IP Library › Granted Patent US 7,521,983
Granted Patent B2
US 7,521,983 · App. 11/437,405 · Granted Apr 21, 2009

High-voltage switch with low output ripple for non-volatile floating-gate memories

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Quick Facts
Patent No.
US 7,521,983
App. No.
11/437,405
Granted
Apr 21, 2009
Kind
B2
Abstract

A high-voltage switch has a high-voltage input terminal, receiving a high voltage, and an output terminal. A pass transistor, having a control terminal, is connected between the high-voltage input terminal and the output terminal. The output of a voltage-multiplying circuit of the charge-pump type is connected to the control terminal. The voltage-multiplying circuit is of a symmetrical type, has first and second charge-storage means, receiving a clock signal of a periodic type, and has a first circuit branch and a second circuit branch, which are symmetrical to one another and operate in phase opposition with respect to the clock signal.

Claims (74)

1. A high-voltage switch, comprising:

a high-voltage input terminal connected to a first reference-voltage line to receive a high voltage that is higher than a supply voltage to the switch;

an output terminal;

a pass transistor having a first conduction terminal connected to said high-voltage input terminal, a second conduction terminal connected to said output terminal, and a control terminal;

a boosting stage having an output connected to said control terminal, and including a charge-pump, voltage-multiplying circuit; said voltage-multiplying circuit comprising first and second charge-storage elements, which receive a periodic clock signal; wherein said voltage-multiplying circuit includes a first circuit branch and a second circuit branch couplable to the output, which are symmetrical to one another and operate in phase opposition with respect to said clock signal;

a driving input terminal connected to a second reference-voltage line; and

a feedback transistor, connected between said driving input terminal and an input of said boosting stage and having a control terminal connected to said output of said boosting stage.

2. The high-voltage switch according to claim 1 , wherein said clock signal has a first half-period and a second half-period, and said output of the boosting stage is connected to said first circuit branch in the first half-period and to said second circuit branch in the second half-period.

3. The high-voltage switch according to claim 1 , wherein said voltage-multiplying circuit is a voltage-doubler circuit.

4. The high-voltage switch according to claim 1 , wherein:

said first charge-storage element includes a first boosting capacitor, receiving said clock signal on a first terminal and having a second terminal connected to a first charge-transfer node;

said second charge-storage element includes a second boosting capacitor, receiving, on a first terminal, a negated signal in phase opposition with said clock signal, and having a second terminal connected to a second charge-transfer node;

said first circuit branch comprises a first charge transistor, connecting said first charge-transfer node to an input of said boosting stage and having a control terminal connected to said second charge-transfer node, and a first discharge transistor, connecting said first charge-transfer node to said output of said boosting stage and having a control terminal connected to said second charge-transfer node; and

said second circuit branch comprises a second charge transistor, connecting said second charge-transfer node to said input of said boosting stage and having a control terminal connected to said first charge-transfer node, and a second discharge transistor, connecting said second charge-transfer node to said output of said boosting stage and having a control terminal connected to said first charge-transfer node; said first charge transistor and second charge transistor having a first type of polarity, and said first discharge transistor and second discharge transistor having a second type of polarity.

5. The high-voltage switch according to claim 1 , wherein said boosting stage comprises at least one further voltage-multiplying circuit cascaded to said voltage-multiplying circuit.

6. The high-voltage switch according to claim 1 , wherein said voltage-multiplying circuit is a voltage-tripler circuit.

7. The high-voltage switch according to claim 1 , wherein said feedback transistor is a natural transistor.

8. The high-voltage switch according to claim 1 , wherein said second reference-voltage line is set at a voltage having an absolute value not lower than said first reference-voltage line.

9. The high-voltage switch according to claim 1 , further comprising:

a supply input terminal connected to a second reference-voltage line set at a voltage lower than said first reference-voltage line;

an enabling input terminal receiving an enabling signal of a logic type; and

a turning-on transistor, connected between said supply input terminal and said input of said boosting stage and having a control terminal connected to said enabling input terminal.

10. The high-voltage switch according to claim 1 , further comprising

a first disabling input terminal and a second disabling input terminal, receiving, respectively, a first turning-off signal and a second turning-off signal;

a first turning-off transistor, connected between said input of said boosting stage and a second reference-voltage line and having a control terminal connected to said first disabling input terminal; and

a second turning-off transistor, connected between said output of said boosting stage and said second reference-voltage line and having a control terminal connected to said second disabling input terminal.

11. The high-voltage switch according to claim 1 , wherein said clock signal has a frequency which can be adjusted.

12. A floating-gate non-volatile memory device, comprising:

an array of memory cells; and

a first high-voltage switch that includes:

a high-voltage input terminal connected to a first reference-voltage line;

an output terminal;

a pass transistor having a first conduction terminal connected to said high-voltage input terminal, a second conduction terminal connected to said output terminal, and a control terminal;

a boosting stage having an output connected to said control terminal, and including a charge-pump, voltage-multiplying circuit; said voltage-multiplying circuit comprising first and second charge-storage elements, which receive a periodic clock signal;

wherein said voltage-multiplying circuit includes a first circuit branch and a second circuit branch, which are symmetrical to one another and operate in phase opposition with respect to said clock signal;

a driving input terminal connected to a second reference-voltage line; and

a feedback transistor, connected between said driving input terminal and an input of said boosting stage and having a control terminal connected to said output of said boosting stage.

