IP Library › Granted Patent US 8,264,237
Granted Patent B2
US 8,264,237 · App. 12/031,171 · Granted Sep 11, 2012

Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events

Assignee: MKS Instruments, Inc.
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Quick Facts
Patent No.
US 8,264,237
App. No.
12/031,171
Granted
Sep 11, 2012
Kind
B2
Abstract

An arc detection system for a plasma generation system includes a radio frequency (RF) sensor that generates first and second signals based on a respective electrical properties of (RF) power that is in communication with a plasma chamber. A correlation module generates an arc detect signal based on the first and second signals. The arc detect signal indicates whether an arc is occurring in the plasma chamber and is employed to vary an aspect of the RF power to extinguish the arc.

Claims (35)

1. An arc detection system for a plasma generation system, comprising:

a radio frequency (RF) sensor that generates first and second signals based on a respective electrical properties of (RF) power that is in communication with a plasma chamber; and

a correlation module that generates an arc detect signal based on cross-correlating the first and second signals, wherein the arc detect signal indicates whether an arc is occurring in the plasma chamber and is employed to vary an aspect of the RF power to extinguish the arc.

2. The arc detection system of claim 1 further comprising a subtraction module that subtracts signal levels from respective ones of the first and second signals.

3. The arc detection system of claim 1 further comprising a window module that applies a window function to the first and second signals.

4. The arc detection system of claim 1 further comprising a probabilistic module that computes a probability of an arc event based on the arc detect signal.

5. The arc detection system of claim 4 wherein the probabilistic module employs a Baum-Welch algorithm to calculate a probabilistic model of the arc event.

6. The arc detection system of claim 5 wherein the probabilistic module employs a Viterbi algorithm to compute the probability of the arc event.

7. The arc detection system of claim 1 wherein the correlation module receives an enable signal that selectively enables generating the arc detect signal.

8. The arc detection system of claim 1 wherein further comprising an analog-to-digital (A/D) conversion module that digitizes the first and second signals.

9. The arc detection system of claim 1 wherein the RF sensor is a voltage/current (V/I) sensor and the first and second signals represent a voltage and current, respectively, of the RF power.

10. The arc detection system of claim 1 wherein the RF sensor is a directional coupler and the first and second signals represent the forward power and reflected power, respectively, of the RF power.

11. An arc detection method for a plasma generation system, comprising:

generating first and second signals based on a respective electrical properties of (RF) power that is in communication with a plasma chamber; and

generating an arc detect signal based on a cross-correlation of the first and second signals, wherein the arc detect signal indicates whether an arc is occurring in the plasma chamber; and

employing the arc detect signal to vary an aspect of the RF power to extinguish the arc.

12. The arc detection method of claim 11 further comprising subtracting signal levels from respective ones of the first and second signals.

13. The arc detection method of claim 11 further comprising applying a window function to the first and second signals.

14. The arc detection method of claim 11 further comprising computing a probability of an arc event based on the arc detect signal.

15. The arc detection method of claim 14 wherein the computing step further comprises employing a Baum-Welch algorithm to calculate a probabilistic model of the arc event.

16. The arc detection method of claim 15 wherein the computing step further comprises employing a Viterbi algorithm to compute the probability of the arc event.

17. The arc detection method of claim 11 further comprising receiving an enable signal that selectively enables generating the arc detect signal.

18. The arc detection method of claim 11 further comprising digitizing the first and second signals.

19. An arc detection system for a plasma generation system, comprising:

a radio frequency (RF) sensor that generates first and second signals based on a respective electric properties RF power that is in communication with a plasma chamber;

an analog-to-digital (A/D) conversion module that generates digital data based on the first and second signals;

a subtraction module that subtracts values from the digital data;

a window module that applies a window function to the digital data;

a correlation module that cross-correlates the first and second signals as they are represented in the windowed digital data and that generates an arc detect signal based on the correlation, wherein the arc detect signal indicates whether an arc is occurring in the plasma chamber.

20. The arc detection system of claim 19 further comprising a probabilistic module that computes a probability of an arc event based on the arc detect signal.

21. The arc detection system of claim 20 wherein the probabilistic module employs a Baum-Welch algorithm to calculate a probabilistic model of the arc event.

22. The arc detection system of claim 21 wherein the probabilistic module employs a Viterbi algorithm to compute the probability of the arc event.

23. The arc detection system of claim 19 wherein the correlation module receives an enable signal that selectively enables generating the arc detect signal.

24. The arc detection system of claim 19 wherein the RF sensor is a voltage/current (V/I) sensor and the first and second signals represent a voltage and a current, respectively, of the RF power.

25. The arc detection system of claim 19 wherein the RF sensor is a directional coupler and the first and second signals represent a forward power and a reflected power, respectively, of the RF power.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
SECURITY INTEREST Recorded Aug 19, 2022
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 061572/0069 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE U.S. PATENT NO.7,919,646 PREVIOUSLY RECORDED ON REEL 048211 FRAME 0312. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT (ABL). Recorded Jan 14, 2021
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 055668/0687 →
PATENT SECURITY AGREEMENT (ABL) Recorded Feb 1, 2019
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048211/0312 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
Reel/Frame 048226/0095 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038663/0265 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC; BARCLAYS BANK PLC
Reel/Frame 038663/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 24, 2008
From: COUMOU, DAVID J.
To: MKS INSTRUMENTS, INC.
Reel/Frame 020689/0862 →
Continuity (1)
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