IP Library › Granted Patent US 7,713,878
Granted Patent B2
US 7,713,878 · App. 10/895,142 · Granted May 11, 2010

Method of recovering and reproducing substrates and method of producing semiconductor wafers

Assignee: Sumitomo Electric Industries, Ltd.
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Quick Facts
Patent No.
US 7,713,878
App. No.
10/895,142
Granted
May 11, 2010
Kind
B2
Abstract

A method of recovering a first substrate, including the steps of: sticking a second substrate on a semiconductor layer epitaxially grown on the first substrate; and separating the semiconductor layer and the first substrate. Furthermore, a method of reproducing a first substrate, including the step of surface processing the first substrate separated. Furthermore, a method of reproducing a first substrate, including the step of homoepitaxially growing the first substrate surface processed. Furthermore, a method of producing a semiconductor wafer, including the step of epitaxially growing a semiconductor layer on a first substrate. Thus a group III nitride or similar, expensive substrate can be used to efficiently and economically, epitaxially grow a group III nitride or similar semiconductor layer.

Claims (28)

1. A method of reproducing a first substrate formed of a group III nitride, comprising the steps of:

epitaxially growing a first semiconductor layer on said first substrate;

sticking a second substrate on said first semiconductor layer epitaxially grown on said first substrate;

separating said first semiconductor layer and said first substrate by mechanical slicing such that a portion of said first substrate remains at a surface of said first semiconductor layer; and

surface-processing said first substrate separated from said first semiconductor layer after the step of separating; wherein

the step of surface-processing is performed by liquid-phase etching in which said first substrate is brought into contact with etchant of a liquid at least containing a liquid of Na.

2. A method of reproducing a first substrate formed of a group III nitride, comprising the steps of:

epitaxially growing a first semiconductor layer on said first substrate;

sticking a second substrate on said first semiconductor layer epitaxially grown on said first substrate;

separating said first semiconductor layer and said first substrate by mechanical slicing such that a portion of said first substrate remains at a surface of said first semiconductor layer;

surface-processing said first substrate separated from said first semiconductor layer after the step of separating; and

homoepitaxially growing a second semiconductor layer on said first substrate separated from said first semiconductor layer after the step of surface-processing; wherein

the step of surface-processing is performed by liquid-phase etching in which said first substrate is brought into contact with etchant of a liquid at least containing a liquid of Na.

3. A method of producing a semiconductor wafer, comprising the steps of:

epitaxially growing a first semiconductor layer on said first substrate;

sticking a second substrate on said first semiconductor layer epitaxially grown on a first substrate formed of a group III nitride;

separating said first semiconductor layer and said first substrate by mechanical slicing such that a portion of said first substrate remains at a surface of said first semiconductor layer;

surface-processing said first substrate separated from said first semiconductor layer after the step of separating; and

epitaxially growing a third semiconductor layer on said first substrate separated from said first semiconductor layer after the step of surface-processing; wherein

the step of surface-processing is performed by liquid-phase etching in which said first substrate is brought into contact with etchant of a liquid at least containing a liquid of Na.

4. A method of producing a semiconductor wafer, comprising the steps of:

epitaxially growing a first semiconductor layer on said first substrate;

sticking a second substrate on said first semiconductor layer epitaxially grown on a first substrate formed of a group III nitride;

separating said first semiconductor layer and said first substrate by mechanical slicing such that a portion of said first substrate remains at a surface of said first semiconductor layer;

surface-processing said first substrate separated from said first semiconductor layer after the step of separating;

homoepitaxially growing a second semiconductor layer on said first substrate separated from said first semiconductor layer after the step of surface-processing; and

epitaxially growing a fourth semiconductor layer on said first substrate separated from said first semiconductor layer after the step of homoepitaxially growing; wherein

the step of surface-processing is performed by liquid-phase etching in which said first substrate is brought into contact with etchant of a liquid at least containing a liquid of Na.

Assignments (2)
CORRECTION FOR ASSIGNEE OF ASSIGNMENT AT REEL 015625 / FRAME 0501 Recorded Feb 17, 2006
From: NAKAHATA, SEIJI
To: SUMITOMO ELECTRIC INDUSTRIES, LTD.
Reel/Frame 017628/0574 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2004
From: NAKAHATA, SEIJI
To: SUMITOMO ELECTRI INDUSTRIES, LTD.
Reel/Frame 015625/0501 →
Priority Claims (1)
JP 2003-291575 · Aug 11, 2003 · national
Continuity (1)
Related Publication 20050037595A1 · Feb 17, 2005