IP Library › Granted Patent US 7,365,584
Granted Patent B2
US 7,365,584 · App. 11/445,652 · Granted Apr 29, 2008

Slew-rate control apparatus and methods for a power transistor to reduce voltage transients during inductive flyback

Assignee: Freescale Semiconductor, Inc.
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Quick Facts
Patent No.
US 7,365,584
App. No.
11/445,652
Granted
Apr 29, 2008
Kind
B2
Abstract

Apparatus and methods that reduce the amount of conducted/radiated emissions from a power switch ( 200 ) when a transistor ( 210 ) is switched OFF are disclosed. In addition, apparatus and methods that reduce the slew rate in a power switch when the power switch is switched off are disclosed. The apparatus comprises a transistor ( 210 ) including an inductive load ( 230 ) coupled to the transistor, a plurality of current sources ( 222, 224 ) coupled to the gate of the transistor, and a clamp ( 250 ) coupled to either the gate and the drain of the transistor, or to the gate and to ground depending on the location of the inductive load, wherein the clamp comprises a resistive element ( 260 ) to increase the voltage of the clamp when current flows through the clamp, and wherein the increased voltage causes the apparatus to include a different slew rate.

Claims (40)

1. An apparatus featuring inductive flyback slew rate modification, comprising:

a transistor including a gate, a source, and a drain;

an inductive load coupled to the drain;

a plurality of current sources coupled to the gate, wherein a first current source of the plurality of current sources is configurable for switching the transistor ON and a second current source of the plurality of current sources is configurable for switching the transistor OFF; and

a clamp coupled between the gate and the drain, wherein the clamp comprises a first resistive element configurable for increasing a voltage of the clamp in response to a current flow through the clamp, a first zener diode coupled in series with the first resistive element, and a second zener diode coupled in parallel with the first resistive element.

2. The apparatus of claim 1 , wherein the clamp is configured for a pre-determined voltage to decrease the slew rate of the apparatus.

3. The apparatus of claim 2 , wherein the pre-determined voltage is determined by at least one of a pre-determined voltage of the first zener diode, a pre-determined current of the first current source multiplied by a pre-determined resistance of the first resistive element, and a pre-determined voltage across the gate and source.

4. The apparatus of claim 3 , wherein the pre-determined resistance is determined by at least one of a desired voltage output of the transistor and a desired gate pull down current.

5. The apparatus of claim 1 , further comprising:

a third current source coupled to the gate and coupled in parallel with the first current source;

a first switch coupled between the third current source and the gate, wherein the first switch is configurable for connecting/disconnecting the third current source to the gate;

a fourth current source coupled to the gate and coupled in parallel with the second current source; and

a second switch coupled between the fourth current source, wherein the second switch is configurable for connecting/disconnecting the fourth current source to the gate.

6. The apparatus of claim 5 , wherein the clamp further comprises:

a second resistive element coupled in series with the first resistive element; and

a third switch coupled to the clamp, wherein a first side of the third switch is coupled on one side of the second resistive element and a second side of the third switch is coupled to an opposite side of the second resistive element, wherein responsive to the third switch being in an closed state, current is prohibited from flowing through the second resistive element and wherein responsive to the third switch being in a open state, current is enabled to flow through the second resistive element.

7. An apparatus featuring inductive flyback slew rate modification, comprising:

a transistor including a gate, a source, and a drain;

an inductive load coupled to the source;

a plurality of current sources coupled to the gate, wherein a first current source of the plurality of current sources is configurable for switching the transistor ON and a second current source of the plurality of current sources is configurable for switching the transistor OFF; and

a clamp coupled between the gate and ground, wherein the clamp comprises a first resistive element configurable for increasing a voltage of the clamp in response to a current flow through the clamp, a first zener diode coupled in series with the first resistive element, and a second zener diode coupled in parallel with the first resistive element.

8. The apparatus of claim 7 , wherein the clamp is configurable for a pre-determined voltage to decrease the slew rate of the apparatus.

9. The apparatus of claim 8 , wherein the pre-determined voltage is determined by at least one of a pre-determined voltage of the first zener diode, a pre-determined current of the first current source multiplied by a pre-determined resistance of the first resistive element, and a pre-determined voltage across the gate and source.

10. The apparatus of claim 9 , wherein the pre-determined resistance is determined by at least one of a desired voltage output of the transistor and a desired gate pull down current.

11. The apparatus of claim 7 , further comprising:

a third current source coupled to the gate and coupled in parallel with the first current source; and

a first switch coupled between the third current source and the gate, wherein the first switch is configurable for connecting/disconnecting the third current source to the gate.

12. The apparatus of claim 11 , wherein the clamp further comprises:

a second resistive element coupled in series with the first resistive element; and

a second switch coupled to the clamp, wherein a first side of the second switch is coupled on one side of the second resistive element and a second side of the second switch is coupled to an opposite side of the second resistive element, wherein responsive to the second switch being in an open state, current is prohibited from flowing through the second resistive element and wherein responsive to the second switch being in a closed state, current is enabled to flow through the second resistive element.

13. A method to reduce voltage transients during inductive flyback, the method comprising:

identifying a desired slew rate for a power transistor, the power transistor comprising:

a transistor and

at least one current source to provide an amount of input current to the transistor, an inductive load, and a clamp coupled to the transistor, wherein the clamp includes at least one zener diode coupled in series with at least one resistive element and at least one zener diode coupled in parallel with at least one resistive element; and

adjusting a voltage of the clamp to attain the desired slew rate.

14. The method of claim 13 , wherein:

adjusting the voltage comprises one of adding resistance to the clamp and subtracting resistance from the clamp.

15. The method of claim 13 , further comprising:

adjusting the amount of input current provided to the transistor.

16. The method of claim 15 , wherein adjusting the amount of input current comprises one of adding and subtracting input current from at least one additional current source.

Assignments (20)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NORTH STAR INNOVATIONS INC.
Reel/Frame 037694/0264 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0719 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Sep 24, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 021570/0449 →
SECURITY AGREEMENT Recorded Feb 2, 2007
From: FREESCALE SEMICONDUCTOR, INC.; FREESCALE ACQUISITION CORPORATION; FREESCALE ACQUISITION HOLDINGS CORP.; FREESCALE HOLDINGS (BERMUDA) III, LTD.
To: CITIBANK, N.A. AS COLLATERAL AGENT
Reel/Frame 018855/0129 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2006
From: BENNETT, PAUL T.; GRAY, RANDALL C.; THOMPSON, MATTHEW D.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 017965/0218 →
Continuity (1)
Related Publication 20070279106A1 · Dec 6, 2007