
US 12,642,009 · App. 18/606,515 · Granted May 26, 2026

Packaged current sensor integrated circuit with exposed cooling pad

Inventors: Emil Pavlov (Heidelberg, DE); Ahmad Nour Halawani (Heidelberg, DE); William P. Taylor (Amherst, NH)
Assignee: Allegro MicroSystems, LLC
H10N52/80G01R15/202G01R19/0092H10N59/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,642,009
App. No.
18/606,515
Granted
May 26, 2026
Kind
B2
Abstract

A current sensor integrated circuit package includes a primary conductor having an input portion into which a current flows and an output portion from which the current flows, a plurality of secondary leads, and a semiconductor die disposed adjacent to a top surface of the primary conductor and positioned on an insulator portion. In some embodiments, at least one magnetic field sensing element is supported by the semiconductor die. In some embodiments, the package includes a package body with a first portion enclosing the semiconductor die and a first portion of the primary conductor and a second portion enclosing an elongated portion of the plurality of secondary leads, wherein a second portion of the primary conductor is exposed. A pad is secured to the package body and a pillar extends from the primary conductor to the pad.

Claims (42)

1 . A current sensor integrated circuit package, comprising:

a primary conductor having an input portion into which a current flows and an output portion from which the current flows;

a plurality of secondary leads;

a semiconductor die disposed adjacent to a top surface of the primary conductor and positioned on an insulator portion;

at least one magnetic field sensing element supported by the semiconductor die;

a package body comprising an upper package body surface adjacent to the top surface of the primary conductor, a first portion enclosing the semiconductor die and a first portion of the primary conductor, and a second portion enclosing an elongated portion of the plurality of secondary leads, wherein a second portion of the primary conductor is exposed;

a pad secured to the upper package body surface of the package body, wherein a portion of the pad extends beyond a periphery of the package body, the second, exposed portion of the primary conductor comprises the input portion of the primary conductor and the output portion of the primary conductor, and the portion of the pad extends over either the input portion of the primary conductor or the output portion of the primary conductor; and

a pillar extending from the top surface of the primary conductor to the pad, wherein the pillar is disposed between the portion of the pad that extends beyond the periphery of the package body and the second, exposed portion of the primary conductor.

2 . The current sensor integrated circuit package of claim 1 , wherein the input portion has a reduced area edge and the output portion has a reduced area edge.

3 . The current sensor integrated circuit package of claim 1 , wherein the elongated portion of the plurality of secondary leads is offset with respect to an exposed portion of the respective secondary lead.

4 . The current sensor integrated circuit package of claim 1 , further comprising a non-conductive adhesive disposed between the pad and the package body.

5 . The current sensor integrated circuit package of claim 1 , wherein the pad is secured to the first portion of the package body, to the second portion of the package body, or to both the first portion of the package body and to the second portion of the package body.

6 . The current sensor integrated circuit package of claim 1 , wherein the pad is partially embedded in the package body.

7 . The current sensor integrated circuit package of claim 6 , wherein the pillar is disposed in the package body adjacent to the insulator portion.

8 . The current sensor integrated circuit package of claim 1 , wherein the pad comprises a nonferrous material.

9 . The current sensor integrated circuit package of claim 1 , wherein the pad comprises a ferrous material.

10 . The current sensor integrated circuit package of claim 1 , wherein the pillar comprises copper.

11 . The current sensor integrated circuit package of claim 1 , wherein the plurality of secondary leads comprises a first secondary lead providing an output connection of the current sensor integrated circuit package, a second secondary lead providing a voltage input connection of the current sensor integrated circuit package, and a third secondary lead providing a ground connection of the current sensor integrated circuit package.

12 . The current sensor integrated circuit package of claim 1 , further comprising a front-end amplifier supported by the semiconductor die, wherein the at least one magnetic field sensing element is coupled to the front-end amplifier.

13 . The current sensor integrated circuit package of claim 1 , comprising at least two magnetic field sensing elements.

14 . The current sensor integrated circuit package of claim 13 , wherein the at least two magnetic field sensing elements are Hall effect elements.

15 . The current sensor integrated circuit package of claim 14 , wherein the at least two magnetic field sensing elements are coupled to provide a differential output.

