IP Library › Granted Patent US 12,704,527
Granted Patent B2
US 12,704,527 · App. 18/710,173 · Granted Aug 11, 2026

Inspection device using electrically conductive contact pin

Inventors: Bum Mo Ahn (Gyeonggi-do, KR); Seung Ho Park (Gyeonggi-do, KR); Chang Hee Hong (Gyeonggi-do, KR)
Assignee: POINT ENGINEERING CO., LTD.
G01R1/06716G01R1/06733G01R1/06761
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,704,527
App. No.
18/710,173
Filed
May 14, 2024
Granted
Aug 11, 2026
Kind
B2
Art Unit
2847
USPC
174/267
Abstract

An electrically conductive contact pin includes a first connection portion, a second connection portion, a pair of support portions, a first elastic portion, and a second elastic portion, and is characterized in that a first connection portion contacts the pair of support portions to form a current path when a first elastic portion is compressed, and the second connection portion contacts the pair of support portions to form a current path when the second elastic portion is compressed. An inspection device comprises an installation member having a through hole for receiving the electrically conductive contact pin.

Claims (32)

1 . An electrically conductive contact pin, comprising:

a first connection portion;

a second connection portion;

a pair of support portions extending in a length direction;

a boundary portion extending in a width direction and having opposite sides connected to the pair of support portions;

a first elastic portion connecting the first connection portion and the boundary portion to each other; and

a second elastic portion connecting the second connection portion and the boundary portion to each other,

wherein the first connection portion is brought into contact with the pair of support portions to form a current path as the first elastic portion is compressed, and

the second connection portion is brought into contact with the pair of support portions to form a current path as the second elastic portion is compressed.

2 . The electrically conductive contact pin of claim 1 , wherein the second connection portion comprises a pair of flanges located inside the support portions,

wherein the flanges are brought into contact with inner sides of the support portions as the second elastic portion is compressed.

3 . The electrically conductive contact pin of claim 1 , wherein the first connection portion comprises:

a base portion connected to the first elastic portion; and

at least two protruding portions extending from the base portion.

4 . The electrically conductive contact pin of claim 3 , wherein the first connection portion further comprises a groove provided between the at least two protruding portions.

5 . The electrically conductive contact pin of claim 1 , wherein the first elastic portion comprises:

a first-first elastic portion having a first end connected to the first connection portion and a second end connected to the boundary portion; and

a first-second elastic portion disposed to be spaced apart from the first-first elastic portion and having a first end connected to the first connection portion and a second end connected to the boundary portion.

6 . The electrically conductive contact pin of claim 5 , wherein the first-first elastic portion and the first-second elastic portion have symmetrical shapes in left and right directions.

7 . The electrically conductive contact pin of claim 1 , wherein each of the support portions comprises:

a first locking portion provided at a first end thereof; and

a second locking portion provided at a second end thereof.

8 . The electrically conductive contact pin of claim 1 , wherein the electrically conductive contact pin is formed by stacking a plurality of metal layers in a thickness direction of the electrically conductive contact pin.

9 . The electrically conductive contact pin of claim 1 , further comprising:

a plurality of fine trenches provided in a side surface thereof.

10 . An inspection device, comprising:

an electrically conductive contact pin comprising a first connection portion, a second connection portion, a pair of support portions extending in a length direction, a boundary portion extending in a width direction and having opposite sides connected to the pair of support portions, a first elastic portion connecting the first connection portion and the boundary portion to each other, and a second elastic portion connecting the second connection portion and the boundary portion to each other, wherein the first connection portion is brought into contact with the pair of support portions to form a current path as the first elastic portion is compressed, and the second connection portion is brought into contact with the pair of support portions to form a current path as the second elastic portion is compressed; and

an installation member having a through-hole receiving the electrically conductive contact pin.

11 . The inspection device of claim 10 , wherein each of the support portions is formed to have a longer length than the through-hole, so that at least a portion of each of the support portions protrudes out of the through-hole.