13. The memory device according to claim 12 , wherein the array of memory cells is organized in a plurality of wordlines and bitlines, the device further comprising:

a row decoder connected to said wordlines and including a first plurality of high-voltage switches connected to the wordlines, respectively; and

a column decoder connected to said bitlines and including a second plurality of high-voltage switches connected to said bitlines, respectively, wherein the first high-voltage switches is one of the high-voltage switches in the first and second pluralities.

14. The memory device according to claim 12 , wherein:

the first charge-storage element includes a first boosting capacitor, receiving the clock signal on a first terminal and having a second terminal connected to a first charge-transfer node;

the second charge-storage element includes a second boosting capacitor, receiving, on a first terminal, a negated signal in phase opposition with the clock signal, and having a second terminal connected to a second charge-transfer node;

the first circuit branch comprises a first charge transistor, connecting the first charge-transfer node to the input of the boosting stage and having a control terminal connected to the second charge-transfer node, and a first discharge transistor, connecting the first charge-transfer node to the output of the boosting stage and having a control terminal connected to the second charge-transfer node; and

the second circuit branch comprises a second charge transistor, connecting the second charge-transfer node to the input of the boosting stage and having a control terminal connected to the first charge-transfer node, and a second discharge transistor, connecting the second charge-transfer node to the output of the boosting stage and having a control terminal connected to the first charge-transfer node; the first charge transistor and second charge transistor having a first type of polarity, and the first discharge transistor and second discharge transistor having a second type of polarity.

15. A high-voltage switch, comprising

a high-voltage input terminal connected to a first reference-voltage line to receive a high voltage that is greater than a supply voltage;

an output terminal;

a pass transistor having a first conduction terminal connected to the high-voltage input terminal, a second conduction terminal connected to the output terminal, and a control terminal;

a boosting stage including:

an input receiving a voltage to be boosted;

an output connected to the control terminal;

first and second charge-storage elements connected to first and second charge-transfer nodes, respectively;

a first charge transistor connected between the input and the first charge-transfer node;

a second charge transistor connected between the input and the second charge-transfer node;

a driving input terminal connected to a second reference-voltage line; and

a feedback transistor connected between the driving input terminal and the input of the boosting stage and having a control terminal connected to the output of the boosting stage, the feedback transistor further coupled to the second reference voltage line.

16. The high-voltage switch according to claim 15 , further comprising:

a first discharge transistor connecting the first charge-transfer node to the output of the boosting stage and having a control terminal connected to the second charge-transfer node; and

a second discharge transistor connecting the second charge-transfer node to the output of the boosting stage and having a control terminal connected to the first charge-transfer node.

17. The high-voltage switch according to claim 15 , further comprising:

a first biasing transistor having a first conduction terminal, a second conduction terminal connected to the first charge-transfer node, a control terminal connected to the second charge-transfer node, and a bulk terminal connected to a bulk terminal of the first charge transistor; and

a second biasing transistor having a first conduction terminal connected to the first conduction terminal of the first biasing transistor, a second conduction terminal connected to the second charge-transfer node, a control terminal connected to the first charge-transfer node, and a bulk terminal connected to a bulk terminal of the second charge transistor.

18. The high-voltage switch according to claim 15 , wherein the first charge-storage element is connected between a first clock input and the first charge-transfer node and the second charge-storage element is connected between a second clock input and the second charge-transfer node, the second clock input receiving a clock signal that is inverted compared to a clock signal at the first clock input.

19. The high-voltage switch according to claim 15 , wherein the feedback transistor is a natural transistor.

20. The high-voltage switch according to claim 15 , wherein the second reference-voltage line is set at a voltage having an absolute value not lower than the first reference-voltage line.

21. The high-voltage switch according to claim 15 , further comprising:

a supply input terminal connected to a third reference-voltage line set at a voltage lower than the first reference-voltage line;

an enabling input terminal receiving an enabling signal of a logic type; and

an enabling transistor connected between the supply input terminal and the input of the boosting stage and having a control terminal connected to the enabling input terminal.

22. The high-voltage switch according to claim 15 , further comprising

a first disabling input terminal and a second disabling input terminal, receiving, respectively, a first disabling signal and a second disabling signal;

a first disabling transistor connected between the input of the boosting stage and a third reference-voltage line and having a control terminal connected to the first disabling input terminal; and

a second disabling transistor connected between the output of the boosting stage and the third reference-voltage line and having a control terminal connected to the second disabling input terminal.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 24, 2012
From: STMICROELECTRONICS S.R.L.; HYNIX SEMICONDUCTOR INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 029184/0782 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2006
From: RAGONE, GIANCARLO; CRIPPA, LUCA; SANGALLI, MIRIAM; MICHELONI, RINO
To: STMICROELECTRONICS S.R.L.; HYNIX SEMICONDUCTOR INC.
Reel/Frame 018512/0800 →
Priority Claims (1)
EP 05425347.1 · May 20, 2005 · regional
Continuity (1)
Related Publication 20070053227A1 · Mar 8, 2007