IP Library Patent Application 60811673
Patent Application Provisional Small
App. No. 60/811,673 · Confirmation No. 4755

Method and apparatus for single wafer stand-in tester

Inventor: Morgan T. Johnson
Provisional Application Expired
⬇ PDF
Code Description Pages PDF
2006-06-06 TRNA Transmittal of New Application 2 View
2006-06-06 SPEC Specification 6 View
2006-06-06 ABST Abstract 1 View
2006-06-06 DRW Drawings-only black and white line drawings 5 View
2006-06-06 WFEE Fee Worksheet (SB06) 1 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
App. No.
60/811,673
Filed
2006-06-06