Patent Application
Provisional
App. No. 62/215,895
· Confirmation No. 1029
Approaches in First Order Scatterometry Overlay Based on Introduction of Auxiliary EM Fields
Provisional Application Expired
Inventors
Vladimir Levinski
Migdal HaEmek, ISRAEL
Yuri Paskover
Caesarea, ISRAEL
Yuval Lubashevsky
Migdal HaEmek, ISRAEL
Amnon Manassen
Haifa, ISRAEL
Attorneys & Agents of Record
Prosecution
- Customer No.
- 23584
- Docket No.
- P4780
- Confirmation No.
- 1029
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2017-02-07
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Quick Facts
- App. No.
- 62/215,895
- Filed
- 2015-09-09
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