IP Library Granted Patent US 7,667,216
Granted Patent B2
US 7,667,216 · App. 11/708,029 · Granted Feb 23, 2010

Method of achieving CD linearity control for full-chip CPL manufacturing

Assignee: ASML Masktools B.V.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,667,216
App. No.
11/708,029
Granted
Feb 23, 2010
Kind
B2
Abstract

A method of generating masks for printing a pattern including a plurality of features having varying critical dimensions. The method includes the steps of: (1) obtaining data representing the pattern; (2) defining a plurality of distinct zones based on the critical dimensions of the plurality of features; (3) categorizing each of the features into one of the plurality of distinct zones; and (4) modifying the mask pattern for each feature categorized into a predefined distinct zone of the plurality of distinct zones.

Claims (59)

1. An apparatus for generating masks for printing a pattern comprising a plurality of features having varying critical dimensions, said apparatus comprising:

means for obtaining data representing said pattern;

means for defining a plurality of distinct zones based on the critical dimensions of said plurality of features;

means for categorizing each of said features into one of said plurality of distinct zones; and

means for modifying a mask having said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones,

wherein said plurality of distinct zones comprises:

a first zone in which features having a critical dimension less than or equal to a first predetermined amount can be imaged utilizing chromeless phase lithography techniques;

a second zone in which features having a critical dimension greater than said first predetermined amount and less than a second predetermined amount can be imaged utilizing a combination of chromeless phase lithography techniques and chrome; and

a third zone in which features having a critical dimensions greater than said second predetermined amount can be imaged utilizing chrome.

2. The apparatus for generating masks according to claim 1 , wherein at least one of said features in said first zone is implemented in a mask as adjacent phase edges etched in a substrate.

3. The apparatus for generating masks according to claim 1 , wherein at least one of said features in said second zone is implemented in a mask as adjacent phase edges etched in a substrate, with chrome patches disposed on an upper surface of said substrate remaining between said adjacent phase edges.

4. The apparatus for generating mask according to claim 3 , wherein said chrome patches operate to control the percentage transmission of a light source incident on said mask.

5. The apparatus for generating masks according to claim 1 , further comprising:

means for compiling the features contained in said first zone, and the chromeless phase components of the features contained in said second region,

means for generating a first mask for imaging the chromeless phase components contained in said first zone and said second zone,

means for compiling the chrome components of the features contained in said second zone, and the chrome components of the features contained in said third region, and

means for generating a second mask for imaging the chrome components contained in said second zone and said third zone.

6. A method of generating a mask for printing a pattern comprising a plurality of features having varying critical dimensions, said method comprising the steps of:

obtaining data representing said pattern;

defining a plurality of distinct zones based on the critical dimensions of said plurality of features;

categorizing each of said features into one of said plurality of distinct zones;

modifying said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones;

identifying the features contained in a first one of the zones, and chromeless phase components of the features contained in a second one of the zones,

generating a first mask for imaging the chromeless phase components contained in said first zone and said second zone,

identifying chrome components of the features contained in said second zone, and chrome components of die features contained in a third one of die zones,

generating a second mask for imaging the chrome components contained in said second zone and said third zone.

7. A method of generating a mask for printing a pattern comprising a plurality of features having varying critical dimensions, said method comprising the steps of:

obtaining data representing said pattern;

defining a plurality of distinct zones based on die critical dimensions of said plurality of features;

categorizing each of said features into one of said plurality of distinct zones; and

modifying said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones,

wherein, in the step of defining a plurality of distinct zones, a simulation process is utilized to determine the aerial image behavior of a selected imaging process relative to the critical dimensions of the plurality of features.

8. A method of generating a mask for printing a pattern comprising a plurality of features having varying critical dimensions, said method comprising the steps of:

obtaining data representing said pattern;

defining a plurality of distinct zones based on the critical dimensions of said plurality of features;

categorizing each of said features into one of said plurality of distinct zones; and

modifying said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones,

wherein the step of modifying said pattern includes treating said each feature utilizing one or more chrome patches.

9. A computer program product for controlling a computer comprising a recording medium readable by the computer, the recording medium having instructions recorded therein for directing the computer to generate files corresponding to masks for printing a pattern comprising a plurality of features having varying critical dimensions, said generation of said files comprising the steps of:

obtaining data representing said pattern;

defining a plurality of distinct zones based on the critical dimensions of said plurality of features;

categorizing each of said features into one of said plurality of distinct zones;

modifying said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones;

identifying the features contained in a first one of the zones, and chromeless phase components of the features contained in a second one of the zones,

generating a first mask for imaging the chromeless phase components contained in said first zone and said second zone,

identifying chrome components of the features contained in said second zone, and chrome components of the features contained in a third one of the zones, and

generating a second mask for imaging the chrome components contained in said second zone and said third zone.

10. A computer program product for controlling a computer comprising a recording medium readable by the computer, the recording medium having instructions recorded therein for directing the computer to generate files corresponding to masks for printing a pattern comprising a plurality of features having varying critical dimensions, said generation of said files comprising the steps of:

obtaining data representing said pattern;

defining a plurality of distinct zones based on the critical dimensions of said plurality of features;

categorizing each of said features into one of said plurality of distinct zones; and

modifying said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones;

wherein, in the step of defining a plurality of distinct zones, a simulation process is utilized to determine the aerial image behavior of a selected imaging process relative to the critical dimensions of the plurality of features.

11. A computer program product for controlling a computer comprising a recording medium readable by the computer, the recording medium having instructions recorded therein for directing the computer to generate files corresponding to masks for printing a pattern comprising a plurality of features having varying critical dimensions, said generation of said files comprising the steps of:

obtaining data representing said pattern;

defining a plurality of distinct zones based on the critical dimensions of said plurality of features;

categorizing each of said features into one of said plurality of distinct zones; and

modifying said pattern for each feature categorized into a predefined distinct zone of said plurality of distinct zones;

wherein the step of modifying said pattern includes treating said each feature utilizing one or more chrome patches.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 7, 2014
From: ASML MASKTOOLS B.V.
To: ASML NETHERLANDS B.V.
Reel/Frame 032170/0425 →
Continuity (3)
Continuation 1065971500 · Sep 11, 2003
Provisional Application 6040959900 · Sep 11, 2002
Related Publication 20070148562A1 · Jun 28, 2007