Method and system for real-time estimation and prediction of the thermal state of a microprocessor unit
View Patent ↗A method (and system) of predicting a thermal state of a transient thermal system, includes combining sensor outputs and thermal parameters to construct a consistent set of estimates of internal temperature of a transient thermal system.
1. A method of predicting future temperature, comprising:
determining a temperature at a location on a semiconductor chip;
embedding information into instructions stored in an instruction cache;
computing future power to be dissipated in executing the instructions in said instruction cache based on the embedded information; and
predicting a future temperature at the location on the semiconductor chip based on the determined temperature and the computed future power.
2. The method of claim 1 , wherein said determining said temperature comprises:
measuring a temperature on the semiconductor chip; and
interpolating measured temperature to extract maximum temperature.
3. The method of claim 1 , further comprising:
shifting a cooling capability based on said future power computed.
4. The method of claim 1 , wherein said determining said temperature comprises:
demarcating a surface of the chip into finite and contiguous zones;
developing a reduced order estimator model for dynamic heat transfer from the chip surface to ambient; and
deploying temperature sensors on or near the chip and estimating missing temperature components.
5. The method of claim 1 , wherein said computing said future power comprises mapping the instruction cache into a sequence of X-Y distributed quanta of heat packets.
6. A method of predicting a temperature on semiconductor chip, comprising:
determining a temperature at a location on a surface of a semiconductor chip at a sampling time, n;
projecting an amount of energy to be released at the sampling time, n, by executing a plurality of instructions stored in an instruction cache in microprocessor formed on the surface of the semiconductor chip based on information embedded in the plurality of instructions; and
predicting a temperature at the location on the surface of the semiconductor chip at a next time instant, n+1, based on the determined temperature and the projected amount of energy to be released.
7. The method of claim 6 , wherein said determining said temperature comprises developing a global temperature distribution map for the surface of the semiconductor chip at the sampling time, n.
8. The method of claim 7 , wherein said developing said global temperature distribution map comprises measuring a temperature at first locations on a semiconductor chip and estimating a temperature at second locations on the semiconductor chip.
9. The method of claim 6 , wherein said cache stores a plurality of instructions, and execution of an instruction in the plurality of instructions by a microprocessor on the semiconductor chip releases a quanta of energy over a surface of the chip.
10. The method of claim 9 , wherein the embedded information in an instruction of the plurality of instructions represents a quanta of energy distributed over a surface of the chip by an execution of the instruction by the microprocessor.