Semiconductor device and method for manufacturing the same
A semiconductor device, includes a semiconductor layer of a second conductive type, a first diffused region of a first conductive type formed in the semiconductor layer, a second diffused region of the second conductive type selectively formed in the first diffused region, a trench formed in the semiconductor layer, a polysilicon formed in the trench with an insulator intervening, a first oxide film formed on the polysilicon so that the first oxide film is buried in the trench, a second oxide film formed on the first oxide film so that the second oxide film is buried in the trench, and a flowable insulator film formed on the second oxide film so that the flowable insulator film is buried in the trench.
1. A semiconductor device, comprising:
a semiconductor layer of a second conductive type;
a first diffused region of a first conductive type formed in the semiconductor layer;
a second diffused region of the second conductive type selectively formed in the first diffused region;
a trench formed in the semiconductor layer;
a polysilicon formed in the trench with an insulator intervening;
a first oxide film formed on the polysilicon so that the first oxide film is buried in the trench;
a second oxide film formed on the first oxide film so that the second oxide film is buried in the trench; and
a flowable insulator film formed on the second oxide film so that the flowable insulator film is buried in the trench, the flowable insulator film comprising a material different from a material of the second oxide film.
2. The semiconductor device according to claim 1 , further comprising a third oxide film formed between the polysilicon and the first oxide film so that the third oxide film is buried in the trench.
3. The semiconductor device according to claim 1 , wherein a thickness of the second oxide film is from 24 angstroms to 10000 angstroms.
4. The semiconductor device according to claim 1 , wherein the second oxide film comprises a chemical vapor deposition (CVD) film.
5. The semiconductor device according to claim 1 , wherein the first oxide film comprises a high temperature oxide (HTO) film.
6. The semiconductor device according to claim 2 , wherein the third oxide film comprises a non-doped silicate glass (NSG) film.
7. The semiconductor device according to claim 1 , wherein the flowable insulator film comprises a boron phosphorus silicate glass (BPSG) film.
8. The semiconductor device according to claim 1 , wherein a thickness of the second oxide film is from 200 angstroms to 1200 angstroms.
9. The semiconductor device according to claim 1 , wherein the first oxide film is disposed between the polysilicon and the second oxide layer.
10. The semiconductor device according to claim 9 , further comprising a third oxide film formed between the polysilicon and the first oxide film so that the third oxide film is buried in the trench.
11. The semiconductor device according to claim 1 , wherein the second oxide film and the flowable insulator film comprise separate layers from each other.
12. The semiconductor device according to claim 1 , further comprising a source electrode disposed on the flowable insulator film, such that the flowable insulator film is disposed between the source electrode and the second oxide film.
13. The semiconductor device according to claim 1 , wherein a surface of the flowable insulator film comprises an asperity along a surface of the second oxide film.
14. The semiconductor device according to claim 1 , wherein the second oxide film comprises SiO 2 .
15. A semiconductor device, comprising:
a semiconductor layer of a second conductive type;
a first diffused region of a first conductive type formed in the semiconductor layer;
a second diffused region of the second conductive type selectively formed in the first diffused region;
a trench formed in the semiconductor layer;
a polysilicon formed in the trench with an insulator intervening;
a high temperature oxide (HTO) film formed on the polysilicon so that the HTO film is buried in the trench;
a chemical vapor deposition (CVD) oxide film formed on the HTO film so that the CVD film is buried in the trench; and
a boron phosphorus silicate glass (BPSG) film formed on the CVD film so that the BPSG film is buried in the trench, the BPSG film comprising a material different from a material of the CVD film.
16. The semiconductor device according to claim 15 , further comprising:
a non-doped silicate glass (NSG) film formed between the polysilicon and the HTO film so that the NSG film is buried in the trench.
17. A semiconductor device, comprising:
a semiconductor layer of a second conductive type;
a first diffused region of a first conductive type formed in the semiconductor layer;
a second diffused region of the second conductive type selectively formed in the first diffused region;
a trench formed in the semiconductor layer;
a polysilicon formed in the trench with an insulator intervening;
a first oxide film formed on the polysilicon so that the first oxide film is buried in the trench;
a second oxide film formed on the first oxide film so that the second oxide film is buried in the trench; and
a flowable insulator film formed on the second oxide film so that the flowable insulator film is buried in the trench,
wherein the first oxide film is disposed between the polysilicon and the second oxide film, and the second oxide film is disposed between the first oxide film and the flowable insulator film, so that the polysilicon and the flowable insulator film are intervened by the first and second oxide films therebetween.
18. The semiconductor device according to claim 17 , wherein the first oxide film comprises a high temperature oxide (HTO) film, and the second oxide film comprises a chemical vapor deposition (CVD) film.
19. The semiconductor device according to claim 17 , further comprising a third oxide film disposed between the polysilicon and the first oxide film, so that the polysilicon and the flowable insulator film are intervened by the third, first and second oxide films therebetween.
20. The semiconductor device according to claim 19 , wherein the third oxide film comprises a non-doped silicate glass (NSG) film.