IP Library › Granted Patent US 7,583,554
Granted Patent B2
US 7,583,554 · App. 11/681,421 · Granted Sep 1, 2009

Integrated circuit fuse array

Assignee: Freescale Semiconductor, Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,583,554
App. No.
11/681,421
Granted
Sep 1, 2009
Kind
B2
Abstract

The fuse array described herein is very compact and uses little semiconductor area because of its crosspoint architecture. The disclosed crosspoint architecture reduces the number of conductors that must be run horizontally or vertically through each bit cell. As a result, the area required for each bit cell is significantly reduced. In one embodiment, a selected set of voltages on various wordlines and bitlines are used to program the fuses to produce programmed fuses having a tighter distribution of impedances. Similarly, a selected set of voltages on various wordlines and bitlines are used to read the fuses.

Claims (39)

1. A method for programming a first fuse, the method comprising:

providing a plurality of fuses arranged in an array, the array comprising a plurality of fuse wordlines and bitlines, wherein the plurality of fuses comprise the first fuse;

providing a first voltage to a selected wordline;

providing a second voltage to a non-selected wordline, wherein a magnitude of the second voltage is greater than a magnitude of the first voltage; and

providing a third voltage to a selected bitline, wherein a magnitude of the third voltage is greater than the magnitude of the second voltage; and

wherein the first fuse is programmed in response to the steps of providing the first, second, and third voltages.

2. A method as in claim 1 , wherein the first fuse is electrically programmable.

3. A method as in claim 1 , wherein a second fuse is coupled to the selected bitline and the non-selected wordline, and wherein the second fuse remains unprogrammed in response to the steps of providing the second and third voltages.

4. A method as in claim 3 , further comprising:

providing a fourth voltage to a non-selected bitline, wherein a magnitude of the fourth voltage is approximately equal to the magnitude of the first voltage.

5. A method as in claim 4 , wherein a third fuse is coupled to the non-selected bitline and the non-selected wordline, and wherein the third fuse remains unprogrammed in response to the steps of providing the second and fourth voltages.

6. A method as in claim 5 , wherein a fourth fuse is coupled to the non-selected bitline and the selected wordline, and wherein the fourth fuse remains unprogrammed in response to the steps of providing the first and fourth voltages.

7. A method as in claim 1 , wherein the first voltage is approximately equal to a first power supply voltage, the second voltage is approximately equal to a second power supply voltage.

8. A method as in claim 7 , wherein the magnitude of the third voltage is greater than twice a magnitude of the second power supply voltage.

9. A method as in claim 1 , wherein a transistor coupled to the selected bitline and the non-selected wordline is back biased in response to the steps of providing the first, second, and third voltages.

10. A method for reading a first fuse, the method comprising:

providing a plurality of fuses arranged in an array, the array comprising a plurality of fuse wordlines and bitlines, wherein the plurality of fuses comprise the first fuse;

providing a first voltage to a selected wordline;

providing a second voltage to a non-selected wordline, wherein a magnitude of the second voltage is greater than a magnitude of the first voltage; and

providing a third voltage to a selected bitline, wherein a magnitude of the third voltage is approximately equal to the magnitude of the second voltage; and

reading the first fuse in response to the steps of providing the first, second, and third voltages.

11. A method as in claim 10 , wherein the first fuse is electrically programmable.

12. A method as in claim 10 , wherein the step of reading comprises comparing a current on the selected bitline and a plurality of currents on a plurality of non-selected bitlines.

13. A method as in claim 10 , wherein a second fuse is coupled to the selected bitline and the non-selected wordline, and wherein the second fuse remains unread in response to the steps of providing the second and third voltages.

14. A method as in claim 13 , wherein reading the first fuse does not program the second fuse.

15. A method as in claim 13 , further comprising:

providing a fourth voltage to a non-selected bitline, wherein a magnitude of the fourth voltage is approximately equal to the magnitude of the first voltage.

16. A method as in claim 15 , wherein a third fuse is coupled to the non-selected bitline and the non-selected wordline, and wherein the third fuse remains unread in response to the steps of providing the second and fourth voltages.

17. A method as in claim 16 , wherein a fourth fuse is coupled to the non-selected bitline and the selected wordline, and wherein the fourth fuse remains unread in response to the steps of providing the first and fourth voltages.

18. A method as in claim 17 , wherein reading the first fuse does not program the second, third, and fourth fuses.

19. A method for accessing a first fuse, the method comprising:

providing a plurality of fuses arranged in an array, the array comprising a plurality of fuse wordlines and bitlines, wherein the plurality of fuses comprise the first fuse;

providing a first voltage to a selected wordline;

providing a second voltage to a non-selected wordline, wherein a magnitude of the second voltage is greater than a magnitude of the first voltage; and

providing a third voltage to a selected bitline, wherein a magnitude of the third voltage is greater than or approximately equal to the magnitude of the second voltage.

20. A method as in claim 19 , further comprising:

providing an address corresponding to the first fuse;

using the address to select the selected wordline; and

using the address to select the selected bitline.

Assignments (23)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0640 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0854 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Feb 3, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 023882/0834 →
SECURITY AGREEMENT Recorded Sep 19, 2007
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 019847/0804 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2007
From: HOEFLER, ALEXANDER B.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 018965/0257 →
Continuity (1)
Related Publication 20080212387A1 · Sep 4, 2008