IP Library › Granted Patent US 7,129,794
Granted Patent B2
US 7,129,794 · App. 10/623,959 · Granted Oct 31, 2006

Phase detector for reducing noise

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,129,794
App. No.
10/623,959
Granted
Oct 31, 2006
Kind
B2
Abstract

The present invention provides a method and an apparatus for reducing noise. The apparatus includes a phase detector adapted to determine a phase difference between a first and a second signal, a first circuit adapted to generate a control signal based upon the determined phase difference, and a second circuit. The second circuit is adapted to receive a third signal, receive a fourth signal, modify the fourth signal based upon the control signal, and provide the third signal and the modified fourth signal to the phase detector as the first and second signals.

Claims (20)

1. An apparatus, comprising:

a phase detector adapted to determine a phase difference between at least two input signals;

a first circuit adapted to generate a control signal based upon the determined phase difference; and

a second circuit adapted to:

receive a first signal;

receive a second signal;

modify the second signal based upon the control signal; and

provide the first signal and the modified second signal as the input signals to the phase detector.

2. The apparatus of claim 1 , wherein the second circuit is adapted to modify the first signal before providing the modified first signal to the phase detector.

3. The apparatus of claim 2 , wherein the second circuit is adapted to provide the modified first signal and the modified second signal as input signals to the phase detector, and wherein the phase detector is adapted to determine a phase difference between the modified first signal and the modified second signal.

4. The apparatus of claim 1 , wherein the second circuit comprises a fixed delay and an adjustable delay.

5. The apparatus of claim 4 , wherein the fixed delay comprises at least one delay element.

6. The apparatus of claim 4 , wherein the adjustable delay comprises at least two delay elements, at least one of the delay elements in the adjustable delay being selectable based upon the control signal.

7. The apparatus of claim 1 , wherein the phase detector is capable of providing a signal indicative of the determined phase difference to the first circuit.

8. The apparatus of claim 7 , wherein the signal indicative of the determined phase difference is a binary signal.

9. The apparatus of claim 8 , wherein the control signal is a binary control signal formed using the binary phase difference signal.

10. The apparatus of claim 1 , wherein the first circuit is adapted to provide a signal indicative of a desired clock signal delay based upon the determined phase difference.

11. The apparatus of claim 1 , wherein the first circuit is a majority filter adapted to provide a signal indicative of the desired clock signal delay in response to at least two consecutive determined phase differences in the same direction.

12. The apparatus of claim 1 , wherein the phase detector is at least one of a latch-type detector, an arbiter-type detector, and a counter-type detector.

13. The apparatus of claim 1 , wherein the second circuit comprises a hysteresis adjuster.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2011
From: MICRON TECHNOLOGY, INC.
To: ROUND ROCK RESEARCH, LLC
Reel/Frame 026445/0017 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2003
From: LIN, FENG
To: MICRON TECHNOLOGY, INC.
Reel/Frame 014322/0096 →
Continuity (1)
Related Publication 20050017810A1 · Jan 27, 2005