IP Library › Granted Patent US 6,909,148
Granted Patent B2
US 6,909,148 · App. 10/647,539 · Granted Jun 21, 2005

Semiconductor thin film and its manufacturing method and semiconductor device and its manufacturing method

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 6,909,148
App. No.
10/647,539
Granted
Jun 21, 2005
Kind
B2
Abstract

A semiconductor thin film is formed having a lateral growth region which is a collection of columnar or needle-like crystals extending generally parallel with a substrate. The semiconductor thin film is illuminated with laser light or strong light having equivalent energy. As a result, adjacent columnar or needle-like crystals are joined together to form a region having substantially no grain boundaries, i.e., a monodomain region which can substantially be regarded as a single crystal. A semiconductor device is formed by using the monodomain region as an active layer.

Claims (20)

1. A semiconductor device having at least a static random access memory, the static random access memory comprising:

a word line over a substrate;

a bit line intersecting perpendicularly to the word line, over the substrate; and

at least a first thin film transistor and a second thin film transistor over the substrate;

wherein a gate electrode of the first thin film transistor is connected to a source or drain region of the second thin film transistor,

wherein a gate electrode of the second thin film transistor is connected to a source or drain region of the first thin film transistor, and electrically connected to the bit line,

each of the first and second thin film transistors comprising:

a crystalline semiconductor film comprising silicon on an insulating film,

wherein the insulating film has at least one asperity of less than 30 Å in height on the upper surface thereof.

2. A semiconductor device having at least a static random access memory according to claim 1 , wherein the static random access memory further comprising:

a first resistor connected to a source or drain region of the first thin film transistor;

a second resistor connected to a source or drain region of the second thin film transistor.

3. A semiconductor device having at least a static random access memory according to claim 1 , wherein the static random access memory further comprising:

a third thin film transistor provided between a source or drain region of the first thin film transistor and the bit line; and

a fourth thin film transistor provided between a source or drain region of the second thin film transistor and the word line,

wherein gate electrodes of the third and fourth thin film transistor are connected to the word line.

4. A semiconductor device having at least a static random access memory according to claim 1 , wherein the insulating film comprises silicon oxide.

5. A semiconductor device having at least a static random access memory according to claim 1 , wherein the asperity has a width more than 100 Å.

6. A static random access memory according to claim 1 , wherein crystals of the crystalline semiconductor film extend in parallel with the substrate.

7. An electronic appliance comprising the semiconductor device having at least a static random access memory according to claim 1 , wherein the electronic appliance is selected from the group consisting of a TV camera, a head-mount display, a car navigation, a projection display, a video camera, a personal computer, and a cellular telephone.

Priority Claims (2)
JP 8-61891 · Feb 23, 1996 · national
JP 8-61892 · Feb 23, 1996 · national
Continuity (4)
Division 1007714100 · Feb 15, 2002
Division 0940994900 · Sep 30, 1999
Continuation 0880369300 · Feb 24, 1997
Related Publication 20040065885A1 · Apr 8, 2004