IP Library › Granted Patent US 6,888,632
Granted Patent B2
US 6,888,632 · App. 10/376,750 · Granted May 3, 2005

Modulated scatterometry

Assignee: Therma-Wave, Inc.
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Quick Facts
Patent No.
US 6,888,632
App. No.
10/376,750
Granted
May 3, 2005
Kind
B2
Abstract

An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subjected to a scatterometry analysis in order to evaluate geometrical sample features that induce light scattering.

Claims (17)

1. An apparatus for evaluating a sample have light diffracting features comprising:

an intensity modulated energy source for periodically exciting the sample;

a probe beam directed to reflect off the sample in the region which has been periodically excited;

a detector for monitoring the probe beam after interaction with the sample and generating output signals; and

a processor for filtering the output signals to determine the modulated optical scattering of the light and wherein the modulated optical scattering response is analyzed according to a scatterometry analysis to evaluate the light diffracting features on the sample.

2. An apparatus as recited in claim 1 wherein said probe beam is polychromatic and detector generates output signals as a function of wavelength.

3. An apparatus as recited in claim 2 wherein the detector and processor operate as a reflectometer.

4. An apparatus as recited in claim 2 further including an analyzer and wherein the processor determines the change in polarization state of the probe beam.

5. A method for evaluating a sample have light diffracting features comprising the steps of:

periodically exciting a region on the sample;

directing a probe beam of radiation to reflect off a portion of the region which has been periodically excited;

monitoring the probe beam after interaction with the sample and generating output signals; and

filtering the output signals to determine the modulated optical scattering of the light and wherein the modulated optical scattering response is analyzed according to a scatterometry analysis to evaluate the light diffracting features on the sample.

6. A method as recited in claim 5 wherein said probe beam is polychromatic and the output signals are generated as a function of wavelength.

7. A method as recited in claim 6 wherein the monitoring and filtering step measure the modulated changes in the intensity of the probe beam.

8. A method as recited in claim 6 wherein the monitoring and filtering step determines the modulated changes in polarization state of the probe beam.

9. A method as recited in claim 5 further including the step monitoring the probe beam after interaction with the sample during a period when the sample is not being periodically excited and using the results to further evaluate the sample.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2003
From: SMITH, WALTER LEE
To: THERMA-WAVE, INC.
Reel/Frame 014088/0567 →
Continuity (1)
Related Publication 20040169859A1 · Sep 2, 2004