IP Library › Granted Patent US 7,619,279
Granted Patent B2
US 7,619,279 · App. 11/210,523 · Granted Nov 17, 2009

Three dimensional flash cell

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,619,279
App. No.
11/210,523
Granted
Nov 17, 2009
Kind
B2
Abstract

A floating gate memory cell includes isolation regions between adjacent cells, and a staggered pattern of columns of cells. Word lines are formed parallel to control gate structures.

Claims (53)

1. An array of memory cells, comprising:

a plurality of rows of memory cell pillars each pillar having a pair of memory cells formed thereon, each memory cell pillar isolated from an adjacent memory cell pillar by an isolation region within its row;

wherein each memory cell pillar comprises:

a substrate;

two source regions and one drain region, the drain region vertically spaced apart from the source regions to define two separate channel regions;

a floating gate located adjacent each channel region, each floating gate extending substantially vertically; and

a control gate located adjacent to each floating gate;

wherein every memory cell coupled to a first side of a word line is within one row of memory cells and every memory cell coupled to a second side of the word line is within an adjacent row of memory cells;

wherein the memory cells of the one row of memory cells are coupled to alternating bit lines and the memory cells of the adjacent row of memory cells are coupled to alternating bit lines; and

wherein the alternating bit lines coupled to the memory cells of the one row of memory cells are different from the alternating bit lines coupled to the memory cells of the adjacent row of memory cells.

2. The array of memory cells of claim 1 wherein the source regions of each pillar are on opposite sides of the pillar.

3. The array of memory cells of claim 1 , wherein the word line controls the memory cells of the one row of memory cells and the memory cells of the adjacent row of memory cells.

4. The array of memory cells of claim 1 and further including an oxide-nitride-oxide layer between each floating gate and its respective control gate.

5. The array of memory cells of claim 1 and further including an oxide layer between each floating gate and its respective control gate.

6. The array of memory cells of claim 1 and further including:

a dielectric layer formed over the memory array; and

a metal contact formed through the dielectric layer such that adjacent drain regions of the array are coupled by the metal contact.

7. The array of memory cells of claim 1 , wherein the memory cells of each pair of memory cells formed on each pillar are formed on opposite sides of that pillar.

8. The array of memory cells of claim 1 , wherein the source regions are substantially parallel to the isolation region.

9. An array of memory cells, comprising:

a plurality of rows of memory cell pillars each pillar having a pair of memory cells formed thereon, each memory cell pillar isolated from an adjacent memory cell pillar by an isolation region within its row;

wherein each memory cell pillar comprises:

a substrate;

two source regions and one drain region, the drain region vertically spaced apart from the source regions to define two separate channel regions;

a floating gate located adjacent each channel region, each floating gate extending substantially vertically; and

a control gate located adjacent to each floating gate;

wherein every memory cell coupled to a first side of a word line is within one row of memory cells and every memory cell coupled to a second side of the word line is within an adjacent row of memory cells;

wherein the memory cells of the one row of memory cells are coupled to alternating bit lines and the memory cells of the adjacent row of memory cells are coupled to alternating bit lines;

wherein the alternating bit lines coupled to the memory cells of the one row of memory cells are different from the alternating bit lines coupled to the memory cells of the adjacent row of memory cells; and

wherein each bit line is coupled to the drain region of each memory cell pillar of a column of memory cell pillars, the memory cell pillars of the column belonging to alternating rows of memory cell pillars.

10. The array of memory cells of claim 9 , wherein each bit line is coupled to a drain region of a pillar by a contact.

11. The array of memory cells of claim 9 , further comprising:

a dielectric layer formed over the memory array;

wherein each bit line is coupled to a drain region of a pillar by a contact formed through the dielectric layer.

12. The array of memory cells of claim 9 , wherein the source regions of each pillar are on opposite sides of the pillar.

13. The array of memory cells of claim 9 , further comprising:

a first dielectric interposed between the substrate and each floating gate; and

a second dielectric interposed between each floating gate and its respective control gate.

14. An array of memory cells, comprising:

a plurality of rows of memory cell pillars each pillar having a pair of memory cells formed thereon, each memory cell pillar isolated from an adjacent memory cell pillar by an isolation region within its row;

wherein each memory cell pillar comprises:

a substrate;

two source regions and one drain region, the drain region vertically spaced apart from the source regions to define two separate channel regions;

a floating gate located adjacent each channel region, each floating gate extending substantially vertically; and

a control gate located adjacent to each floating gate;

a plurality of bit lines, each bit line of the plurality of bit lines coupled to pairs of memory cells formed on pillars within alternating rows of pillars;

wherein every memory cell coupled to a first side of a word line is within one row of memory cells and every memory cell coupled to a second side of the word line is within an adjacent row of memory cells;

wherein the memory cells of the one row of memory cells are coupled to alternating bit lines of the plurality of bit lines and the memory cells of the adjacent row of memory cells are coupled to alternating bit lines of the plurality of bit lines;

wherein the alternating bit lines coupled to the memory cells of the one row of memory cells are different from the alternating bit lines coupled to the memory cells of the adjacent row of memory cells; and

wherein respective memory cells of each pair of memory cells formed on a pillar are coupled to adjacent word lines.

15. The array of memory cells of claim 14 , further comprising:

a dielectric layer formed over the memory array;

wherein each of the plurality of bit lines is coupled to a drain region of a pillar by a contact formed through the dielectric layer.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
Continuity (2)
Division 1020597700 · Jul 26, 2002
Related Publication 20050279985A1 · Dec 22, 2005