IP Library › Granted Patent US 7,848,059
Granted Patent B2
US 7,848,059 · App. 11/858,386 · Granted Dec 7, 2010

Magnetoresistive effect device and magnetic random access memory using the same

Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 7,848,059
App. No.
11/858,386
Granted
Dec 7, 2010
Kind
B2
Abstract

A magnetoresistive effect element includes a magnetization fixed layer having substantially fixed magnetization direction. A magnetization variable layer has a variable magnetization direction, consists of a magnetic alloy that has a BCC structure and is expressed by Fe 1-x-y Co x Ni y (0≦x+y≦1, 0≦x≦1, 0≦y≦1), and contains at least one additive element of V, Cr, and Mn in a range of 0<a≦20 at % (a is a content). An intermediate layer is disposed between the magnetization fixed layer and the magnetization variable layer and consists of a nonmagnetic material. The magnetization direction of the magnetization variable layer is switched by a bidirectional current passing through the magnetization fixed layer, the intermediate layer, and the magnetization variable layer.

Claims (42)

1. A magnetoresistive effect element comprising:

a magnetization fixed layer having substantially fixed magnetization direction;

a magnetization variable layer having a variable magnetization direction, formed of a magnetic alloy that has a BCC structure and is expressed by Fe 1-x-y Co x Ni y (0≦x+y≦1, 0≦x≦1, 0≦y≦1), and containing at least one additive element of V, Cr, and Mn in a range of 0<a≦20 at % (a is a content); and

an intermediate layer disposed between the magnetization fixed layer and the magnetization variable layer and formed of a nonmagnetic material,

wherein the magnetization direction of the magnetization variable layer is switched by a bidirectional current passing through the magnetization fixed layer, the intermediate layer, and the magnetization variable layer.

2. The element according to claim 1 , wherein

an amount of the additive element at a position in the magnetization variable layer decreases as the position gets close to the intermediate layer.

3. The element according to claim 1 , wherein

the magnetization variable layer and the magnetization fixed layer have perpendicular magnetization to the film plain thereof respectively.

4. A magnetoresistive effect element comprising:

a magnetization fixed layer having substantially fixed magnetization direction;

a magnetization variable layer having a variable magnetization direction, formed of a magnetic alloy that has a BCC structure and is expressed by Fe 1-x-y Co x Ni y (0≦x+y≦1, 0≦x≦1, 0≦y≦1), and containing at least one additive element of Si, Ge, and Ga in a range of 0<a≦5 at % (a is a content); and

an intermediate layer disposed between the magnetization fixed layer and the magnetization variable layer and formed of a nonmagnetic material,

wherein the direction of magnetization of the magnetization variable layer is switched by a bidirectional current passing through the magnetization fixed layer, the intermediate layer, and the magnetization variable layer.

5. The element according to claim 4 , wherein

an amount of the additive element at a position in the magnetization variable layer decreases as the position gets close to the intermediate layer.

6. The element according to claim 4 , wherein

the magnetization variable layer and the magnetization fixed layer have perpendicular magnetization to the film plain thereof respectively.

7. A magnetoresistive effect element comprising:

a magnetization fixed layer having substantially fixed magnetization direction;

a magnetization variable layer having a variable magnetization direction, formed of a magnetic alloy that has a BCC structure and is expressed by Fe 1-x-y Co x Ni y (0≦x+y≦1, 0≦x≦1, 0≦y≦1), and containing at least one additive element of Sr, Ti, Y, Zr, Nb, Mo, Tc, Hf, Ta, W, and Re in a range of 0<a≦10 at % (a is a content); and

an intermediate layer disposed between the magnetization fixed layer and the magnetization variable layer and formed of a nonmagnetic material,

wherein the magnetization direction of the magnetization variable layer is switched by a bidirectional current passing through the magnetization fixed layer, the intermediate layer, and the magnetization variable layer.

8. The element according to claim 7 , wherein

an amount of the additive element at a position in the magnetization variable layer decreases as the position gets close to the intermediate layer.

9. The element according to claim 7 , wherein

the magnetization variable layer and the magnetization fixed layer have perpendicular magnetization to the film plain thereof respectively.

10. A magnetoresistive effect element comprising:

a magnetization fixed layer having substantially fixed magnetization direction;

a magnetization variable layer having a variable magnetization direction, formed of a magnetic alloy expressed by Fe 1-x-y Co x Ni y (0≦x+y≦1, 0≦x≦1, 0≦y≦1), and containing at least one of Ru, Rh, Pd, Os, Ir, Pt, Au, and Ag; and

an intermediate layer disposed between the magnetization fixed layer and the magnetization variable layer and formed of a nonmagnetic material,

wherein the magnetization direction of the magnetization variable layer is switched by a bidirectional current passing through the magnetization fixed layer, the intermediate layer, and the magnetization variable layer.

11. The element according to claim 10 , wherein

the magnetization variable layer has an L1 0 ordered structure phase or an L1 2 ordered structure phase.

12. The element according to claim 10 , wherein

the magnetic variable layer contains at least one of V, Cr, and Mn in a range of 0.5≦a≦10 at % (a is a content).

13. The element according to claim 10 , wherein

the magnetic variable layer contains at least one of Si, Ge, and Ga in a range of 0.5≦a≦10 at % (a is a content).

14. The element according to claim 10 , wherein

the magnetic variable layer contains at least one of Sr, Ti, Y, Zr, Nb, Mo, Tc, Hf, Ta, W, and Re in a range of 0.5≦a≦10 at % (a is a content).

15. The element according to claim 10 , wherein

the magnetization variable layer and the magnetization fixed layer have perpendicular magnetization to the film plain thereof respectively.

Assignments (4)
DE-MERGER Recorded Dec 12, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051260/0291 →
MERGER Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION; K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051262/0776 →
CHANGE OF NAME AND ADDRESS Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 051262/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2007
From: YOSHIKAWA, MASATOSHI; KAI, TADASHI; NAGASE, TOSHIHIKO; KITAGAWA, EIJI; KISHI, TATSUYA; YODA, HIROAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 020060/0254 →
Priority Claims (1)
JP 2006-269517 · Sep 29, 2006 · national
Continuity (1)
Related Publication 20080231998A1 · Sep 25, 2008