16 . The current sensor integrated circuit package of claim 1 , wherein at least one of the plurality of secondary leads provides a fault signal connection of the current sensor integrated circuit package.

17 . A current sensor integrated circuit package, comprising:

a primary conductor having an input portion into which a current flows and an output portion from which the current flows;

a plurality of secondary leads;

a semiconductor die disposed adjacent to a top surface of the primary conductor and positioned on an insulator portion;

at least one magnetic field sensing element supported by the semiconductor die;

a package body comprising an upper package body surface adjacent to the top surface of the primary conductor, a first portion enclosing the semiconductor die and a first portion of the primary conductor, and a second portion enclosing an elongated portion of the plurality of secondary leads, wherein a second portion of the primary conductor is exposed;

a pad secured to the upper package body surface of the package body, wherein the pad comprises one or more fins protruding from the pad; and

a pillar extending from the top surface of the primary conductor to the pad.

18 . A current sensor integrated circuit package, comprising:

a primary conductor having an input portion into which a current flows and an output portion from which the current flows;

a plurality of secondary leads;

a semiconductor die disposed adjacent to a top surface of the primary conductor and positioned on an insulator portion;

at least one magnetic field sensing element supported by the semiconductor die;

a package body comprising an upper package body surface adjacent to the top surface of the primary conductor, a first portion enclosing the semiconductor die and a first portion of the primary conductor, and a second portion enclosing an elongated portion of the plurality of secondary leads, wherein a second portion of the primary conductor is exposed;

a pad secured to the upper package body surface of the package body; and

a pillar extending from the top surface of the primary conductor to the pad, wherein the pillar is soldered or welded to the primary conductor.

19 . The current sensor integrated circuit package of claim 2 , wherein the reduced area edge of the input portion of the primary conductor does not extend beyond a first side edge of the package body and wherein the reduced area edge of the output portion of the primary conductor does not extend beyond a second side edge of the package body.

20 . The current sensor integrated circuit package of claim 18 , wherein a portion of the pad extends beyond a periphery of the package body.

