IP Library › Granted Patent US 7,494,910
Granted Patent B2
US 7,494,910 · App. 11/370,093 · Granted Feb 24, 2009

Methods of forming semiconductor package

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,494,910
App. No.
11/370,093
Granted
Feb 24, 2009
Kind
B2
Abstract

The invention includes semiconductor packages having grooves within a semiconductor die backside; and includes semiconductor packages utilizing carbon nanostructures (such as, for example, carbon nanotubes) as thermally conductive interface materials. The invention also includes methods of cooling a semiconductor die in which coolant is forced through grooves in a backside of the die, and includes methods of making semiconductor packages.

Claims (30)

1. A method of forming a semiconductor package, comprising:

providing a semiconductor die, the die comprising a backside surface;

forming a plurality of grooves extending into the backside surface of the die;

providing a metallic seed material within the grooves;

growing carbon nanostructures on the seed material;

providing a heat sink across the plurality of grooves and over the carbon nanostructures;

wherein the carbon nanostructures are vertical columns extending upwardly within the grooves, the vertical columns having vertical lengths; and

forming thermally conductive material entirely along the vertical lengths of the vertical columns prior to providing the heat sink.

2. A method of forming a semiconductor package, comprising:

providing a semiconductor die, the die comprising a backside surface;

forming a plurality of grooves extending into the backside surface of the die;

providing a metallic seed material within the grooves;

growing carbon nanostructures on the seed material;

providing a heat sink across the plurality of grooves and over the carbon nanostructures;

wherein the carbon nanostructures are vertical columns extending upwardly within the grooves; and

prior to providing the heat sink:

coating at least some of the vertical columns with conductive material; and

forming dielectric material between at least some of the coated vertical columns.

3. A method of forming a semiconductor package, comprising:

providing a semiconductor die, the die comprising a backside surface;

forming a plurality of grooves extending into the backside surface of the die;

forming carbon nanostructures within the grooves, the carbon nanostructures being vertical columns extending upwardly within the grooves, the vertical columns having vertical lengths;

forming thermally conductive material entirely along the vertical lengths of the vertical columns; and

providing a heat sink across the plurality of grooves and over the carbon nanostructures.

4. A method of forming a semiconductor package, comprising:

providing a semiconductor die, the die comprising a backside surface and having a plurality of grooves extending into the backside surface of the die;

forming carbon nanostructures within the grooves, the carbon nanostructures being vertical columns extending upwardly within the grooves;

coating at least some of the vertical columns with conductive material;

forming dielectric material between at least some of the coated vertical columns; and

providing a heat sink across the plurality of grooves and over the carbon nanostructures.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2006
From: MOULI, CHANDRA; SANDHU, GURTEJ S.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 017702/0748 →
Continuity (1)
Related Publication 20070205792A1 · Sep 6, 2007