IP Library Granted Patent US 12,584,861
Granted Patent B2
US 12,584,861 · App. 18/722,108 · Granted Mar 24, 2026

Continuous emissions monitor for directed-energy borehole drilling

Inventor: Paul P. Woskov (Bedford, MA)
Assignee: Massachusetts Institute of Technology
G01N21/66E21B7/15E21B49/005G01N21/31
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Quick Facts
Patent No.
US 12,584,861
App. No.
18/722,108
Granted
Mar 24, 2026
Kind
B2
Abstract

Apparatus and methods for monitoring emissions from a borehole to determine the composition of earthen material removed from the borehole are described. Monitoring can be done in real time as the borehole is being deepened with a millimeter-wave drilling beam. The present technology can monitor in real-time the elemental composition of the earthen materials (e.g., rock, minerals, crystals, metals, etc.) in a borehole created by a directed-energy beam that melts and vaporizes the earthen material materials in its path. Using a continuous emissions monitor (CEM) in combination with directed-energy excavation of a borehole enables rapid surveying of the subsurface for precious and commercial metals.

Claims (55)

1 . A method of monitoring emissions from a borehole drilled with a millimeter-wave directed-energy drilling beam, the method comprising:

receiving, in a plasma chamber, exhaust gas created by vaporizing earthen material with the millimeter-wave directed-energy drilling beam;

in the plasma chamber, heating the exhaust gas with electromagnetic radiation to produce a plasma and optical emissions from the plasma;

making a spectroscopic measurement of the optical emissions with a spectrometer; and

determining a composition of the exhaust gas based on the spectroscopic measurement of the optical emissions.

2 . The method of claim 1 , further comprising:

receiving, in the plasma chamber, a portion of millimeter-wave radiation used to make the millimeter-wave directed-energy drilling beam; and

focusing the portion of millimeter-wave radiation to provide the electromagnetic radiation that produces the plasma.

3 . The method of claim 2 , further comprising:

picking off the portion of the millimeter-wave radiation returned from a reflection of the millimeter-wave directed-energy drilling beam from a bottom of the borehole.

4 . The method of claim 1 , further comprising calibrating the spectrometer.

5 . The method of claim 4 , wherein calibrating the spectrometer comprises:

introducing an aerosol from a calibration source into the plasma chamber, wherein the aerosol supplies a known amount of an element from the calibration source to the plasma;

measuring optical emission levels from the plasma while the aerosol is present in the plasma, the optical emission levels indicating an amount of the element; and

determining, from the optical emission levels, an amount of the element in the exhaust gas.

6 . The method of claim 1 , wherein receiving the exhaust gas created by vaporizing earthen material comprises receiving particulates from the borehole into a sample tube connected to the plasma chamber with a gas flow.

7 . A system for monitoring the composition of earthen material in a borehole created by a millimeter-wave directed-energy drilling beam, the system comprising:

a plasma chamber to receive exhaust gas from the borehole and to receive a portion of millimeter-wave radiation that is used to make the millimeter-wave directed-energy drilling beam, wherein the plasma chamber is configured to heat the exhaust gas with the portion of the millimeter-wave radiation to create a plasma emitting optical emissions; and

a spectrometer, in electromagnetic communication with the plasma chamber, to measure a spectrum of the optical emissions from the plasma, the spectrum indicating the composition of the earthen material in the borehole.

8 . The system of claim 7 , further comprising:

a sample tube or sample port connected to the plasma chamber to receive the exhaust gas from the borehole; and

an exhaust tube or exhaust port connected to the plasma chamber to exhaust at least the exhaust gas from the plasma chamber.

9 . The system of claim 8 , wherein the sample tube or sample port is made of a material to withstand temperatures of at least 800° C.

10 . The system of claim 7 , wherein the spectrometer is a grating spectrometer configured to monitor, with a spectral resolution of 0.02 nm or finer, at least one band with a bandwidth of 20 nm and a center wavelength in a range from 200 nm to 800 nm.

11 . The system of claim 7 , further comprising:

a mirror, disposed in the plasma chamber, to focus the portion of the millimeter-wave radiation to a spot; and

a sample tube, extending into the plasma chamber, to discharge the exhaust gas from the borehole into the plasma chamber near the spot.

12 . The system of claim 11 , further comprising:

a fiber optic cable connected to the plasma chamber and arranged to receive the optical emissions from the spot and guide the optical emissions to the spectrometer.

13 . The system of claim 7 , further comprising:

a calibration source, in fluid communication with the plasma chamber, to provide an aerosol for calibration of the spectrometer to the plasma chamber.

14 . The system of claim 7 , further comprising:

a reflected power isolator, in electromagnetic communication with the plasma chamber, to couple the portion of the millimeter-wave radiation out of a transmission line that guides the millimeter-wave radiation to a bottom of the borehole to form the millimeter-wave directed-energy drilling beam.

15 . A system for drilling a borehole and monitoring emissions from the borehole, the system comprising:

a high-power millimeter-wave (MMW) source;

a waveguide to carry MMW radiation from the MMW source to the borehole;

exhaust piping to seal the borehole and capture exhaust gas from the borehole while the borehole is being deepened with a MMW drilling beam formed from the MMW radiation;

a plasma chamber in fluid communication with the exhaust piping to receive an exhaust slip stream picked off from the exhaust gas;

a spectrometer in electromagnetic communication with the plasma chamber to detect emissions from a plasma formed in the plasma chamber from the exhaust slip stream; and

a reflected power isolator, in electromagnetic communication with the plasma chamber, to couple a portion of the MMW radiation produced by the MMW source to the plasma chamber.

16 . The system of claim 15 , further comprising:

a mirror, disposed in the plasma chamber, to focus the portion of the MMW radiation to a spot inside the plasma chamber; and

a sample tube, extending into the plasma chamber, to discharge the exhaust slip stream into the plasma chamber near the spot.

17 . The system of claim 16 , further comprising:

a fiber optic cable connected to the plasma chamber and arranged to receive optical emissions from the spot and guide the optical emissions to the spectrometer.

18 . The system of claim 15 , wherein the spectrometer is a grating spectrometer configured to monitor, with a spectral resolution of 0.02 nm or finer, at least one band with a bandwidth of 20 nm and a center wavelength in a range from 200 nm to 800 nm.

19 . The system of claim 15 , further comprising:

a calibration source, in fluid communication with the plasma chamber, to provide an aerosol for calibration of the spectrometer to the plasma chamber.

20 . A system for drilling a borehole and monitoring emissions from the borehole, the system comprising:

a high-power millimeter-wave (MMW) source;

a waveguide to carry MMW radiation from the MMW source to the borehole;

exhaust piping to seal the borehole and capture exhaust gas from the borehole while the borehole is being deepened with a MMW drilling beam formed from the MMW radiation;

a plasma chamber in fluid communication with the exhaust piping to receive an exhaust slip stream picked off from the exhaust gas;

a spectrometer in electromagnetic communication with the plasma chamber to detect emissions from a plasma formed in the plasma chamber from the exhaust slip stream; and

a calibration source, in fluid communication with the plasma chamber, to provide an aerosol for calibration of the spectrometer to the plasma chamber.

Assignments (2)
CONFIRMATORY LICENSE Recorded Aug 15, 2025
From: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
To: U.S. DEPARTMENT OF ENERGY
Reel/Frame 072474/0307 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 27, 2024
From: WOSKOV, PAUL P.
To: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Reel/Frame 067860/0918 →
Continuity (2)
Provisional Application 63291744 · Dec 20, 2021
Related Publication 20250060314A1 · Feb 20, 2025
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