IP Library › Granted Patent US 7,499,329
Granted Patent B2
US 7,499,329 · App. 11/726,585 · Granted Mar 3, 2009

Flash memory array using adjacent bit line as source

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,499,329
App. No.
11/726,585
Granted
Mar 3, 2009
Kind
B2
Abstract

A memory array having a plurality of flash memory cells arranged in rows and columns. A plurality of bit lines couple the columns such that alternate bit lines of the plurality of bit lines are adapted to operate as either source lines or bit lines in response to bit line selection and biasing.

Claims (35)

1. A memory array comprising:

a plurality of non-volatile memory cells arranged in rows and columns wherein each column of memory cells is arranged in a plurality of series strings of memory cells, each series string having a top select transistor and a bottom select transistor;

two series coupled intermediate select transistors subdividing each series string of memory cells, a node formed between the two series coupled intermediate select transistors; and

a plurality of bit lines coupled to the columns such that the top select transistor and bottom select transistor of each string are coupled to a first adjacent bit line wherein a second adjacent bit line is coupled to the node.

2. The memory array of claim 1 , wherein the first adjacent bit line of a series string of memory cells operates as the second adjacent bit line of an adjacent series string of memory cells.

3. The memory array of claim 1 , wherein the two series coupled intermediate select transistors bisect the series strings of memory cells.

4. The memory array of claim 1 , wherein the two series coupled intermediate select transistors do not bisect the series strings of memory cells.

5. The memory array of claim 1 , wherein the first adjacent bit line operates as a source line while the second adjacent bit line operates as a bit line or vice versa.

6. The memory array of claim 1 , wherein each series string of memory cells is comprised of an even number of memory cells.

7. The memory array of claim 1 , wherein each series string of memory cells is comprised of an odd number of memory cells.

8. A NAND Flash memory array comprising:

a plurality of non-volatile memory cells arranged in rows and columns wherein each column of memory cells is arranged in a plurality of series strings of memory cells, each series string having a top select transistor and a bottom select transistor;

a plurality of bit lines coupled to the columns such that the top select transistor is coupled to a first adjacent bit line and the bottom select transistor is coupled to a second adjacent bit line;

a first pair of series coupled intermediate select transistors subdividing each series string of memory cells, a first node formed between the first pair of series coupled intermediate select transistors wherein the first node is coupled to the second adjacent bit line; and

a second pair of series coupled intermediate select transistors further subdividing each series string of memory cells between the first pair of series coupled intermediate select transistors and the bottom select transistor, a second node formed between the second pair of series coupled intermediate select transistors wherein the second node is coupled to the first adjacent bit line.

9. The NAND Flash memory array of claim 8 , wherein the control gates of the first pair of series coupled intermediate select transistors are coupled together and the control gates of the second pair of series coupled intermediate select transistors are coupled together.

10. The NAND Flash memory array of claim 9 , wherein a plurality of select lines are coupled to the control gates of the first and second pair of series coupled intermediate select transistors.

11. The NAND Flash memory array of claim 8 , wherein the first adjacent bit line operates as source line while the second adjacent bit line operates as a bit line or vice versa.

12. The NAND Flash memory array of claim 8 , wherein the number of memory cells existing between the top select transistor and the first node, the first node and the second node and the second node and the bottom transistor may or may not be equal.

13. A non-volatile memory device comprising:

memory control circuit that controls operations of the memory device; and

a flash memory array comprising:

a plurality of non-volatile memory cells arranged in rows and columns wherein each column of memory cells is arranged in a plurality of series strings of memory cells, each series string having a top select transistor and a bottom select transistor;

two series coupled intermediate select transistors subdividing each series string of memory cells, a node formed between the two series coupled intermediate select transistors; and

a plurality of bit lines coupled to the columns such that the top select transistor and bottom select transistor of each string are coupled to a first adjacent bit line wherein a second adjacent bit line is coupled to the node.

14. The non-volatile memory device of claim 13 wherein bit lines biased at ground potential act as source lines.

15. The non-volatile memory device of claim 13 wherein bit lines biased at Vcc act as bit lines.

16. The non-volatile memory device of claim 13 wherein the first adjacent bit line operates as source line while the second adjacent bit line operates as a bit line or vice versa.

17. An electronic system comprising:

a processor that generates memory control signals;

a memory device coupled to the processor, the device comprising:

a memory array having a plurality of non-volatile memory cells arranged in rows

and columns wherein each column of memory cells is arranged in a plurality of series strings of memory cells, each series string having a top select transistor and a bottom select transistor;

two series coupled intermediate select transistors subdividing each series string of memory cells, a node formed between the two series coupled intermediate select transistors; and

a plurality of bit lines coupled to the columns such that the top select transistor and bottom select transistor of each string are coupled to a first adjacent bit line wherein a second adjacent bit line is coupled to the node.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
Continuity (2)
Continuation 1112746600 · May 12, 2005
Related Publication 20070165459A1 · Jul 19, 2007