IP Library Granted Patent US 7,431,966
Granted Patent B2
US 7,431,966 · App. 10/733,201 · Granted Oct 7, 2008

Atomic layer deposition method of depositing an oxide on a substrate

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,431,966
App. No.
10/733,201
Granted
Oct 7, 2008
Kind
B2
Abstract

The invention includes atomic layer deposition methods of depositing an oxide on a substrate. In one implementation, a substrate is positioned within a deposition chamber. A first species is chemisorbed onto the substrate to form a first species monolayer within the deposition chamber from a gaseous precursor. The chemisorbed first species is contacted with remote plasma oxygen derived at least in part from at least one of O 2 and O 3 and with remote plasma nitrogen effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer. The chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen are successively repeated effective to form porous oxide on the substrate. Other aspects and implementations are contemplated.

Claims (37)

1. An atomic layer deposition method of depositing an oxide on a substrate comprising:

providing a substrate within a deposition chamber;

chemisorbing a first species to form a first species monolayer onto the substrate within the deposition chamber from a gaseous precursor;

contacting the chemisorbed first species with remote plasma oxygen derived at least in part from at least one of O 2 and O 3 and with remote plasma nitrogen effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer; and

successively repeating the chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen effective to form porous electrically conductive oxide comprising In x Sn y O, on the substrate, the gaseous precursor comprising an indium-containing precursor and a tin-containing precursor which are fed to the deposition chamber simultaneously.

2. An atomic layer deposition method of depositing an oxide on a substrate comprising:

providing a substrate within a deposition chamber;

chemisorbing a first species to form a first species monolayer onto the substrate within the deposition chamber from a gaseous precursor;

contacting the chemisorbed first species with remote plasma oxygen derived at least in part from at least one of O 2 and O 3 and with remote plasma nitrogen effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer; and

successively repeating the chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen effective to form porous electrically conductive oxide comprising In x Sn y O, on the substrate, the gaseous precursor comprising an indium-containing precursor and a tin-containing precursor which are fed to the deposition chamber at different times.

3. The method of claim 2 wherein the different times overlap one another.

4. The method of claim 2 wherein the different times are spaced from one another.

5. An atomic layer deposition method of depositing an oxide on a substrate comprising:

providing a substrate within a deposition chamber;

chemisorbing a first species to form a first species monolayer onto the substrate within the deposition chamber from a gaseous precursor;

contacting the chemisorbed first species with remote plasma oxygen derived at least in part from at least one of O 2 and O 3 and with remote plasma nitrogen effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer, the remote plasma oxygen and the remote plasma nitrogen being fed separately to the deposition chamber simultaneously; and

successively repeating the chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen effective to form porous oxide on the substrate.

6. An atomic layer deposition method of depositing an oxide on a substrate comprising:

providing a substrate within a deposition chamber;

chemisorbing a first species to form a first species monolayer onto the substrate within the deposition chamber from a gaseous precursor;

contacting the chemisorbed first species with remote plasma oxygen derived at least in part from at least one of O 2 and O 3 and with remote plasma nitrogen effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer, the remote plasma oxygen and the remote plasma nitrogen being generated in different remote plasma generating chambers; and

successively repeating the chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen effective to form porous oxide on the substrate.

7. The method of claim 6 wherein the remote plasma oxygen and the remote plasma nitrogen are fed as a mixture to the deposition chamber.

8. An atomic layer deposition method of depositing an oxide on a substrate comprising:

providing a substrate within a deposition chamber;

chemisorbing a first species to form a first species monolayer onto the substrate within the deposition chamber from a gaseous precursor;

feeding a) at least one of O 2 and O 3 , and b) nitrogen to a remote plasma generator and forming a mixture of remote plasma oxygen and remote plasma nitrogen therefrom, the mixture comprising the remote plasma nitrogen at from 0.1% to 10% by volume of all remote plasma oxygen and remote plasma nitrogen generated by the generator

feeding the remote plasma mixture to the deposition chamber and to contact the chemisorbed first species effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer; and

successively repeating the chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen effective to form porous oxide on the substrate, the gaseous precursor comprising an indium-containing precursor and a tin-containing precursor which are fed to the deposition chamber at different times.

9. An atomic layer deposition method of depositing an oxide on a substrate comprising:

providing a substrate within a deposition chamber;

chemisorbing a first species to form a first species monolayer onto the substrate within the deposition chamber from a gaseous precursor;

feeding a) at least one of O 2 and O 3 , and b) nitrogen to a remote plasma generator and forming a mixture of remote plasma oxygen and remote plasma nitrogen therefrom, the mixture comprising the remote plasma nitrogen at from 0.1% to 10% by volume of all remote plasma oxygen and remote plasma nitrogen generated by the generator;

feeding the remote plasma mixture to the deposition chamber and to contact the chemisorbed first species effective to react with the first species to form a monolayer comprising an oxide of a component of the first species monolayer; and

successively repeating the chemisorbing and the contacting with remote plasma oxygen and with remote plasma nitrogen effective to form porous oxide on the substrate, the gaseous precursor comprising an indium-containing precursor and a tin-containing precursor which are fed to the deposition chamber simultaneously.

10. The method of claim 9 wherein the different times overlap one another.

11. The method of claim 9 wherein the different times are spaced from one another.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2003
From: DERDERIAN, GARO J.; MENG, SHUANG; DYNKA, DANNY
To: MICRON TECHNOLOGY, INC.
Reel/Frame 014804/0741 →
Continuity (1)
Related Publication 20050123690A1 · Jun 9, 2005