IP Library Granted Patent US 7,067,413
Granted Patent B2
US 7,067,413 · App. 10/885,769 · Granted Jun 27, 2006

Wire bonding method, semiconductor chip, and semiconductor package

Assignee: Samsung Electronics Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,067,413
App. No.
10/885,769
Granted
Jun 27, 2006
Kind
B2
Abstract

A method of wire bonding, a semiconductor chip, and a semiconductor package provides stitch-stitch bonds of a wire on a bond pad of a chip as well as on a bond position of a substrate. A ball-stitch bump is formed on an end of the wire extending from a capillary or provided on the bond pad of the chip. A ball-stitch bump is formed on the bond pad of the chip by pressing down the ball of the wire on the bond pad. A ball-stitch stitch bond of the wire is formed on the ball-stitch bump by pressing down the wire on the ball-stitch bump. The capillary is moved from the bond pad to the bond position, while loosening the wire. A stitch bond of the wire is formed on the bond position by pressing down the wire on the bond position, and then separated from the wire within the capillary. The method of wire bonding, a semiconductor chip, and a semiconductor package can reduce or minimize a moving path of the capillary and provide more effective wire bonding.

Claims (42)

1. A method of wire bonding, comprising:

providing a semiconductor chip disposed on a substrate, wherein the chip has a bond pad and the substrate has a bond position arranged thereon;

providing wires to connect the bond pad and the bond position;

forming a ball bump on the bond pad of the chip;

forming a first stitch bond of the wire on the ball bump immediately after forming the ball bump; and

forming a second stitch bond of the wire on the bond position.

2. The method of claim 1 , wherein the wires include a gold wire, an aluminum wire, or a copper wire.

3. The method of claim 1 , wherein the substrate includes a lead frame, a printed circuit board, a ceramic substrate, or a flexible circuit board.

4. The method of claim 1 , wherein the first stitch bond is a ball-stitch stitch bond.

5. A method of wire bonding, comprising:

providing a semiconductor chip disposed on a substrate, wherein the chip has a bond pad and the substrate has a bond position arranged thereon;

providing a wire through a capillary so as to connect the bond pad and the bond position;

forming a ball on an end of the wire which extends from the capillary;

forming a ball bump on the bond pad of the chip by pressing down the ball of the wire on the bond pad;

separating the ball bump from the wire so as to remain on the bond pad;

forming a first stitch bond of the wire on the ball bump by pressing down the wire on the ball bump immediately after separating the ball bump;

moving the capillary from the bond pad to the bond position, while loosening the wire;

forming a second stitch bond of the wire on the bond position by pressing down the wire on the bond position; and

separating the second stitch bond from the wire within the capillary.

6. The method of claim 5 , wherein the Wire includes a gold wire, an aluminum wire, or a copper wires.

7. The method of claim 5 , wherein the substrate includes a lead frame, a printed circuit board, a ceramic substrate, or a flexible circuit board.

8. The method of claim 5 , wherein the first stitch bond is a ball-stitch stitch bond.

9. A method of wire bonding, comprising:

providing a semiconductor chip disposed on a substrate, wherein the chip has a bond pad and the substrate has a bond position arranged thereon and the bond pad has a ball bump arranged thereon;

providing a wire through a capillary so as to connect the bond pad and the bond position;

forming a first stitch bond of the wire on the ball bump by pressing down the wire on the ball bump immediately after forming the ball bump;

moving the capillary from the bond pad to the bond position, while loosening the wire;

forming a second stitch bond of the wire on the bond position by pressing down the wire on the bond position; and

separating the second stitch bond from the wire within the capillary.

10. The method of claim 9 , wherein the wire includes a gold wire, an aluminum wire, or a copper wire.

11. The method of claim 9 , wherein the substrate includes a lead frame, a printed circuit board, a ceramic substrate, or a flexible circuit board.

12. The method of claim 9 , wherein the first stitch bond is a ball-stitch stitch bond.

13. A method of wire bonding, comprising:

forming a ball-stitch stitch bond of a wire on a ball-stitch bump on a bond pad by pressing down the wire on the ball-stitch bump immediately after forming the ball-stitch bump;

moving a capillary from the bond pad to a bond position, while loosening the wire; and

forming a stitch bond of the wire on the bond position by pressing down the wire on the bond position.

14. A method of wire bonding a semiconductor package, including a semiconductor chip including at least one bond pad and a ball-stitch bump formed on the at least one bond pad and a semiconductor substrate including at least one bond position for connection via a wire to the ball-stitch bump on the at least one bond pad, said method comprising:

providing the semiconductor chip disposed on the substrate, wherein the chip has the at least one bond pad and the semiconductor substrate has the at least one bond position arranged thereon;

providing the wire to connect the at least one bond pad and the at least one bond position;

forming the ball-stitch bump on the at least one bond pad of the semiconductor chip;

forming a ball-stitch stitch bond of the wire on the ball-stitch bump immediately after forming the ball-stitch bump; and

forming a stitch bond of the wire on the at least one bond position.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2004
From: KIM, JIN-HO; KANG, IN-KU; LEE, SANG-YEOP
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 015563/0621 →
Priority Claims (1)
KR 10-2003-0061760 · Sep 4, 2003 · national
Continuity (1)
Related Publication 20050054186A1 · Mar 10, 2005