Plasma immersion ion implantation process
A method of performing plasma immersion ion implantation on a workpiece in a plasma reactor chamber, includes placing the workpiece on a workpiece support in the chamber, controlling a temperature of the wafer support near a constant level, performing plasma immersion ion implantation on the workpiece by introducing an implant species precursor gas into the chamber and generating a plasma while minimizing deposition and minimizing etching by holding the temperature of the workpiece within a temperature range that is above a workpiece deposition threshold temperature and below a workpiece etch threshold temperature.
1. A method of doping a deposited film comprising semiconductor material on a workpiece in a plasma reactor chamber, comprising:
placing the workpiece on an electrostatic chuck in the chamber; and
doping the deposited film on the workpiece by introducing a dopant species precursor gas into the chamber and applying RF power to generate a plasma, and applying a chucking voltage to a chucking electrode of the electrostatic chuck.
2. The method of claim 1 wherein the deposited film is comprised of silicon.
3. The method of claim 2 wherein the deposited film comprising silicon is one of: (a) amorphous, (b) polycrystalline.
4. The method of claim 3 wherein the deposited film comprising overlies an insulating layer.
5. The method of claim 1 wherein the deposited film is comprised of germanium.
6. The method of claim 2 wherein the deposited film is further comprised of germanium.
7. The method of claim 1 wherein the step of applying RF power to generate a plasma further comprises applying RF bias power to the electrostatic chuck.
8. The method of claim 1 wherein the wherein the step of applying RF power to generate a plasma further comprises applying RF source power.
9. The method of claim 8 wherein the step of applying RF source power to generate a plasma further comprises generating an oscillating plasma current in a toroidal path that passes through the process region and through an external reentrant hollow conduit.
10. The method of claim 8 wherein the step of applying RF source power to generate a plasma further comprises applying RF power to an electrode.
11. The method of claim 1 wherein the workpiece is subsequently annealed to activate the dopant.
12. The method of claim 1 further comprising heating the electrostatic chuck.
13. The method of claim 1 further comprising cooling the electrostatic chuck.
14. A method of forming a junction in a semiconductor material, said method comprising:
placing a workpiece comprising a semiconductor material on an electrostatic chuck in the chamber; and
performing plasma immersion ion implantation on the workpiece by introducing a precursor gas comprising a dopant species into the chamber and applying RF power to generate a plasma, and
applying a chucking voltage to a chucking electrode of the electrostatic chuck.
15. The method of claim 14 wherein the step of applying RF power to generate a plasma comprises applying RF bias power to the electrostatic chuck.
16. The method of claim 15 further comprising pulsing said RF bias power to reduce the dose rate of said dopant species on said workpiece.
17. The method of claim 14 wherein the wherein the step of applying RF power to generate a plasma comprises applying RF source power.
18. The method of claim 17 wherein the step of applying RF source power to generate a plasma comprises generating an oscillating plasma current in a toroidal path that passes through the process region and through an external reentrant hollow conduit.
19. The method of claim 17 wherein the step of applying RF source power comprises applying RF power to an electrode.
20. The method of claim 14 further comprising annealing the workpiece after the step of performing plasma immersion ion implantation to activate the dopant species in the semiconductor material.
21. The method of claim 14 further comprising heating the electrostatic chuck.
22. The method of claim 14 further comprising cooling the electrostatic chuck.
23. The method of claim 7 further comprising pulsing said RF bias power to reduce the dose rate of said dopant species on said workpiece.