12 . The inspection device of claim 10 , wherein each of the support portions comprises:

a first locking portion provided at a first end thereof; and

a second locking portion provided at a second end thereof.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2024
From: AHN, BUM MO; PARK, SEUNG HO; HONG, CHANG HEE
To: POINT ENGINEERING CO., LTD.
Reel/Frame 067441/0538 →
Priority Claims (1)
KR 10-2021-0158767 · Nov 17, 2021 · national
Continuity (1)
Related Publication 20250035670A1 · Jan 30, 2025
References Cited (52)
US 4773877A · Kruger · 1988 [cited by examiner]
US 5667410A · Johnston · 1997 [cited by examiner]
US 6083059A · Kuan · 2000 [cited by examiner]
US 6358097B1 · Peters · 2002 [cited by examiner]
US 6471524B1 · Nakano · 2002 [cited by examiner]
US 6626708B2 · Phillips · 2003 [cited by examiner]
US 10044127B2 · Hachuda · 2018 [cited by examiner]
US 12546812B2 · Ahn · 2026 [cited by examiner]
US 20020048973A1 · Zhou · 2002 [cited by examiner]
US 20020142669A1 · Phillips · 2002 [cited by examiner]
US 20050110505A1 · Stanley Tsui · 2005 [cited by examiner]
US 20100285698A1 · Lee · 2010 [cited by examiner]
US 20150192617A1 · Liu et al. · 2015 [cited by applicant]
US 20170244189A1 · Foong et al. · 2017 [cited by applicant]
US 20190242926A1 · Sasano · 2019 [cited by examiner]
US 20200158753A1 · Teranishi · 2020 [cited by examiner]
US 20210148950A1 · Hwang et al. · 2021 [cited by applicant]
US 20230358785A1 · Veeramani · 2023 [cited by examiner]
US 20240118335A1 · Ahn · 2024 [cited by examiner]
US 20240159795A1 · Ahn · 2024 [cited by examiner]
US 20240426871A1 · Ahn · 2024 [cited by examiner]
US 20240426872A1 · Ahn · 2024 [cited by examiner]
US 20250020690A1 · Ahn · 2025 [cited by examiner]
US 20250035670A1 · Ahn · 2025 [cited by examiner]
US 20250180603A1 · Ahn · 2025 [cited by examiner]
US 20250199032A1 · Ahn · 2025 [cited by examiner]
US 20250306089A1 · Ahn · 2025 [cited by examiner]
US 20250357694A1 · Ahn · 2025 [cited by examiner]
US 20250389753A1 · Ahn · 2025 [cited by examiner]
US 20260056232A1 · Ahn · 2026 [cited by examiner]
CN 101911273 · 2010 [cited by applicant]
CN 111610353 · 2020 [cited by applicant]
JP 2010532908 · 2010 [cited by applicant]
JP 2017036959 · 2017 [cited by applicant]
KR 100659944 · 2006 [cited by applicant]
KR 1020080112696 · 2008 [cited by applicant]
KR 100952712 · 2010 [cited by applicant]
KR 20170036511 · 2017 [cited by applicant]
KR 101799309 · 2017 [cited by applicant]
KR 101860519 · 2018 [cited by applicant]
KR 20180095315 · 2018 [cited by applicant]
KR 1020200104061 · 2020 [cited by applicant]
KR 102166677 · 2020 [cited by applicant]
KR 102166677B1 · 2020 [cited by examiner]
KR 102197313 · 2020 [cited by applicant]
WO 2018162343 · 2018 [cited by applicant]
Original and Translation of JP2017130421 (Year: 2017). [cited by examiner]
Original and Translation of TW200821584 (Year: 2008). [cited by examiner]
Original and Translation of JP-WO2019138507 (Year: 2019). [cited by examiner]
“International Search Report (Form PCT/ISA/210) of PCT/KR2022/017464”, mailed on Feb. 8, 2023, with English translation thereof, pp. 1-4. [cited by applicant]
“Office Action of Korea Counterpart Application”, issued on Jun. 12, 2024, with English translation thereof, p. 1-p. 6. [cited by applicant]
“Notification of Review Opinions of Taiwan Counterpart Application, Application No. 111143389”, issued on Jan. 21, 2026, with English translation thereof, p. 1-p. 12. [cited by applicant]