Extruded aluminum wire
Disclosed is an extruded aluminum wire including: Fe, Cu, Ti, Mn, Mg, Cr, B, Ga, V and Zn in the total content of 0.01% by mass or less, and one or more components selected from the group consisting of Ni, Y and Si, with the balance being Al and inevitable impurities, wherein, in a cross-section perpendicular to the longitudinal direction of the extruded wire, an average grain size measured by electron backscatter diffraction is 15 to 50 μm, respectively, in both a central measurement region including a center point of the cross-section and a peripheral measurement region in contact with the outer periphery of the cross-section.
1 . An extruded aluminum wire comprising:
Fe, Cu, Ti, Mn, Mg, Cr, B, Ga, V and Zn, wherein a total content of 0.01% by mass or less, and
one or more components selected from the group consisting of Ni, Y and Si, with the balance being Al and inevitable impurities,
wherein, in a cross-section perpendicular to the longitudinal direction of the extruded wire, an average grain size measured by electron backscatter diffraction is 15 to 50 μm, respectively, in both a central measurement region including a center point of the cross-section and a peripheral measurement region in contact with the outer periphery of the cross-section,
wherein the central measurement region is a rectangular region positioned so that an intersection of diagonals of the central measurement region overlaps with the center point of the cross-section, for the extruded aluminum wire having a diameter of 1.6 mm or less, the central measurement region is a rectangular region of 0.23 mm×0.31 mm, for the extruded aluminum wire having the diameter of more than 1.6 mm, the central measurement region is a rectangular region of 0.46 mm×0.61 mm; and
wherein the peripheral measurement region is a rectangular region positioned so that each end of one of two opposing long sides of the peripheral measurement region are in contact with the outer periphery of the cross-section, for the extruded aluminum wire having the diameter of 1.6 mm or less, the peripheral measurement region is a rectangular region of 0.23 mm×0.31 mm; for the extruded aluminum wire having the diameter of more than 1.6 mm, the peripheral measurement region is a rectangular region of 0.46 mm×0.61 mm.
2 . The extruded aluminum wire according to claim 1 , which satisfies the following formula (1):
❘
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Dp
-
Dc
❘
"\[RightBracketingBar]"
≤
20
(
μm
)
(
1
)
Wherein,
Dc is an average grain size (μm) in the central measurement region of the cross-section, and
Dp is an average grain size (μm) in the peripheral measurement region of the cross-section.
3 . The extruded aluminum wire according to claim 1 , wherein an area ratio of a region where kernel average misorientation within grains is 0.2° or more is 15 to 30%, respectively, in both the central measurement region and the peripheral measurement region.
4 . The extruded aluminum wire according to claim 1 , which satisfies the following formula (2):
❘
"\[LeftBracketingBar]"
Rc
-
Rp
❘
"\[RightBracketingBar]"
≤
5
(
%
)
(
2
)
Wherein,
Rc is an area ratio (%) of a region where kernel average misorientation in the central measurement region of the cross-section is 0.2° or more, and
Rp is an area ratio (%) of a region where kernel average misorientation in the peripheral measurement region of the cross-section is 0.2° or more.
5 . The extruded aluminum wire according to claim 1 , which satisfies the following formula (3):
❘
"\[LeftBracketingBar]"
STD
1
-
STD
2
❘
"\[RightBracketingBar]"
≤
0.
0
2
(
3
)
Wherein,
STD1 is a standard deviation of a measured value (°) of kernel average misorientation in the central measurement region of the cross-section, and
STD2 is a standard deviation of a measured value (°) of kernel average misorientation in the peripheral measurement region of the cross-section,
when the kernel average misorientation within grains in the cross-section is measured by electron backscatter diffraction.
6 . The extruded aluminum wire according to claim 1 , wherein the total content of one or more components selected from the group consisting of Ni, Y and Si is 10 to 2000 ppm by mass.
7 . The extruded aluminum wire according to claim 1 , which has a diameter of 1 to 10 mm.
8 . A semiconductor device comprising the extruded aluminum wire according to claim 1 .
9 . A semiconductor stabilizing material comprising the extruded aluminum wire according to claim 1 .