21 . The current sensor integrated circuit package of claim 20 , wherein the second, exposed portion of the primary conductor comprises the input portion of the primary conductor and the output portion of the primary conductor and wherein the portion of the pad extends over either the input portion of the primary conductor or the output portion of the primary conductor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 18, 2024
From: PAVLOV, EMIL; HALAWANI, AHMAD NOUR; TAYLOR, WILLIAM P.; ALLEGRO MICROSYSTEMS GERMANY GMBH; ALLEGRO MICROSYSTEMS EUROPE LIMITED
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 066805/0106 →
Continuity (1)
Related Publication 20250295042A1 · Sep 18, 2025
References Cited (122)
US 5210493A · Schroeder et al. · 1993 [cited by applicant]
US 5255157A · Hegel · 1993 [cited by applicant]
US 5289344A · Gagnon et al. · 1994 [cited by applicant]
US 5557504A · Siegel et al. · 1996 [cited by applicant]
US 5570273A · Siegel et al. · 1996 [cited by applicant]
US 5963028A · Engel et al. · 1999 [cited by applicant]
US 6211462B1 · Carter, Jr. et al. · 2001 [cited by applicant]
US 6265865B1 · Engel et al. · 2001 [cited by applicant]
US 6326243B1 · Suzuya et al. · 2001 [cited by applicant]
US 6356068B1 · Steiner et al. · 2002 [cited by applicant]
US 6781359B2 · Stauth et al. · 2004 [cited by applicant]
US 6995315B2 · Sharma et al. · 2006 [cited by applicant]
US 7005754B2 · Howarth · 2006 [cited by applicant]
US 7075287B1 · Mangtani et al. · 2006 [cited by applicant]
US 7166807B2 · Gagnon et al. · 2007 [cited by applicant]
US 7265531B2 · Stauth et al. · 2007 [cited by applicant]
US 7372147B2 · Dai et al. · 2008 [cited by applicant]
US 7476816B2 · Doogue et al. · 2009 [cited by applicant]
US 7554180B2 · McKerreghan et al. · 2009 [cited by applicant]
US 7598601B2 · Taylor et al. · 2009 [cited by applicant]
US 7709754B2 · Doogue et al. · 2010 [cited by applicant]
US 7816905B2 · Doogue et al. · 2010 [cited by applicant]
US 8067824B2 · Kwon · 2011 [cited by examiner]
US 8080994B2 · Taylor et al. · 2011 [cited by applicant]
US 8093844B2 · Milesi et al. · 2012 [cited by applicant]
US 8461677B2 · Ararao et al. · 2013 [cited by applicant]
US 8486755B2 · Ararao et al. · 2013 [cited by applicant]
US 8604777B2 · Doogue et al. · 2013 [cited by applicant]
US 8629539B2 · Milano et al. · 2014 [cited by applicant]
US 8907437B2 · Milano et al. · 2014 [cited by applicant]
US 9190606B2 · Liu et al. · 2015 [cited by applicant]
US 9299915B2 · Milano et al. · 2016 [cited by applicant]
US 9383425B2 · Milano et al. · 2016 [cited by applicant]
US 9494660B2 · David et al. · 2016 [cited by applicant]
US 9620705B2 · Milano et al. · 2017 [cited by applicant]
US 9666788B2 · Taylor et al. · 2017 [cited by applicant]
US 9678173B2 · Castro Serrato · 2017 [cited by examiner]
US 9788403B2 · Mrusek · 2017 [cited by applicant]
US 9812588B2 · Vig et al. · 2017 [cited by applicant]
US 9865807B2 · Liu et al. · 2018 [cited by applicant]
US 10049969B1 · Liu · 2018 [cited by applicant]
US 10088533B2 · Rivas et al. · 2018 [cited by applicant]
US 10120041B2 · Haas et al. · 2018 [cited by applicant]
US 10132879B2 · Latham et al. · 2018 [cited by applicant]
US 10230006B2 · Vig et al. · 2019 [cited by applicant]
US 10234513B2 · Vig et al. · 2019 [cited by applicant]
US 10333055B2 · Milano et al. · 2019 [cited by applicant]
US 10345343B2 · Milano et al. · 2019 [cited by applicant]
US 10352969B2 · Milano et al. · 2019 [cited by applicant]
US 10509058B2 · Cadugan et al. · 2019 [cited by applicant]
US 10578684B2 · Cadugan et al. · 2020 [cited by applicant]
US 10607925B2 · David et al. · 2020 [cited by applicant]
US 10718794B2 · El Bacha et al. · 2020 [cited by applicant]
US 10725100B2 · Milano et al. · 2020 [cited by applicant]
US 10753963B2 · Milano et al. · 2020 [cited by applicant]
US 10916665B2 · Vig et al. · 2021 [cited by applicant]
US 11024576B1 · West et al. · 2021 [cited by applicant]
US 11085952B2 · Cadugan et al. · 2021 [cited by applicant]
US 11289406B2 · Briano et al. · 2022 [cited by applicant]
US 11444209B2 · Vig et al. · 2022 [cited by applicant]
US 11519946B1 · Rock et al. · 2022 [cited by applicant]
US 11768229B2 · Boden et al. · 2023 [cited by applicant]
US 11768230B1 · Liu et al. · 2023 [cited by applicant]
US 11810832B2 · Patel · 2023 [cited by examiner]
