IP Library Granted Patent US 8,048,772
Granted Patent B2
US 8,048,772 · App. 12/502,735 · Granted Nov 1, 2011

Substrate bonding method and electronic component thereof

Assignee: OMRON Corporation
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Quick Facts
Patent No.
US 8,048,772
App. No.
12/502,735
Granted
Nov 1, 2011
Kind
B2
Abstract

A substrate bonding method has a film forming step of forming an insulating film for bonding in such a manner that an SiO 2 film made of TEOS is deposited on at least one of a first substrate and a second substrate by a CVD method, and a bonding step of bonding the first substrate and the second substrate with the insulating film for bonding being interposed between the first substrate and the second substrate.

Claims (11)

1. A substrate bonding method comprising:

a film forming step of forming an insulating film for bonding in such a manner that an SiO 2 film made of TEOS is deposited on at least one of a first substrate and a second substrate by a CVD method; and

a bonding step of bonding the first substrate and the second substrate with the insulating film for bonding being interposed between the first substrate and the second substrate,

wherein the bonded substrates are cut at a position where the insulating film for bonding is divided.

2. The substrate bonding method according to claim 1 , wherein

an electrode for bonding made of a plastically deformable metal is formed on one of an electrode of the first substrate and an electrode of the second substrate, and

in the bonding step, the first and second substrates are layered and bonded in such a manner that the electrode for bonding is abutted against the electrode of the substrate on which the electrode for bonding is not formed, before the insulating film for bonding is abutted against a surface of the substrate on which the insulating film for bonding is not formed, and then is press-fitted to the electrode of the substrate on which the electrode for bonding is not formed.

3. The substrate bonding method according to claim 1 , wherein in the bonding step, the first substrate and the second substrate are bonded with the insulating film for bonding being interposed therebetween by a bonding method for activating a bonding surface.

4. The substrate bonding method according to claim 1 , wherein the first substrate is a wafer substrate, the second substrate is a wafer substrate comprising at least one devices provided thereon, and the first substrate and the second substrate are bonded and then are cut for each region where the at least one device is provided.

5. The substrate bonding method according to claim 1 , wherein the bonded substrates are cut at a position between adjacent insulating films for bonding.

6. The substrate bonding method according to claim 1 , wherein the number of substrates to be bonded is not less than three.

Assignments (3)
DE-MERGER Recorded May 20, 2022
From: OMRON CORPORATION
To: SHIGA SEMICONDUCTOR CO., LTD.
Reel/Frame 060132/0451 →
CHANGE OF NAME AND ADDRESS Recorded May 20, 2022
From: SHIGA SEMICONDUCTOR CO., LTD.
To: MMI SEMICONDUCTOR CO., LTD.
Reel/Frame 060132/0466 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2009
From: SHIOZAKI, MASAYOSHI; MORIGUCHI, MAKOTO
To: OMRON CORPORATION
Reel/Frame 022954/0830 →
Priority Claims (1)
JP 2008-182577 · Jul 14, 2008 · national
Continuity (1)
Related Publication 20100006999A1 · Jan 14, 2010