US 20020190703A1 · Goto et al. · 2002 [cited by applicant]
US 20030193018A1 · Tao et al. · 2003 [cited by applicant]
US 20040124505A1 · Mahle et al. · 2004 [cited by applicant]
US 20050030018A1 · Shibahara et al. · 2005 [cited by applicant]
US 20050124185A1 · Cromwell et al. · 2005 [cited by applicant]
US 20070126092A1 · San Antonio et al. · 2007 [cited by applicant]
US 20070279053A1 · Taylor et al. · 2007 [cited by applicant]
US 20100156394A1 · Ausserlechner et al. · 2010 [cited by applicant]
US 20110049685A1 · Park et al. · 2011 [cited by applicant]
US 20110234215A1 · Ausserlechner · 2011 [cited by applicant]
US 20110248711A1 · Ausserlechner · 2011 [cited by applicant]
US 20120089266A1 · Tomimbang et al. · 2012 [cited by applicant]
US 20130138372A1 · Ausserlechner · 2013 [cited by applicant]
US 20140253103A1 · Racz et al. · 2014 [cited by applicant]
US 20150108967A1 · Barczyk · 2015 [cited by applicant]
US 20150270198A1 · Cuoco et al. · 2015 [cited by applicant]
US 20160187388A1 · Suzuki et al. · 2016 [cited by applicant]
US 20160216296A1 · Nakayama et al. · 2016 [cited by applicant]
US 20160223594A1 · Suzuki et al. · 2016 [cited by applicant]
US 20160313375A1 · Etschmaier · 2016 [cited by applicant]
US 20170179067A1 · Aoki et al. · 2017 [cited by applicant]
US 20180166350A1 · Racz et al. · 2018 [cited by applicant]
US 20180306843A1 · Bussing et al. · 2018 [cited by applicant]
US 20190049527A1 · Vig et al. · 2019 [cited by applicant]
US 20190154737A1 · Nobira · 2019 [cited by applicant]
US 20190204363A1 · Suzuki et al. · 2019 [cited by applicant]
US 20190369144A1 · Mauder et al. · 2019 [cited by applicant]
US 20200033384A1 · Kishi et al. · 2020 [cited by applicant]
US 20200064382A1 · Takata et al. · 2020 [cited by applicant]
US 20200191835A1 · Bilbao de Mendizabal et al. · 2020 [cited by applicant]
US 20210243911A1 · Tang et al. · 2021 [cited by applicant]
US 20210263077A1 · Hirano et al. · 2021 [cited by applicant]
US 20210397015A1 · Moon · 2021 [cited by applicant]
US 20220018880A1 · Houis · 2022 [cited by applicant]
US 20230060219A1 · Liu et al. · 2023 [cited by applicant]
US 20230221355A1 · Liu · 2023 [cited by applicant]
US 20240044946A1 · Briano et al. · 2024 [cited by applicant]
US 20240047314A1 · Briano et al. · 2024 [cited by applicant]
US 20250275485A1 · Lo · 2025 [cited by examiner]
EP 3671228 · 2020 [cited by applicant]
EP 4141451 · 2023 [cited by applicant]
FR 3090121 · 2020 [cited by applicant]
U.S. Appl. No. 18/447,665, filed Aug. 10, 2023, Kasparek. [cited by applicant]
U.S. Appl. No. 18/450,494, filed Aug. 16, 2023, Hein et al. [cited by applicant]
U.S. Appl. No. 18/512,122, filed Nov. 17, 2023, McNally et al. [cited by applicant]
Preliminary Amendment filed on Jan. 12, 2022 for U.S. Appl. No. 17/409,011; 6 pages. [cited by applicant]
European Examination Report dated Aug. 28, 2023 for European Application No. 22183450.0; 4 pages. [cited by applicant]
European Extended Search Reporting dated Dec. 22, 2022 for European Application No. 22183450.0; 7 pages. [cited by applicant]
European Response filed on Jun. 14, 2023 for European Application No. 22183450.0; 24 pages. [cited by applicant]
Notice of Allowance dated Aug. 23, 2022 for U.S. Appl. No. 17/409,011; 13 pages. [cited by applicant]
Notice of Allowance dated Aug. 9, 2023 for U.S. Appl. No. 17/654,254; 5 pages. [cited by applicant]
Office Action dated Mar. 15, 2023 for U.S. Appl. No. 17/654,254; 19 pages. [cited by applicant]
Response to Office Action dated Mar. 15, 2023 filed on Mar. 22, 2023 for U.S. Appl. No. 17/654,254; 10 pages. [cited by applicant]
Office Action dated May 19, 2023 for U.S. Appl. No. 17/654,254; 15 pages. [cited by applicant]
Response to European Examination Report dated Aug. 28, 2023 for European Application No. 22183450.0 as filed on Oct. 30, 2023; 18 pages. [cited by applicant]
Response to Office Action dated May 19, 2023, filed on May 25, 2023 for U.S. Appl. No. 17/654,254; 9 pages. [cited by applicant]
Search Reporting and Written Opinion dated Apr. 25, 2023, for PCT Application No. PCT/US2022/051968; 16 pages. [cited by applicant]
Steve Bush, “DNP claims world's thinnest chip package”; https://www.electronicsweekly.com/news/products/micros/dnp-claims-worlds-thinnest-chip-package-2009-03/; Mar. 2009; 4 pages. [cited by applicant]